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    • 53. 发明专利
    • METHOD FOR ADJUSTING CHARACTERISTIC OF OPTICAL CIRCUIT AND DEVICE THEREFOR
    • JPH07294756A
    • 1995-11-10
    • JP9126194
    • 1994-04-28
    • NIPPON TELEGRAPH & TELEPHONE
    • YAMADA HIROAKITAKADA KAZUMASAINOUE YASUYUKIHORIGUCHI MASAHARU
    • G02B6/12G02B6/122
    • PURPOSE:To provide a method for adjusting the characteristics of an optical circuit capable of adjusting the characteristics of even the optical circuit having >=3 pieces of paths with high accuracy within a short period of time and a device for such adjustment. CONSTITUTION:The optical circuit is installed in the one optical path of an interferometer formed by using a light source having a coherence length (coherence distance shorter than the optical path difference between arbitrary two paths in the optical circuit to be subjected to the characteristic adjustment. The optical path length (x) of the other optical path which is a reference optical path is changed and an interferogram V(x) of the light waves propagating the respective paths and reference light is measured (S1). N-pieces of isolated signals Vk(x) (k=1, 2,..., N) are extracted from this interferogram V(x) (S2), and Fourier transform of the extracted beat signals Vk(x) is calculated (S3). The phase change rates that the light propagating the respective paths receive are led out of the phase of the Fourier transform (S4). The refractive indices of the optical waveguides constituting the respective paths are so controlled that the specified differences between the phase change rates in the respective paths and their design values are obtd.
    • 54. 发明专利
    • POLARIZATION-DEPENDENT LOSS MEASURING METHOD AND DEVICE
    • JPH07243940A
    • 1995-09-19
    • JP3497094
    • 1994-03-04
    • NIPPON TELEGRAPH & TELEPHONE
    • TAKADA KAZUMASAYAMADA HIROAKIHORIGUCHI MASAHARU
    • G01J4/00G01M11/02
    • PURPOSE:To measure the difference of transmittance with high accuracy by feeding the light from a nonpolarizing light source to a optical wave guide to be tested, measuring the degree of polarization of the transmitted light through the optical wave guide, and determining the polarization-dependent loss based on the obtained result. CONSTITUTION:The polarized constituent of the outgoing light from an optical fiber 4 is elliptically polarized, and the rotation angles of a 1/2-wavelength plate 16 and a 1/4-wavelength plate 17 are adjusted so that the polarized constituent fed into a polarization modulator 18 is linearly polarized in the 45 deg. direction against the X-axis of the modulator 18. When the linearly polarized light is fed in the 45 deg. direction against the X-axis which is the main axis of the modulator 18, the outgoing light from the modulator 18 is not linearly polarized, thus the outgoing light from the modulator 18 is linearly polarized by a 1/4-wavelength plate 19. When voltage is applied to the modulator 18 to change the polarization direction by 90 deg., the light power transmitting a polarizer 20 is made maximum. The nonpolarizing constituent is not changed after passing through the modulator 18. The output signal from a photo-detector 21 is detected by a lock-in amplifier 22, and the voltage of the polarized constituent is obtained.
    • 59. 发明专利
    • ROTARY MIRROR TYPE INTERFEROMETER, INTERFERENCE MEASURING METHOD, AND OPTICAL WAVEGUIDE CIRCUIT DIAGNOSTIC DEVICE
    • JPH03209106A
    • 1991-09-12
    • JP243090
    • 1990-01-11
    • NIPPON TELEGRAPH & TELEPHONE
    • KOBAYASHI MASARUNODA JUICHITAKADA KAZUMASA
    • G01B9/02G01M11/00
    • PURPOSE:To measure the distance to an measurement object in the direction perpendicular to the optical axis by providing the extent of frequency shift due to the Doppler effect to the reflected light on a reflection mirror, and measuring the intensity of light with respect to each frequency. CONSTITUTION:The incoherent light from a light source 1 is converted to a luminous flux of parallel rays and traverses the (y) axis in a linear part and is branched into two in the linear part on the reflection face of a half mirror 7. One branched luminous flux is thrown to a measurement object 21, and the vertical reflection light is made incident on the mirror 7 again as signal light. The other branched luminous flux is reflected when a total reflection mirror 8 is perpendicular to the optical axis, and the reflection light is made incident on the mirror 7 as reference light and is coupled with signal light. This coupled light traverses the (x) axis in the linear part and is condensed on a photodetector 17 by a lens 5. The light traversing the (y) axis at a point out of this light is branched into two at a point in the mirror 7, and one branched light is reflected at a point of the measurement object 21. The other branched light is reflected at a point of the mirror 8. Both reflected light interfer with each other in the position where they have the same optical path length when the mirror 8 is swept by a stage 14.