会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 34. 发明专利
    • Substrate support mechanism, substrate support method, component mounting device using the mechanism and method, and component mounting method
    • 基板支持机构,基板支持方法,使用机构和方法的组件安装设备和组件安装方法
    • JP2006019482A
    • 2006-01-19
    • JP2004195461
    • 2004-07-01
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • ISHITANI YASUYUKINAKANO TOMOYUKIKAWAGUCHI TERUOSASAKI MASARU
    • H05K13/04H05K3/34
    • PROBLEM TO BE SOLVED: To provide a durable and reliable substrate support mechanism which eliminates the need for replacing holder pins and is capable of adjusting the height of the holder pin during component mounting, and to provide a method therefor. SOLUTION: The substrate support mechanism comprises holder pins 24 for abutting a circuit board 8 by the energizing power of springs 27 to support the circuit board 8 at that height, a lock plate 22 for laterally pressing the motion of the holder pins 24 to locking up them, and a pair of plates 21, 23 which are disposed on both sides of the lock plate 22 in the longitudinal direction of the holder pins 24. The holder pins 24 through the three plates abut the circuit board 8 to adjust the height. Thereafter, only the lock plate 22 located in the center of the three plates moves toward the direction perpendicular to the longitudinal axis of the holder pin 24, thereby locking up the holder pins 24. The locking up is preferably performed via through holes 31 of the lock plate 22 and elastic materials 32 disposed between the holder pins 24. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供耐用且可靠的基板支撑机构,其不需要更换保持销,并且能够在部件安装期间调整保持销的高度,并提供其方法。 解决方案:基板支撑机构包括用于通过弹簧27的激励力抵抗电路板8的支架销24,以支撑在该高度处的电路板8,用于横向按压支架销24的运动的锁定板22 以锁定它们,以及一对板21,23,它们在保持销24的纵向方向上设置在锁定板22的两侧。通过三个板的保持器销24邻接电路板8以调整 高度。 此后,仅位于三个板的中心的锁定板22朝着与保持销24的纵向轴线垂直的方向移动,从而锁定保持销24。锁定优选通过 锁定板22和设置在保持器销24之间的弹性材料32.版权所有(C)2006,JPO&NCIPI
    • 35. 发明专利
    • Defect cause investigating system
    • 缺陷原因调查系统
    • JP2006013120A
    • 2006-01-12
    • JP2004187669
    • 2004-06-25
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • NAKANO TOMOYUKIKAWAGUCHI TERUOISHITANI YASUYUKISASAKI MASARUOKA SUSUMU
    • H05K13/08
    • PROBLEM TO BE SOLVED: To provide a system and a method which efficiently investigates the cause of a defect occurred in continuously processing a plurality of products, using a cheap apparatus. SOLUTION: The system temporarily saves continuous images obtained by high speed photographing of a processing operation, photographs a processed product, compares the photographed product image with a previously recognized non-defective product image to decide the existence of any defect, successively saves the temporary saved continuous images for investigating the cause of a defect if found, or may erase the continuous images if any defect is not found, thus enabling the successive acquisition of continuous images with a limited memory capacity. A condition photographing camera 21 takes images during processing; an inspective camera 23 takes images after processing; and a controller 25 decides the existence of any defect, decides whether the images are saved or erased, and controls the entire system. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种系统和方法,其使用便宜的装置有效地研究在连续处理多个产品中发生的缺陷的原因。

      解决方案:系统暂时保存通过处理操作的高速拍摄获得的连续图像,对已处理产品进行拍照,将拍摄的产品图像与先前识别的无缺陷产品图像进行比较,以确定是否存在任何缺陷,并连续保存 用于调查发现原因的临时保存的连续图像,或者如果没有发现任何缺陷,则可以擦除连续图像,从而能够以有限的存储容量连续获取连续图像。 条件拍摄相机21在处理期间拍摄图像; 检查照相机23处理后拍摄图像; 并且控制器25决定是否存在任何缺陷,决定图像是否被保存或被擦除,并且控制整个系统。 版权所有(C)2006,JPO&NCIPI