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    • 8. 发明公开
    • AMOLED ARRAY SUBSTRATE, METHOD FOR MANUFACTURING AMOLED ARRAY SUBSTRATE, AND DISPLAY DEVICE
    • AMOLED阵列基板,AMOLED阵列基板的制造方法以及显示装置
    • EP3242326A1
    • 2017-11-08
    • EP15874992.9
    • 2015-11-17
    • BOE Technology Group Co., Ltd.
    • CAO, Kun
    • H01L27/32H01L51/52
    • H01L27/3279H01L27/32H01L27/3246H01L27/3258H01L51/52H01L51/5212H01L51/5228H01L51/56H01L2227/323H01L2251/5315
    • The present invention relates to an AMOLED array substrate which includes a plate electrode; pixel electrodes; an organic light emitting body; at least one first auxiliary line provided in the same layer as but not intersecting with the pixel electrodes; and at least one second auxiliary line provided in the same layer as source and drain electrodes of the array substrate but not intersecting with data lines and the source and drain electrodes of the array substrate, wherein: projections of the first and second auxiliary lines on the plate electrode are within projection of pixel define layer of the array substrate and at least partially overlap; and the first auxiliary line is electrically connected to the second auxiliary line via a first via hole and to the plate electrode via a second via hole formed in pixel define layer of the array substrate, wherein projection of the first via hole on the plate electrode is within overlapped projection of the first and second auxiliary lines. The present invention further relates to a display device and a method for manufacturing an array substrate. The technical solutions of the present invention can decrease in-plane resistance of the plate electrode and improve uniformity of the in-plane resistance of the plate electrode.
    • 本发明涉及一种AMOLED阵列基板,其包括平板电极; 像素电极; 有机发光体; 至少一条第一辅助线,设置在与像素电极相同的层中但不与其交叉; 以及至少一条第二辅助线,设置在与所述阵列基板的源电极和漏电极相同的层中,但不与所述阵列基板的数据线和源电极以及漏电极交叉,其中:所述第一辅助线和所述第二辅助线在所述 平板电极在阵列基板的像素限定层的投影内并且至少部分重叠; 并且所述第一辅助线经由第一过孔电连接到所述第二辅助线并经由形成在所述阵列基板的像素限定层中的第二过孔连接到所述板电极,其中,所述第一过孔在所述板电极上的投影是 在第一和第二辅助线的重叠投影内。 本发明还涉及一种显示装置和制造阵列基板的方法。 本发明的技术方案可以降低平板电极的面内电阻,提高平板电极的面内电阻的均匀性。