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    • 94. 发明专利
    • Manufacture of compound semiconductor integrated circuit
    • 复合半导体集成电路的制造
    • JPS6195569A
    • 1986-05-14
    • JP21613884
    • 1984-10-17
    • Hitachi Ltd
    • SHIGETA JUNJIMIYAZAKI MASARU
    • H01L27/095H01L21/822H01L27/04H01L29/80
    • H01L29/80
    • PURPOSE:To prevent generation of frame breaking layer of elements other than MESFET by deposition a gate metal after forming a protection film to the element which does not require gate metals such as resistor, capacitor, etc. CONSTITUTION:A channel layer 3 for MESFET and channel layer 3' for resistance are formed by ion implantation method to a semi-insulated GaAs substrate 1 with a photo resist 2 uses as the mask. A protection film 8 SiO2 is deposited to the entire part of wafer, it is then annealed for activation of dopant and SiO2 is not removed and is left to the area other than MESFET. Thereafter, a gate metal 4 is deposited and unwanted gate metal is removed by dry etching. The ion implantation is then carried out with the photo resist 2 and gate electrode 4 used as the mask as in the case of existing device. Thereby, a source drain region including a large amount of dopant can be formed and a source drain electrode 6 can also be formed.
    • 目的:通过在不需要诸如电阻器,电容器等栅极金属的元件形成保护膜之后,通过沉积栅极金属来防止MESFET以外的元件产生框架断裂层。构成:用于MESFET的沟道层3和 通过离子注入法将光电抗蚀剂2用作掩模的半绝缘GaAs衬底1形成用于电阻的沟道层3'。 保护膜8SiO 2沉积到晶片的整个部分,然后将其退火以激活掺杂剂,并且SiO 2不被去除并留在除了MESFET之外的区域。 此后,沉积栅极金属4,并通过干蚀刻去除不需要的栅极金属。 然后与现有装置的情况一样,将光电抗蚀剂2和栅电极4用作掩模,然后进行离子注入。 因此,可以形成包括大量掺杂剂的源极漏极区域,并且还可以形成源极漏极电极6。
    • 95. 发明专利
    • PATTERN ALIGNER
    • JP2001006998A
    • 2001-01-12
    • JP17505999
    • 1999-06-22
    • HITACHI LTD
    • KOMINAMI SHINYASHIGETA JUNJI
    • H01L21/68G03F9/00H01L21/027
    • PROBLEM TO BE SOLVED: To make the crystal orientation of a wafer accurately detectable by detecting the direction of the orientation flat surface of the wafer, based on the shape of the part of a detecting light reflecting mirror not exposed to the detecting light made incident by the orientation flat of the wafer due to the wafer. SOLUTION: A pattern aligner is provided with an orientation flat detecting light source 4 composed of an He-Ne laser, and a orientation flat reflection detector 6 for detecting the orientation flat surface of a wafer 1. The aligner is also provided with a detecting light reflecting mirror 4 which reflects the orientation flat detecting light 7 emitted from the light source as orientation flat detecting reflected light 8 at a position including the portion under the orientation flat surface 2 and its vicinity. The horizontal rotational angle of a wafer chuck 3 is adjusted based on the shape of the part of the mirror 4 not exposed to the orientation flat detecting light 7 due to the wafer 1.
    • 100. 发明专利
    • GALVANOMAGNETIC DEVICE
    • JPH09129944A
    • 1997-05-16
    • JP28288495
    • 1995-10-31
    • HITACHI LTD
    • SHIGETA JUNJI
    • G01R33/07G01R33/09H01L43/02
    • PROBLEM TO BE SOLVED: To increase the density of the magnetic flux impressed upon a magnetic flux sensing element by boring a hole aligned with the sensing element into a substrate on which the sensing element is formed and burying a material having high permeability in the hole. SOLUTION: After an etching stopper layer 9 is formed on a substrate 8, a Hall element 10 is formed on the layer 9. Then wiring 11, a first surface protective film 12 composed of SiO2 , and a second surface protective film 13 composed of a polyimide film are formed. After the film 13 is formed, an opening 16 is formed by patterning and etching the film 13 so that the opening 16 can be aligned with the Hall element 10 and another opening 17 is formed into the substrate 8. Then, after both surfaces of a wafer are coated with Ni films 18 and the surface of the films 18 are coated with a photoresist 19 except the openings 16 and 17, the openings 16 and 17 are plated with permalloy 20 having high permeability by using the Ni films 18 as electrodes. When the openings are formed into the substrate and surface protective film and a high-permeability material is buried in the openings for converging magnetic fluxes, and then, the front ends of the openings are made thinner by narrowing the gap between the corresponding parts of the openings, the density of magnetic fluxes impressed upon a magnetic flux sensing element can be increased.