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    • 2. 发明公开
    • APPARATUS AND METHOD FOR INDIRECT SURFACE CLEANING
    • 用于间接表面清洁的装置和方法
    • EP2178655A4
    • 2014-05-07
    • EP08796835
    • 2008-07-30
    • RAVE LLC
    • LECLAIRE JEFFREY EROESSLER KENNETH GILBERBRINKLEY DAVID
    • G03C5/00B08B7/00G03F1/00G03F1/82H01L21/00
    • B08B7/0042G03F1/82Y10S134/902
    • A method for laser surface cleaning of a target surface that has limited or no access to the environment directly above the surface to be cleaned. The method includes the ability to clean the surface with a reduced risk of substrate damage. The method includes direct laser excitation of a contaminated substrate surface and thermal transfer from the substrate to the contaminating particulate or contamination layer. The method also includes producing a thermally based removal and reducing a risk of substrate damage by keeping the temperature required to produce surface cleaning below the thermal damage level of the substrate material. In addition, the method includes reducing the risk of substrate damage by utilizing relatively long pulse-widths, providing for improved removal of small contaminants/particles, and directing the beam through a material disposed relative to the surface that is part of the substrates environmental enclosure.
    • 一种用于目标表面的激光表面清洁的方法,该方法在待清洁的表面正上方限制或不接近环境。 该方法包括以较低的底物损伤风险清洁表面的能力。 该方法包括对污染的基底表面的直接激光激发和从基底到污染颗粒或污染层的热传递。 该方法还包括通过将产生表面清洁所需的温度保持在基底材料的热损伤水平以下来产生基于热的去除并降低基底损伤的风险。 此外,该方法包括通过利用相对较长的脉冲宽度降低衬底损伤的风险,提供改善的小污染物/颗粒的去除以及引导光束通过相对于作为衬底环境外壳的一部分的表面设置的材料 。