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    • 3. 发明公开
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • EP3217561A1
    • 2017-09-13
    • EP17159283.5
    • 2017-03-06
    • Renesas Electronics Corporation
    • FUNATO, YoshihiroMORIMOTO, Yasuo
    • H03M1/06H03M1/46
    • H03M1/466H03M1/06H03M1/0695H03M1/468
    • A semiconductor device according to the present invention has a capacitance DAC (Digital-to-Analog Converter) circuit and a comparator.
      The capacitance DAC circuit includes: first capacitors to which input signals are given and each of which has a capacitance value corresponding to a weight of a bit to be converted; and second capacitors to which common voltages are given and whose sum of capacitance values is equivalent to that of the first capacitors. Further, the second capacitors include: a redundant bit capacitor having a capacitance value corresponding to a weight of a redundant bit; and adjustment capacitors each having a capacitance value obtained by subtracting the capacitance value of the redundant bit capacitor from the sum of the capacitance values of the second capacitors.
    • 根据本发明的半导体器件具有电容DAC(数字 - 模拟转换器)电路和比较器。 该电容DAC电路包括:第一电容器,其被给予输入信号并且其中的每一个具有与要被转换的比特的权重相对应的电容值; 以及被施加公共电压并且其电容值之和等于第一电容器的电容值的第二电容器。 此外,第二电容器包括:具有与冗余位的权重对应的电容值的冗余位电容器; 以及调整电容器,每个调整电容器具有通过从第二电容器的电容值的总和中减去冗余位电容器的电容值而获得的电容值。
    • 4. 发明公开
    • DIGITAL/ANALOG CONVERTER AND METHOD FOR CONTROLLING SAME
    • VERFAHREN ZU SEINER STEUERUNG数字模拟服务器
    • EP2658130A1
    • 2013-10-30
    • EP12858683.1
    • 2012-10-31
    • Asahi Kasei Microdevices Corporation
    • NAKAMOTO, SeikoNAKANISHI, Junya
    • H03M1/74
    • H03M1/806H03M1/06H03M1/804
    • A digital-analog converter circuit includes sampling capacitive elements (111, 112, ..., 11N) of which one ends are to be electrically connected to and disconnected from input terminals (D1, D2, ..., DN), to which digital signals are input, via a switch unit (SWu10), an operational amplifier (501), a switch (301) capable of electrically connecting and disconnecting the other ends of the sampling capacitive elements (111, 112, ..., 11N) and an inverting input terminal of the operational amplifier (501), and a switch unit (SWu40) that is disposed between nodes between the switch unit (SWu10) and the sampling capacitive elements (111, 112, ..., 11N) and the output terminal of the operational amplifier (501) and capable of connecting and disconnecting them. An on-resistance value of a MOS transistor included in the switch (301) is set to be larger than an on-resistance value of a MOS transistor included in the switch unit (SWu40).
    • 数模转换器电路包括对其一端电连接到输入端(D1,D2,...,DN)并与其断开的电容元件(111,112,...,11N)进行采样,其中 数字信号经由开关单元(SWu10),运算放大器(501),能够电连接和断开取样电容元件(111,112,...,11N)的另一端的开关(301)输入, 和运算放大器(501)的反相输入端子和设置在开关单元(SWu10)和采样电容元件(111,112,...,11N)之间的节点之间的开关单元(SWu40)和 运算放大器(501)的输出端子,并且能够连接和断开它们。 包括在开关(301)中的MOS晶体管的导通电阻值被设置为大于包括在开关单元(SWu40)中的MOS晶体管的导通电阻值。