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1. 发明公开

EP1094321A3 A test and measurement instrument having telecommunications mask testing capability with a mask zoom feature 有权
标题翻译：与电信标测试能力和缩放安排测试和测量仪器
公开(公告)号：EP1094321A3
公开(公告)日：2001-12-19
申请号：EP00308304.5
申请日：2000-09-22
申请人： Tektronix, Inc.
发明人： Letts, Peter J.
IPC分类号： G01R13/30
CPC分类号： H04M3/30 , G01R13/30 , H04L1/24 , H04M3/005 , H04M3/305
摘要： Summary of the Invention A telecom mask testing zoom function draws mask. pixels into a raster memory. In this way, the mask is treated as a waveform. Comparison of the mask pixels and waveform pixels to detect collision between a waveform pixel and a mask pixel (i.e., a mask violation) is performed substantially in real time, as the pixels are being composited into the raster memory by the rasterizer. The mask is scalable and repositionable by the rasterizer under control of a controller, because it is treated as a waveform. The mask is lockable to the waveform because both are stored in pixel form in raster memory by the rasterizer under control of the controller.

2. 发明授权

EP0977998B1 DATENVERARBEITUNGSANLAGE UND VERFAHREN ZUR VISUALISIERUNG EINES GRADIENTEN IN EINEM AUF EINEM BILDSCHIRM DARGESTELLTEN DIAGRAMM 失效
标题翻译：数据处理系统和方法可视化梯度的AN上的屏幕图录GRAPH
公开(公告)号：EP0977998B1
公开(公告)日：2001-09-12
申请号：EP98931932.2
申请日：1998-04-16
申请人： SIEMENS AKTIENGESELLSCHAFT
发明人： MÜLLER, Paul , PFADLER, Heinrich , RÜCKER-LÜSSOW, Jürgen
IPC分类号： G01R13/30
CPC分类号： G05B23/0272 , G01R13/30
摘要： The aim of the invention is to provide a means of rapidly determining a gradient in a diagram represented on a screen used in controlling an industrial process. According to the invention, at least one rule (8, 9, 10) is superimposed onto the diagram (7). This rule can be positioned on said diagram (7) by means of screen-controlled elements (14). The gradient of the rule is then automatically displayed in the desired physical units, in a display field (4) (gradient rule).

3. 发明授权

EP1094321B1 A test and measurement instrument having telecommunications mask testing capability with a mask zoom feature 有权
标题翻译：与电信标测试能力和缩放安排测试和测量仪器
公开(公告)号：EP1094321B1
公开(公告)日：2008-09-03
申请号：EP00308304.5
申请日：2000-09-22
申请人： TEKTRONIX, INC.
发明人： Letts, Peter J.
IPC分类号： G01R13/30
CPC分类号： H04M3/30 , G01R13/30 , H04L1/24 , H04M3/005 , H04M3/305

4. 发明公开

EP0284078A1 Locking scales for waveform displays 失效
标题翻译： Verriegelung von SkalenfürWiedergabe von Kurvenformanzeigen。
公开(公告)号：EP0284078A1
公开(公告)日：1988-09-28
申请号：EP88104773.2
申请日：1988-03-24
申请人： TEKTRONIX INC.
发明人： Slavin, Keith R.
IPC分类号： G01R13/30
CPC分类号： G01R13/345 , G01R13/30 , H04N17/00
摘要： A method for locking scales to a waveform display uses reference points from the waveform to determine starting scale points. Based upon the starting scale points and the characteristics of the waveform the scales are calculated. Any changes in gain in the waveform are applied to the scales so that the scales change in direct proportion to the waveform. The field/line numbers of a television video signal are tracked and displayed on the waveform display to identify that portion of the waveform relative to a picture frame which is being displayed.
摘要翻译：用于将比例尺锁定到波形显示器的方法使用来自波形的参考点来确定起始刻度点。根据开始的刻度点和波形的特性，计算刻度。波形增益的任何变化都会应用于刻度尺，以便刻度随波形成正比变化。电视视频信号的场/行号被跟踪并显示在波形显示器上，以识别相对于正被显示的画面的波形部分。

5. 发明授权

EP0082535B1 Unwanted signal detecting and measuring apparatus 失效
标题翻译：无源信号检测和测量装置
公开(公告)号：EP0082535B1
公开(公告)日：1986-03-26
申请号：EP82111879.1
申请日：1982-12-21
申请人： Takeda Riken Kogyo Kabushikikaisha
发明人： Nakagomi, Koji , Aoki, Tetsuo , Nakajima, Takayuki
IPC分类号： G01R29/02
CPC分类号： G01R29/0273 , G01R13/30

6. 发明公开

EP1085328A3 Method of waveform time stamping for minimizing digitization artifacts in time interval distribution measurements 有权
标题翻译：用于最小化时间间隔分布测量中的数字化伪影的波形时间戳的方法
公开(公告)号：EP1085328A3
公开(公告)日：2001-08-29
申请号：EP00307719.5
申请日：2000-09-06
申请人： Tektronix, Inc.
发明人： Ward, Benjamin A.
IPC分类号： G01R13/30 , G01R19/175
CPC分类号： G01R13/0245 , G01R13/0272 , G01R13/30 , G01R13/305 , G01R13/345 , G01R19/175
摘要： A time stamping method for threshold crossing points of an input signal uses a dithered threshold level. Digital data samples are acquired for the input signal and time marks are determined for the threshold crossings using interpolation. The time marks are stores as the time stamps. A threshold offset value generator generates a distribution of offset values for dithering the threshold value. Time interval values are generated from the time stamps and the number of occurrences of time interval values are accumulated in time bins. A time interval distribution histogram and statistical time interval distribution data, such as the mean, standard deviation and minimum and maximum time intervals may be generated.
摘要翻译：输入信号的阈值交叉点的时间戳方法使用抖动阈值电平。为输入信号采集数字数据采样，并使用插值为阈值交叉确定时间标记。时间标记是作为时间戳存储的。阈值偏移值生成器生成用于抖动阈值的偏移值的分布。时间间隔值由时间戳生成，并且时间间隔值的出现次数在时间仓中累积。可以生成时间间隔分布直方图和统计时间间隔分布数据，例如平均值，标准偏差以及最小和最大时间间隔。

7. 发明公开

EP1089079A2 A test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature 有权
标题翻译：电信公司 - Testfähigkeitaufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske
公开(公告)号：EP1089079A2
公开(公告)日：2001-04-04
申请号：EP00308301.1
申请日：2000-09-22
申请人： Tektronix, Inc.
发明人： Letts, Peter J.
IPC分类号： G01R13/20 , G01R19/25
CPC分类号： H04M3/30 , G01R13/30 , H04L1/24 , H04M3/005 , H04M3/305
摘要： Initial mask and waveform positions on a display screen may be determined by an AUTOSET TO MASK function. Upon detection of violations that occur after the AUTOSET TO MASK function is complete, control for further alignment of the waveform under test and the mask is assumed by an AUTOFIT TO MASK function. Comparison of the mask pixels and waveform pixels to detect collision between a waveform pixel and a mask pixel (i.e., a mask violation) is performed substantially in real time, as the pixels are being composited into the raster memory by the rasterizer. In the event of a mask violation, a mask violation signal is generated. In a further embodiment of the invention, in response to the mask violation signal, the AUTOFIT TO MASK function uses display rasterization to automatically redraw the waveform at a new location, until the waveform fits within the mask. In yet another embodiment, in response to the mask violation signal, the AUTOFIT TO MASK function automatically redraws the telecom mask at a new location until the waveform fits within the mask.
摘要翻译：显示屏幕上的初始屏蔽和波形位置可以由AUTOSET TO MASK功能确定。在检测到AUTOSET TO MASK功能完成后出现的违规情况，通过AUTOFIT TO MASK功能，可以进行进一步对准被测波形和掩码的控制。基本上实时地执行用于检测波形像素和掩模像素之间的碰撞的掩模像素和波形像素的比较（即，由光栅化器将像素合成到光栅存储器中）。在面板违规的情况下，会产生掩码违规信号。在本发明的又一个实施例中，响应于掩模违规信号，自动到掩蔽功能使用显示光栅化来自动地重新绘制新位置处的波形，直到波形适合于掩模内。在另一个实施例中，响应于屏蔽违规信号，AUTOFIT TO MASK功能在新位置自动重新绘制电信掩码，直到波形适合于掩模。

8. 发明公开

EP0987673A1 Waveform signal display controlling device and method, and memory medium for storing a waveform signal display control program 审中-公开
标题翻译：控制装置以及用于显示的波形信号控制方法，以及用于存储这样的信号的显示控制的程序存储介质
公开(公告)号：EP0987673A1
公开(公告)日：2000-03-22
申请号：EP99307254.5
申请日：1999-09-14
申请人： Ando Electric Co., Ltd.
发明人： Fujita, Tatsuyuki, c/o Ando Electric Co., Ltd.
IPC分类号： G09G1/16
CPC分类号： G09G1/162 , G01R13/30 , G01R13/345 , G09G5/34
摘要： A display controlling device comprises; a display for displaying a data to be displayed in a display field, an input part for scrolling the display field, and a display field shift control unit for shifting the display field in one direction so that when the display field is scrolled in another direction to display the data to be displayed, the whole data to be displayed is displayed in the display field.
摘要翻译：一种显示控制装置包括; 要被显示用于显示数据的显示在显示字段输入部分用于滚动显示字段，和用于在一个方向上偏移的显示栏的显示场换档控制单元也一样。当显示字段在另一个方向上滚动至选择要显示的数据，要显示的整个数据被显示在显示字段。

9. 发明授权

EP0284078B1 Locking scales for waveform displays 失效
标题翻译：用于波形显示的锁定尺寸
公开(公告)号：EP0284078B1
公开(公告)日：1993-10-13
申请号：EP88104773.2
申请日：1988-03-24
申请人： TEKTRONIX INC.
发明人： Slavin, Keith R.
IPC分类号： G01R13/30
CPC分类号： G01R13/345 , G01R13/30 , H04N17/00

10. 发明公开

EP0082535A1 Unwanted signal detecting and measuring apparatus 失效
标题翻译：检测器和用于不希望的信号测量装置。
公开(公告)号：EP0082535A1
公开(公告)日：1983-06-29
申请号：EP82111879.1
申请日：1982-12-21
申请人： Takeda Riken Kogyo Kabushikikaisha
发明人： Nakagomi, Koji , Aoki, Tetsuo , Nakajima, Takayuki
IPC分类号： G01R29/02
CPC分类号： G01R29/0273 , G01R13/30
摘要： A device for recognizing and measuring the lengths of glitches by sampling the input signal at fractions of a sampling clock, which clock has a period shorter than the period of pulses of the correct signal but longer than the glitch widths. The corrected input signal can be displayed, along with the glitch information.

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