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31. 发明专利

JP2014202528A 温度測定装置および温度測定方法有权
标题翻译：温度测量装置和温度测量方法
公开(公告)号：JP2014202528A
公开(公告)日：2014-10-27
申请号：JP2013076956
申请日：2013-04-02
申请人： Jfeスチール株式会社 , Jfe Steel Corp
发明人： KOSHIHARA TAKAHIRO , SHIMAMOTO HIROYUKI , OSHIGE TAKAHIKO , FUKUDA YOSHINORI
IPC分类号： G01J5/48 , B22D11/16 , G01J5/00
摘要：【課題】ダイナミックレンジが狭い撮像手段を用いても温度域の広い高温体の表面温度を高温度分解能で測定すること。【解決手段】本発明の温度測定装置は、鋳片6から放射される光線の強度若しくはエネルギーを検出する光電変換素子をアレイ配列してなる撮像手段10aと、撮像手段10aの露光時間を切換えて複数の異なる露光時間による撮像データを取得するデータ取得手段12aと、データ取得手段12aが取得した複数の異なる露光時間による撮像データのアレイ配列に対応する画素を、各露光時間毎に決められた変換範囲に区分けするデータ分割手段12bと、データ分割手段12bにより分割された撮像データの輝度を露光時間に応じて変換して温度分布を取得する温度変換手段12cと、温度変換手段12cにより取得された温度分布を統合して、高温体の表面温度分布を得る温度分布統合手段12dとを備える。【選択図】図4
摘要翻译：要解决的问题：即使使用动态范围窄的成像装置，也可以测量具有高温度分辨率的高温度的高温体的表面温度。解决方案：温度测量装置包括：用于阵列排列的成像装置10a 用于检测从铸片6发射的光的强度或能量的光电转换元件; 数据获取装置12a，用于通过切换成像装置10a的曝光时间来获取根据多个不同曝光时间的图像数据; 数据划分装置12b，用于根据由数据获取装置12a获取的多个不同的曝光时间将对应于图像数据的阵列排列的像素划分成为每个曝光时间确定的转换范围; 温度转换装置12c，用于根据曝光时间转换由数据划分装置12b分割的成像数据的亮度，并获取温度分布; 以及温度分布整合装置12d，用于对由温度转换装置12c获取的温度分布进行积分并获取高温体的表面温度分布。

32. 发明专利

JP2013228328A Surface inspection device and surface inspection method 审中-公开
标题翻译：表面检查装置和表面检查方法
公开(公告)号：JP2013228328A
公开(公告)日：2013-11-07
申请号：JP2012101771
申请日：2012-04-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： KOSHIHARA TAKAHIRO
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To automatically detect fine uneven defects formed on the surface of a steel plate without being affected by surface roughness on a rough surface and to discriminate the detected fine uneven defects in high resolution with a simple adjustment method.SOLUTION: Pulse laser light 2a emitted from a light source 1 is divided into pump light 2b and probe light 2c. According to input of the pump light 2b, a terahertz wave 5 is emitted from a photoconductive antenna 28a spatially shifted from a focusing position 27 and installed to irradiate the steel plate 8 using an irradiation optical system. The terahertz wave 5 reflected by the surface of the steel plate 8 is guided to the photoconductive antenna 28b using a light converging optical system, and the photoconductive antenna 28b is irradiated with the probe light 2c to detect the reflected terahertz wave 5. The signal intensity distribution is derived by processing electrical signals obtained for every measurement position by outputting electrical signals from the photoconductive antenna 28a and moving a relative position between the steel plate 8 and the irradiation optical system. In a signal processing unit 26, a surface shape of the steel plate 8 is derived from the signal intensity distribution.
摘要翻译：要解决的问题：自动检测在钢板表面形成的细小不均匀缺陷，而不受粗糙表面的表面粗糙度的影响，并以简单的调整方法鉴别检测到的高分辨率的细小不均匀缺陷。解决方案：脉冲激光从光源1发射的光2a被分成泵浦光2b和探测光2c。根据泵浦光2b的输入，太空波5从从聚焦位置27空间偏移的光电导天线28a发射，并安装成使用照射光学系统照射钢板8。使用聚光光学系统将由钢板8的表面反射的太赫兹波5引导到光电导天线28b，并用探测光2c照射光电导天线28b，以检测反射的太赫兹波5.信号强度通过从光电导天线28a输出电信号并移动钢板8和照射光学系统之间的相对位置，处理通过对每个测量位置获得的电信号来导出分布。在信号处理单元26中，从信号强度分布导出钢板8的表面形状。

33. 发明专利

JP2011237276A Method for retreating flaw detection head and flaw detection apparatus 有权
标题翻译：检测检测头和检测装置的方法
公开(公告)号：JP2011237276A
公开(公告)日：2011-11-24
申请号：JP2010108847
申请日：2010-05-11
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： KOSHIHARA TAKAHIRO , KATO HIROHARU , NAGAMUNE AKIO , EKUSA KEIJI , ITO TOMOHIKO
IPC分类号： G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a method for retreating a flaw detection head and a flaw detection apparatus with which a surface flaw can be detected even if shape defect exits in a steel plate which is an object to be detected without breakage of the flaw detection head through contact of the shape defect portions with the surface flaw detection apparatus.SOLUTION: A flaw detection apparatus includes a flaw detection head arranged at a portion where a steel plate is wound around a roll and opposite to the steel plate, a large protrusion sensor for detecting protrusions of a size of 5 mm or more, and a small protrusion sensor for detecting protrusions of a size of less than 5 mm to 1 mm or more, a calculation processing apparatus for performing output of retreating signals based on signals from the large protrusion sensor and the small protrusion sensor and a control device for sending retreat instruction to each actuator which moves the entire flaw detection head or the sensor portions of the flaw detection head based on the retreat signals.
摘要翻译：要解决的问题：提供一种用于退回缺陷检测头和缺陷检测装置的方法，即使在不被破坏的情况下，作为被检测体的钢板中形成缺陷也能够检测出表面缺陷所述缺陷检测头通过所述形状缺陷部与所述表面缺陷检测装置的接触。解决方案：探伤装置包括：设置在钢板卷绕在钢板上并与钢板相对的部分的探伤头，用于检测5mm以上的突起的大型突起传感器，以及用于检测尺寸小于5mm至1mm以上的突起的小突起传感器，用于基于来自大突起传感器和小突起传感器的信号执行后退信号的输出的计算处理装置，以及用于向每个致动器发送撤退指令，所述致动器基于撤退信号移动所述缺陷检测头的整个探伤头或传感器部分。版权所有（C）2012，JPO＆INPIT

34. 发明专利

JP2015037795A 温度計測方法および温度計測装置有权
标题翻译：温度测量方法和温度测量装置
公开(公告)号：JP2015037795A
公开(公告)日：2015-02-26
申请号：JP2013168592
申请日：2013-08-14
申请人： Jfeスチール株式会社 , Jfe Steel Corp
发明人： KOSHIHARA TAKAHIRO , SHIMAMOTO HIROYUKI , OSHIGE TAKAHIKO
IPC分类号： B22D11/16 , B22D11/124 , G01J5/00 , G01J5/48
摘要：【課題】鋳片表面全域の表面温度分布を遠隔から簡易かつ高精度に計測すること。【解決手段】温度計測装置20は、カメラ21−1,21−2と、画像処理装置23とを備える。カメラ21−1,21−2は、鋳片Sの搬送方向に直交する鋳片Sの幅方向端部の外側上方に設置される。一方、画像処理装置23において、画像データ取得部231は、カメラ21−1,21−2の動作を制御して撮影対象の間隔を撮影処理し、この撮影対象の間隔を通過する鋳片Sの表面領域の画像データを取得する。輝度情報抽出部233および温度情報変換部235は、取得した画像データの輝度情報を温度情報に変換する。【選択図】図2
摘要翻译：要解决的问题：从远程地方以高精度简单地测量板坯表面的整个面积的表面温度分布。解算：温度测量装置20包括：照相机21-1,21-2; 照相机21-1,21-2安装在与板坯S的输送方向垂直的板坯S的宽度方向端的外侧的上部。另一方面，在图像处理系统23，图像数据获取部分231通过控制摄像机21-1,21-2的操作来执行拍摄对象的间隔的照相处理，并且通过经过照相机21-1,21-2的间隔的平板S的表面区域获取图像数据摄影对象亮度信息提取部233和温度信息转换部235将获取的图像数据的亮度信息转换为温度信息。

35. 发明专利

JP2014037001A Final solidification estimation method in continuous casting, solidification state estimation method of slab and continuous casting method 有权
标题翻译：连续铸造中的最终固化估计方法，SLAB和连续铸造方法的固化状态估计方法
公开(公告)号：JP2014037001A
公开(公告)日：2014-02-27
申请号：JP2012181920
申请日：2012-08-20
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： SHIMAMOTO HIROYUKI , KOSHIHARA TAKAHIRO , OSHIGE TAKAHIKO
IPC分类号： B22D11/16 , B22D46/00 , G01J5/00
摘要： PROBLEM TO BE SOLVED: To accurately estimate a final solidification position and a final solidification shape in continuous casting.SOLUTION: A solidification state of the cast slab in continuous casting is estimated by a heat transmission model using a heat flux based on cooling conditions of at least secondary cooling. Temperature distribution in a width direction of the slab is measured by a thermometer 4b at a preset measurement position in a longitudinal direction of the slab, which is a pulling-out direction of the slab. In addition, heat flux distribution in the width direction of the slab of the heat flux is corrected so that an estimated temperature at the measurement position estimated by the heat transmission model and the temperature distribution in the width direction of the slab measured by temperature distribution measurement means coincide. In the measurement of the temperature distribution, a surface to be measured of the slab is captured by a camera to determine the temperature distribution of the surface to be measured on the basis of the brightness in each surface position of the captured images. The image used in determining the temperature distribution is an image having an image angle of 40° or more and 65° or less.
摘要翻译：要解决的问题：准确估计连续铸造中的最终凝固位置和最终凝固形状。解决方案：通过使用基于冷却条件的热通量的热传递模型来估计连铸中的铸坯的凝固状态最少二次冷却。在板坯的宽度方向上的温度分布是通过温度计4b在作为板坯的拉出方向的板坯的长度方向上的预先设定的测量位置测量的。此外，热通量的板坯的宽度方向的热通量分布被校正，使得通过温度分布测量测量的由传热模型估计的测量位置处的估计温度和在板坯的宽度方向上的温度分布意味着重合。在测量温度分布时，通过照相机拍摄板坯待测表面，根据拍摄图像的每个表面位置的亮度来确定待测表面的温度分布。用于确定温度分布的图像是图像角为40°以上且65°以下的图像。

36. 发明专利

JP2013228330A Film thickness measuring apparatus and film thickness measuring method 审中-公开
标题翻译：薄膜厚度测量装置和薄膜厚度测量方法
公开(公告)号：JP2013228330A
公开(公告)日：2013-11-07
申请号：JP2012101773
申请日：2012-04-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： KOSHIHARA TAKAHIRO
IPC分类号： G01B15/02 , G01B11/06
摘要： PROBLEM TO BE SOLVED: To provide a film thickness measuring apparatus that can measure a film thickness in a non-contact manner with high accuracy by a simple method even when a value obtained by multiplying a refractive index by the film thickness is less than 75 in a film to be measured, and further to provide a film thickness measuring method.SOLUTION: A film thickness measuring apparatus performs the steps of: irradiating a sample 8 with a terahertz wave 5 from a light transmission antenna 28a by irradiation of pump light 2b such that an incident angle becomes a Brewster angle; adjusting polarizing plates 29a and 29b and detecting an S polarization component from the terahertz wave 5 reflected by the sample 8 by a light transmission antenna 28b; adjusting the polarizing plates 29a and 29b and detecting a P polarization component from the terahertz wave 5 reflected by the sample 8 by the light transmission antenna 28b; and deriving a film thickness of a film to be measured formed on a surface of the sample 8 by an information processing section 26 on the basis of a time delay of peak amplitude of the P polarization component with respect to peak amplitude of the S polarization component.
摘要翻译：要解决的问题：提供一种可以通过简单的方法以非常接触的方式以非接触的方式测量膜厚度的膜厚度测量装置，即使当通过将折射率乘以膜厚度获得的值小于75时，测量膜，并进一步提供膜厚度测量方法。解决方案：膜厚测量装置执行以下步骤：通过照射泵浦光2b从光透射天线28a照射具有太赫兹波5的样品8 入射角成为布鲁斯特角; 调整偏振板29a和29b，并通过光发射天线28b检测由样品8反射的太赫兹波5的S偏振分量; 调整偏光板29a和29b，并通过光发射天线28b检测由样品8反射的太赫兹波5的P偏振分量; 并且根据P偏振分量的峰值振幅相对于S偏振分量的峰值振幅的时间延迟，由信息处理部分26导出在样品8的表面上形成的待测膜的膜厚度。

37. 发明专利

JP2013228329A Surface inspection device and defect measurement method 有权
标题翻译：表面检测装置和缺陷测量方法
公开(公告)号：JP2013228329A
公开(公告)日：2013-11-07
申请号：JP2012101772
申请日：2012-04-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： KOSHIHARA TAKAHIRO
IPC分类号： G01N21/892 , G01N21/35 , G01N22/00 , G01N22/02
摘要： PROBLEM TO BE SOLVED: To provide a surface inspection device and a defect measurement method, which have high spacial resolution with a large lift-off, capable of measuring defects under scale.SOLUTION: The surface inspection device comprises: a nonlinear optical crystal 5 for generating a terahertz wave; a parabolic mirror 7 and a polarizing plate 19 for collimating the terahertz wave generated from the nonlinear optical crystal 5 and for emitting the terahertz wave including P polarized light to a steel plate 8 at a Brewster angle for an oxide film of the steel plate 8; a terahertz wave detection device 17 for detecting a terahertz wave intensity distribution, which is reflected on an interface between the steel plate 8 and the oxide film of the steel plate 8, on a plane perpendicular to the advancing direction of the terahertz wave; and a defect determination device 18 for detecting a defect on the basis of the terahertz wave intensity distribution detected by the terahertz wave detection device 17.
摘要翻译：要解决的问题：提供一种表面检查装置和缺陷测量方法，其具有高的空间分辨率，具有大的剥离，能够在规模上测量缺陷。解决方案：表面检查装置包括：非线性光学晶体5，用于产生太赫兹波; 用于准直由非线性光学晶体5产生的太赫兹波并将包括P偏振光的太赫兹波发射到钢板8的布鲁斯特角用于钢板8的氧化膜的抛物面镜7和偏振板19; 用于检测在与钢板8的氧化膜之间的界面上反射的太赫兹波强度分布的太赫兹波检测装置17在与太赫兹波的行进方向垂直的平面上; 以及用于根据由太赫兹波检测装置17检测出的太赫兹波强度分布来检测缺陷的缺陷确定装置18。

38. 发明专利

JP2011174942A Surface inspection apparatus 审中-公开
标题翻译：表面检查装置
公开(公告)号：JP2011174942A
公开(公告)日：2011-09-08
申请号：JP2011100905
申请日：2011-04-28
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO , UESUGI MITSUAKI , KOSHIHARA TAKAHIRO
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an apparatus and method surely detecting minute irregularity flaws with irregularities of about several μm even in an inspection object with a large surface roughness.
SOLUTION: The apparatus has: a light source 4 for irradiating the surface of a steel plate with light at a wavelength of 10.6 μm or longer; and detecting systems 6 and 7 for detecting a recess defect in accordance with a bright point obtained by focusing of light mirror-reflected from each point of minute irregular flaws on the surface of the steel plate, and also for detecting a projection defect in accordance with a dark point obtained by diffusion of light mirror-reflected from each point of minute irregular flaws on the surface of the steel plate.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：即使在具有大的表面粗糙度的检查对象中，提供一种设备和方法可靠地检测到具有约几μm的不规则性的微小不规则缺陷。解决方案：该装置具有：用于用波长为10.6μm以上的光照射钢板表面的光源4; 以及检测系统6和7，用于根据通过聚焦从钢板表面上的每个微小不规则缺陷点反射的光反射而获得的亮度来检测凹陷缺陷，并且还用于根据通过从钢板表面上的每个微小不规则缺陷点反射的光的扩散获得的暗点。版权所有（C）2011，JPO＆INPIT

39. 发明专利

JP2013152220A Surface inspection apparatus and surface inspection method 审中-公开
标题翻译：表面检查装置和表面检查方法
公开(公告)号：JP2013152220A
公开(公告)日：2013-08-08
申请号：JP2012271483
申请日：2012-12-12
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： KOSHIHARA TAKAHIRO , OSHIGE TAKAHIKO , NISHIZAWA YUJI
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide a surface inspection apparatus and method which detect a minute irregularity defect equivalent to the roughness of a metal surface with an influence of the roughness of the metal surface eliminated and which quantitatively evaluate the size of the irregularity of the defect.SOLUTION: A surface inspection apparatus includes: a terahertz wave generator 20 generating a terahertz wave 7; a lens 17 which collimates the terahertz wave 7 generated by the terahertz wave generator 20 so as to apply it to a steel plate 8; a terahertz wave detector 18 detecting an intensity distribution of the terahertz wave 7 reflected on a surface of the steel plate 8 on a plane vertical in a travelling direction; a defect determination device 19 detecting an irregularity defect of the steel plate 8 on the basis of the intensity distribution of the terahertz wave 7.
摘要翻译：要解决的问题：提供一种表面检查装置和方法，该表面检查装置和方法在消除了金属表面粗糙度的影响下检测与金属表面的粗糙度相当的微小不规则缺陷，并定量评估缺陷的不规则尺寸解决方案：表面检查装置包括：产生太赫兹波7的太赫兹波发生器20; 准直由太赫兹波发生器20产生的太赫兹波7以将其施加到钢板8的透镜17; 太赫兹波检测器18检测在行进方向垂直的平面上在钢板8的表面上反射的太赫兹波7的强度分布; 基于太赫兹波7的强度分布来检测钢板8的不规则缺陷的缺陷判定装置19。

40. 发明专利

JP2010133967A Surface inspection apparatus 有权
标题翻译：表面检查装置
公开(公告)号：JP2010133967A
公开(公告)日：2010-06-17
申请号：JP2010001194
申请日：2010-01-06
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO , UESUGI MITSUAKI , KOSHIHARA TAKAHIRO
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an apparatus capable of surely detecting minute irregular flaws with irregularities of about several μm even in an inspection object with a large surface roughness and a method of the same.
SOLUTION: The apparatus includes a light source 4 for irradiating the surface of a steel plate with light at a wavelength of 10.6 μm or longer and a detecting system for detecting minute defects in accordance with a light-dark pattern obtained by focusing and diffusion of light reflected by minute irregular flaws with irregularities on the surface of the steel plate. The light source 4 irradiates, with light, those portions of the steel plate 1 which is in contact with rolls 2. The detection system includes a screen 6 onto which the light reflected by the surface of the steel plate is projected and a two-dimensional camera 7 for measuring a light intensity distribution on the screen.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：即使在具有大的表面粗糙度的检查对象中，也能够提供能够可靠地检测出几μm左右的微小不规则缺陷的装置及其方法。解决方案：该装置包括用于用波长为10.6μm或更长的光照射钢板的表面的光源4和用于根据通过聚焦获得的亮暗图案检测微小缺陷的检测系统，以及在钢板表面上由微小凹凸不平的凹凸反射的光的扩散。光源4用光照射与辊2接触的钢板1的那些部分。检测系统包括屏幕6，由钢板表面反射的光被投射到该屏幕上，并且二维相机7，用于测量屏幕上的光强度分布。版权所有（C）2010，JPO＆INPIT

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