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91. 发明专利

JP2001101896A REPLACEMENT JUDGING CIRCUIT FOR REDUNDANT CIRCUIT, SEMICONDUCTOR MEMORY AND SEMICONDUCTOR MEMORY TEST DEVICE INCORPORATING THIS CIRCUIT 失效
公开(公告)号：JP2001101896A
公开(公告)日：2001-04-13
申请号：JP27346799
申请日：1999-09-27
申请人： TOSHIBA CORP
发明人： SATO KATSUHIKO
IPC分类号： G11C29/44 , G11C29/00
摘要： PROBLEM TO BE SOLVED: To provide a replacement judging circuit which can perform high speed replacement judgement, a semiconductor memory and a semiconductor memory test device incorporating this circuit. SOLUTION: This device is provided with a line counter 32 of a row address, a line defective memory 33 of a row address operated by a carry signal from its counter, a line defective memory 36 of a column address, a line defective memory 35 of a row address operated by a carry signal from its counter, and a bit defective memory 39 storing a defective arbitrary single cell, and also, test method is limited and replacement discrimination can be performed by a tested result and an address signal inputted from the outside in real time, quick judgement can be performed without a defect analyzing memory.

92. 发明专利

JP2001014842A SEMICONDUCTOR MEMORY AND LOGICAL LSI MIXINGLY EQUIPPED WITH MEMORY 失效
公开(公告)号：JP2001014842A
公开(公告)日：2001-01-19
申请号：JP18168899
申请日：1999-06-28
申请人： TOSHIBA CORP
发明人： TAKEDA SATORU , FUKUDA MAKOTO , SATO KATSUHIKO
IPC分类号： G11C8/00 , G11C11/401 , H01L21/822 , H01L27/04
摘要： PROBLEM TO BE SOLVED: To enable the operation of a row/column simultaneous access function with a small number of pins like at a time when addresses are multiplexed. SOLUTION: Whether an address signal is to be outputted to a row decoding circuit 12 or not is selected by a selector 14 and whether the address signal is to be outputted to a column decoding circuit 13 or not is selected by a selector 17. The address signal to be inputted to an external terminal is stored in a latch circuit 15 and, moreover, either the address signal to be inputted to the external terminal or the address signal stored in the latch circuit 15 is selected by a multiplexer 16 to be outputted to either the selector 14 or the selector 7. Then, when a command for simultaneously inputting the address signal to the row decoding circuit 12 and the column decoding circuit 13 is inputted to a command generating circuit 18, the signal stored in the latch 15 is selected in the multiplexer 16 to be outputted and also the sectectors 12, 17 are set to output states.

93. 发明专利

JP2000258587A REMOTE TREATMENT DEVICE OF REACTOR INTERNAL STRUCTURE 失效
公开(公告)号：JP2000258587A
公开(公告)日：2000-09-22
申请号：JP6206899
申请日：1999-03-09
申请人： TOSHIBA CORP
发明人： YAMAMOTO TETSUO , KATO HIROMI , HAMAMOTO YOSHIO , OGISU TATSUKI , IKAKURA HIROAKI , SATO KATSUHIKO
IPC分类号： G21C19/02
摘要： PROBLEM TO BE SOLVED: To efficiently apply the device for any works such as inspection, preventive maintenance and repair by making access possible for whole outer wall of core shroud. SOLUTION: A running dolly 11 placed on the upper flange 2a of core shroud 2 and circumferentially positioning, an L-shape structure 20 held by the running dolly 11 and hung in the space surrounded by the outer wall of the core shroud 2, the inner wall of the reactor pressure vessel and a baffle plate, a tool 13 fixed to the L-shape structure 20 and performing either of various inspections or works, an elevation mechanism driving the tool up and down direction, and a rotational mechanism 30 rotationally driving the tool 13 are provided and the tool 13 is made to access the in-core structure in the space for inspection, preventive maintenance and repair.

94. 发明专利

JP2000011686A SEMICONDUCTOR MEMORY DEVICE 失效
公开(公告)号：JP2000011686A
公开(公告)日：2000-01-14
申请号：JP16800598
申请日：1998-06-16
申请人： TOSHIBA CORP
发明人： BANBA HIRONORI , WADA MASAHARU , SATO KATSUHIKO
IPC分类号： G11C11/41 , G11C11/401 , G11C29/00 , G11C29/04 , G11C29/12
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor memory device in which an increase in the scale of a circuit due to the building-in of a CID circuit is suppressed effectively by a method wherein a data line which is arranged and installed in the region of a memory cell array is shared as a data line which fetches the output of the CID circuit. SOLUTION: A memory cell array 1 is divided into a plurality of cell array blocks 11 so as to sandwich shared sense amplifier columns 2. Data line pairs DQ, bDQ are arranged and installed so as to be continued on the cell array blocks 11. A CID circuit 7 which stores chip information is arranged at the end part on the side opposite to a data buffer 5 of the data line pairs DQ, bDQ. Data in the CID circuit 7 is read out by the data line pairs DQ, bDQ instead of cell data by an activation signal CIDGATE which is generated by a chip-information readout control circuit 8 when a CID command is given, and it is fetched by an external input/output terminal I/O via the data buffer 5.

95. 发明专利

JPH11174032A DEVICE AND METHOD FOR INSPECTION OF INTERMEDIATE HEAT EXCHANGER 失效
公开(公告)号：JPH11174032A
公开(公告)日：1999-07-02
申请号：JP34005097
申请日：1997-12-10
申请人： TOSHIBA CORP
发明人： JINBO MASAKAZU , KARASAWA HIROICHI , NAKAMURA HIROSHI , SATO KATSUHIKO
IPC分类号： G01N29/04 , G01N29/22 , G01N29/24 , G01N29/26 , G01N29/44 , G21C17/003 , G01N29/10
摘要： PROBLEM TO BE SOLVED: To provide a device and method for inspection of an intermediate heat exchanger capable of accurately detecting the defect and reduction in wall thickness of a heat exchanger tube and bellows of the intermediate heat exchanger when the intermediate heat exchanger is installed insidde an intermediate heat exhanger container. SOLUTION: A heat transfer tube inspection device 31 is inserted into the upper surface of a tube plate 17 by an exclusive cask. A heat transfer tube probe 32 is moved to an opening part 41 of a specified heat transfer tube 4 positioned on the upper surface of the tube plate 17 by a moving device 37, and the heat transfer tube probe 31 is inserted into the heat transfer tube 4 from the opening part 41 of the heat trransfer tube 4 by a feeding mechanism 34 so as to inspect a defect and a reduction in wall thickness of the heat transfer tube 4. After one heat transfer tube 4 has been inspected, the heat transfer tube probe 31 is pulled out from the heat transfer tube 4 and moved to the opening part 41 of a next heat transfer tube 4 by the moving device 37. In the same manner, a detect and a reduction in wall thickness of the next heat transfer tube 4 are in spected. By repeating such a movement and insertion sequentially, a detect and a reduction in wall thickness of all heat transfer tubes 4 can be inspected.

96. 发明专利

JPH10123215A SEMICONDUCTOR INTEGRATED CIRCUIT 失效
公开(公告)号：JPH10123215A
公开(公告)日：1998-05-15
申请号：JP27818896
申请日：1996-10-21
申请人： TOSHIBA MICRO ELECTRONICS , TOSHIBA CORP
发明人： NOMICHI HIROYUKI , SATO KATSUHIKO
IPC分类号： G01R31/28 , H01L21/66 , H01L21/822 , H01L27/04
摘要： PROBLEM TO BE SOLVED: To observe and evaluate the signal waveforms of a number of circuit nodes without increasing a chip area by providing a circuit that is driven by the output signal of a switch circuit, and a pad for measurement where an output signal is supplied, and the like. SOLUTION: Signal wires 13-18 are connected to element parts (internal nodes) for measuring signal waveforms in a plurality of corresponding circuits. A signal selection circuit 19 selects a plurality of switch circuits 21-26 selectively based on an external selection signal. An output driver circuit 28 is inserted into one external wire 27 that is driven by the output signal of a switch circuit that is selected by the signal selection circuit 19. Therefore, the signals of a plurality of internal nodes can be observed and evaluated in time series by a plurality of switch circuits 21-26, one signal selection circuit 19, one series output drive circuit 28, and a measuring pad 29.

97. 发明专利

JPH1032294A SEMICONDUCTOR PACKAGE OUTER LEAD BENDING METHOD AND DEVICE 失效
公开(公告)号：JPH1032294A
公开(公告)日：1998-02-03
申请号：JP18727296
申请日：1996-07-17
申请人： TOSHIBA CORP
发明人： SUGIHARA KOICHI , SATO KATSUHIKO , YOSHIMURA ATSUSHI
IPC分类号： B21D5/01 , H01L23/50
摘要： PROBLEM TO BE SOLVED: To provide an outer lead bending method and a bending device which are capable of ensuring the outer leads of a semiconductor package of forming stable angle in coplanarity, by a method wherein the influence of variability in the thickness of a solder plating layer provided onto the surface of the outer lead is avoided or lessened. SOLUTION: An outer lead bending method includes a first process where a semiconductor package 14 is positioned and placed on the surface of a bending die 15 with a side corresponding to the bending shape of the outs leads 14a which extend from the sides of the package 14, a second process where the semiconductor package 14 positioned and placed on the bending die 15 are pressed and fixed, and a third process where the outer lead 14a of the semiconductor package 14 is put along the forming surface of the bending die 15, and a bending roller 21 which is supported in a swingable and rotatable manner is rotated and slided to bend the outer lead 14a. In this case, the bending roller 21 is two-dimensionally supported in a swingable and rotatable manner, so that the processing surface of the bending roller can be set to be confronted with the bending surface of the bending die 15 either in parallel or not in parallel with it.

98. 发明专利

JPH09329344A AIR CONDITIONER 失效
公开(公告)号：JPH09329344A
公开(公告)日：1997-12-22
申请号：JP14933096
申请日：1996-06-11
申请人： TOSHIBA CORP
发明人： SATO KATSUHIKO
IPC分类号： F24F13/22 , F24F1/00
摘要： PROBLEM TO BE SOLVED: To prevent or reduce condensation from being produced on an outer bottom surface of a drain pan at low cost. SOLUTION: The present air conditioner includes a drain pan 13 for receiving drain from an indoor heat exchanger and having its lower end part 13a exposed into a fan air passage 7 of an indoor fan, and a noze 12 for guiding fan air on the side of the indoor fan rather than the drain pan 13 on the fan air passage 7. The noze 12 is constructed with separately from the drain pan 13. An outer surface of at least lower end part 13a of the drain pan 13 on the side of the fan air passage 7 is covered with part of the noze 12.

99. 发明专利

JPH0921544A INDOOR UNIT FOR AIR CONDITIONER 失效
公开(公告)号：JPH0921544A
公开(公告)日：1997-01-21
申请号：JP16996495
申请日：1995-07-05
申请人： TOSHIBA AVE KK , TOSHIBA CORP
发明人： SATO KATSUHIKO , OZAWA TETSURO
IPC分类号： F24F13/22 , F24F1/00
摘要： PROBLEM TO BE SOLVED: To provide an indoor unit for an air conditioner, capable of securing comfortable air conditioning by achieving effective treatment of drain and preventing dew from being produced, and capable of reducing the cost of the indoor unit by simplifying the manufacture and assembly of the same. SOLUTION: An indoor unit is provided with a unit main body 1 having inlet ports 2a, 2b and an outlet port 20 and being formed of a front panel 2 and a rear plate 3, a heat exchanger 7 which is formed into an inverted V-shape when viewed from its side face and composed of a front side heat exchanger 7A and a rear side heat exchanger 7B, and a blower 11 for sucking air to be cooled in an air-conditioning chamber through the inlet ports to be allowed to flow through the heat eschangers and blowing the cooled air from the outlet port through an air blow passage after heat-exchanging is carried out. Further, the indoor unit is provided with a fore drain pan 9A and an aft drain pan 9B, each being arranged under the front side heat exchanger and the rear side heat exchanger, respectively, and right and left gutters which are positioned inside the air blow passage and mounted so as to extend between the fore drain pan and the aft drain pan for guiding and sending drain collected in the aft drain pan into the fore drain pan.

100. 发明专利

JPH0915377A DEVICE AND METHOD FOR REMOTE IN-PILE WORK 失效
公开(公告)号：JPH0915377A
公开(公告)日：1997-01-17
申请号：JP16170595
申请日：1995-06-28
申请人： TOSHIBA CORP
发明人： SATO KATSUHIKO , YUGUCHI YASUHIRO , KIMURA MOTOHIKO
IPC分类号： G21C17/003 , G21C19/02
摘要： PURPOSE: To facilitate inspection and repair of structures by providing a positioning mechanism moving to the normal direction on a circumferential moving mechanism rotating coaxially along the upper end of a shroud and inserting a multitude of masts and work manipulators in its annulus part by rotating and standing. CONSTITUTION: On a running guide provided at the upper end of shroud upper part 7, a remote in-pile work device 1 is placed. A slide table 37 is fell in the core direction with a mast standing mechanism 17 and a multi-step mast 10 is drawn up by a slide mechanism 18 and made in the containing posture together with the work manipulator 11. A mast 41 is positioned insertion free into the annulus 5. By operating together a radial positioning mechanism 16, a mechanism 17 and a mechanism 18, the manipulator 11 and the mast 10 are stood avoiding interference. Next, the mast 10 is extended and the mast 10 is fell in the inspection and repair region in the annulus 5. Then, by operating manipulator 11, various in-pile work can be done efficiently and remotely.

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