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    • 35. 发明专利
    • METHOD AND CIRCUIT FOR MEMORY ERROR PROCESSING
    • JPH01258156A
    • 1989-10-16
    • JP8527288
    • 1988-04-08
    • NIPPON TELEGRAPH & TELEPHONE
    • FUTAGAMI ARATAMASUDA ETSUO
    • G06F12/16
    • PURPOSE:To improve the reliability of the whole of a memory device and to prevent the degradation in throughput by providing a register were a syndrome is stored, a circuit which compares the value of the syndrome for the just preceding read operation with that for the current read operation, and some control circuits to quickly decide a fixed trouble of memory error. CONSTITUTION:A means 2 where the syndrome is stored and a syndrome comparing means 3 are provided, and the means 3 compares the value of the syndrome for the current read operation with that for the just preceding read operation when error is detected by an error detecting means 1. That is, the value of the syndrome at the time of error detection and that for the just preceding read operation are compared; and when they coincide with each other, error is decided as a fixed trouble of the whole of a memory element and is processed because of the same error occurrence position in the read of continuous data from a memory 8. Thus, the efficient memory error processing of high reliability is performed for the fixed trouble of the whole of the memory element and partial fixed trouble and interrupted trouble in the memory element.