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1. 发明公开

EP3040450A4 METHOD FOR MANUFACTURING METAL-FILLED MICROSTRUCTURE 审中-公开
标题翻译：方法用于生产金属填充微细
公开(公告)号：EP3040450A4
公开(公告)日：2016-08-31
申请号：EP14839465
申请日：2014-08-21
申请人： FUJIFILM CORP
发明人： YAMASHITA KOSUKE
IPC分类号： C25D1/00 , C25D1/10 , C25D1/20 , C25D11/04 , C25D11/20 , C25D11/24
CPC分类号： C25D1/20 , C25D1/006 , C25D1/10 , C25D3/38 , C25D11/045 , C25D11/20 , C25D11/24 , G01R1/06 , H01L24/27 , H01R12/7076 , H01R2201/20 , H05K3/32 , H05K2203/162

2. 发明公开

EP2657812A4 TOUCH SENSOR USING GRAPHIN FOR SIMULTANEOUSLY DETECTING PRESSURE AND POSITION 审中-公开
标题翻译：与graphin触摸查询打印和位置同时检测
公开(公告)号：EP2657812A4
公开(公告)日：2015-06-17
申请号：EP11852000
申请日：2011-12-23
申请人： GRAPHENE SQUARE INC
发明人： AHN JONG-HYUN , HONG BYUNG HEE , LEE YOUNG BIN , BAE SU KANG , KIM HYEONG KEUN
IPC分类号： G06F3/041 , G06F3/044 , G06F3/045
CPC分类号： G01R1/06 , G06F3/041 , G06F3/044 , G06F3/045 , G06F2203/04103 , G06F2203/04106
摘要： Provided is a touch sensor for measuring a touch position and/or the degree of touching pressure by using graphin as an electrode and/or a strain gauge, and more particularly, to a touch sensor for simultaneously detecting pressure and position by means of change in resistance by using the graphin.

3. 发明公开

EP2553481A4 MAGNETIC JUMPER FOR BYPASSING ELECTRICAL CIRCUITS 审中-公开
标题翻译：磁跳线跳线电路
公开(公告)号：EP2553481A4
公开(公告)日：2014-05-21
申请号：EP11766259
申请日：2011-03-15
申请人： S & S MAGJUMPER LLC
发明人： S & S MAGJUMPER LLC
IPC分类号： H01R11/30 , G01R31/28 , H01R4/20 , H01R13/62
CPC分类号： H01R13/6205 , G01R1/06 , G01R1/06788 , H01R4/20 , H01R11/30 , H01R2201/20

4. 发明公开

EP1751828A4 ELECTRICAL CONNECTOR FOR SEMICONDUCTOR DEVICE TEST FIXTURE AND TEST ASSEMBLY 审中-公开
标题翻译：电连接器的半导体元件和-PRÜFEINSPANNVORRICHTUNG测试板
公开(公告)号：EP1751828A4
公开(公告)日：2008-03-19
申请号：EP05730791
申请日：2005-03-16
申请人： QUALITAU INC
发明人： CUEVAS PETER P
IPC分类号： H01R13/648 , H01R13/658
CPC分类号： H01R13/6586 , G01R1/06 , H01R24/562 , H01R2201/20
摘要： An interconnect assembly is for use in connection a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable including a plurality of wires with at lest one wire for sensing a signal from a DUT, at least one wire for a forcing signal to the DUT, and at least one wire for a guarding signal driven by the same electrical potential as the forcing signal. A male connector includes the plurality of wires, an outer metal coating surrounding the plurality of wires, and an insulating coating around the outer metal coating. A receptacle connector is for receiving the male connector and plurality of wires with corresponding contacts.

5. 发明公开

EP1751828A2 ELECTRICAL CONNECTOR FOR SEMICONDUCTOR DEVICE TEST FIXTURE AND TEST ASSEMBLY 审中-公开
标题翻译：电连接器的半导体元件和-PRÜFEINSPANNVORRICHTUNG测试板
公开(公告)号：EP1751828A2
公开(公告)日：2007-02-14
申请号：EP05730791.0
申请日：2005-03-16
申请人： Qualitau, Inc.
发明人： CUEVAS, Peter, P.
IPC分类号： H01R13/648
CPC分类号： H01R13/6586 , G01R1/06 , H01R24/562 , H01R2201/20
摘要： An interconnect assembly is for use in connection a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable including a plurality of wires with at lest one wire for sensing a signal from a DUT, at least one wire for a forcing signal to the DUT, and at least one wire for a guarding signal driven by the same electrical potential as the forcing signal. A male connector includes the plurality of wires, an outer metal coating surrounding the plurality of wires, and an insulating coating around the outer metal coating. A receptacle connector is for receiving the male connector and plurality of wires with corresponding contacts.

6. 发明公开

EP0736774A2 Improved flexible strip cable 失效
标题翻译：。。。
公开(公告)号：EP0736774A2
公开(公告)日：1996-10-09
申请号：EP96301859.3
申请日：1996-03-19
申请人： DISCOVISION ASSOCIATES
发明人： Lewis, David Earl , Murphy, Kent Thomas
IPC分类号： G01R31/02
CPC分类号： H05K1/118 , G01R1/06
摘要： A flexible strip test cable having an elongated flexible strip cable, a series of strip traces disposed lengthwise on the flexible strip cable and having electrical strip contacts near one end of the flexible strip cable, an extension cable integral with the flexible strip cable and having a width at one end greater than the width of the flexible strip cable, and a series of test traces on the extension cable having electrical test contacts near the end of the extension cable remote from the flexible strip cable. Each of the test traces is electrically connected to one of the strip traces, and the minimum distance between two test contacts is greater than the minimum distance between two strip contacts. The flexible strip test cable may have a tooling guide for aligning a cutting tool with the end of the flexible strip cable which is connected to the extension cable. Alternatively, the test contacts may be electrically accessible through one surface of the extension cable in any pattern so that the minimum distance between two test contacts is greater than the minimum distance between two strip contacts. In still another embodiment, at least one test contact is electrically accessible through one surface of the extension cable and at least one test contact is electrically accessible through the opposing surface of the extension cable.
摘要翻译：一种柔性条带测试电缆，其具有细长的柔性条状电缆，一系列条带状轨迹，纵向设置在柔性条状电缆上，并且在柔性条状电缆的一端附近具有电气接触部分，与柔性带状电缆一体的延伸电缆，在一端的宽度大于柔性条状电缆的宽度，以及延伸电缆上的一系列测试迹线，其具有远离柔性条状电缆的延伸电缆的端部附近的电测试触点。每个测试迹线电连接到条带迹线之一，并且两个测试触点之间的最小距离大于两个条形触点之间的最小距离。柔性条带测试电缆可以具有用于将切割工具与连接到延伸电缆的柔性条状电缆的端部对准的工具引导件。或者，测试触点可以以任何模式通过延伸电缆的一个表面电可触及，使得两个测试触点之间的最小距离大于两个条形触点之间的最小距离。在另一个实施例中，至少一个测试接触件可通过延伸电缆的一个表面电接触，并且至少一个测试接触件可通过延伸电缆的相对表面电接触。

7. 发明公开

EP0578375A2 Adjustable strap implemented return line for a probe station 失效
标题翻译：定制的带实施了探测站返回。
公开(公告)号：EP0578375A2
公开(公告)日：1994-01-12
申请号：EP93304456.2
申请日：1993-06-08
申请人： CASCADE MICROTECH, INC.
发明人： Smith, Kenneth Roderick , Gleason, K. Reed , Williams, Jeffrey Alan , Spargur, Laura Lorraine
IPC分类号： G01R1/067 , G01R1/073
CPC分类号： G01R1/06772 , G01R1/06 , H01R11/18 , H01R13/03
摘要： A return line (20) for a probe station includes a sheet-like conductive strap (25) having a first end (52) connected electrically to a first probe (22) and a self-coiling second end (54) connected automatically detachably to a second probe (24), as by insertion of the second probe centrally within the coils of the second end (54). If the spacing between the probes (22,24) exceeds a maximum distance, the strap (25) harmlessly disconnects. The flat central portion of the strap (25) automatically tracks any reductions in the spacing between the probes, which enables fast probe travel and minimizes noise pickup. Preferably a spindle (104) rotatably engages the coiled probe (22) and has a post member (102) that carries the second end (54) of the strap to a far side of the probe to improve tip visibility and electrical connection during close-in probing. A process of making the strap (25) includes depositing layers of metal on a substrate using thin film technology. Self-coiling behavior of the strap is promoted by preheating the substrate (120) and by choosing, for one of the layers, a metal, thickness, and deposition process that will result in strong compressive forces acting internally in the layer. For ease of removal from the substrate, self-releasing behavior of the strap is promoted by providing an ultrasmooth substrate, a first layer material (128) that bonds weakly to the substrate but has a controllable thickness, and a second layer of material (132) that bonds variably to the substrate depending on the thickness of the first layer (128).

8. 发明公开

EP0427521A3 Electrical cable assembly for a signal measuring instrument and method 失效
标题翻译：用于信号测量仪器和方法的电缆组件
公开(公告)号：EP0427521A3
公开(公告)日：1992-10-14
申请号：EP90312153.1
申请日：1990-11-06
申请人： WOVEN ELECTRONICS CORPORATION
发明人： Massey, Gaines N. , Shasteen, Sam S. , Salvatore, Anthony M. , Beck, Herbert C. , Mongeau Gary A.
IPC分类号： H01R23/66 , H01R13/66 , G01R1/06 , H01B7/08
CPC分类号： H01R13/665 , G01R1/06 , H01R12/81
摘要： A cable assembly (A) is disclosed for a logic analyzer which comprises a flat woven cable (14) having an analyzer connector (18) and a probe connector (22). The analyzer connector includes a printed circuit board (32) and the probe connector includes a printed circuit board (34). Resistor-capacitor networks (D, E) are carried on respective PC board (32, 34) for extending the effective bandwidth of the cable assembly. A cable assembly (A˝) is disclosed having a low capacitance provided by high gauge signal conductors (92) and increased center-to-center spacing between the signal conductor and exclusively associated ground wires (94a, 94b). Resistor networks (D′, E′) provide a high input resistance to the cable assembly. An interface shroud (B) connects terminal (C) of probe leads (10) to probe connector (22). A plurality of exterior grooves (54) are formed on an upper wall (44) of interface shroud (B) which receive locking arm (62) of terminal body (60). A trigger ramp (74) allows locking arm (62) to be quickly disengaged.

9. 发明公开

EP4397982A1 SAMPLING APPARATUS, BATTERY, AND ELECTRICAL DEVICE 审中-公开
公开(公告)号：EP4397982A1
公开(公告)日：2024-07-10
申请号：EP23745896.3
申请日：2023-01-09
申请人： Contemporary Amperex Technology Co., Limited
发明人： WANG, Chong , CHEN, Zhiming , ZHENG, Chenling
IPC分类号： G01R1/06 , G01R31/364 , H01M50/569 , H01M10/48
CPC分类号： Y02E60/10 , G01R1/06 , G01R31/385 , H01M10/48 , G01R31/364 , H01M50/569
摘要： A sampling apparatus (100), a battery, and an electrical device. The sampling apparatus (100) comprises a sampling circuit board (110), the sampling circuit board (110) has a first sampling line (111) and a second sampling line (112), and the first sampling line (111) and the second sampling line (112) are used for collecting different operating parameters of a battery module; a surface of at least one of the first sampling line (111) and second sampling line (112) is provided with a continuous or discontinuous protection layer; a signal output portion (113) is provided on the sampling circuit board (110), and the first sampling line (111) and the second sampling line (112) are each connected to the signal output portion (113). The surface of at least one of the first sampling line (111) and the second sampling line (112) is completely provided with a protective layer, making it so that, of the first sampling line (111) and second sampling line (112), at least a sampling circuit used for collecting temperature signals has a protective layer formed over the entire surface thereof, the protective layer satisfying the oxidation resistance requirements of the sampling circuit. The method for the surface treatment of the entire sampling circuit is not limited by the structure of a connecting part, thus avoiding the problem that the complexity of the treatment process is increased due to limitations from the structure of the connecting part.

10. 发明公开

EP2052264A1 OSZILLOSKOP-TASTKOPF 有权
公开(公告)号：EP2052264A1
公开(公告)日：2009-04-29
申请号：EP07786100.3
申请日：2007-07-16
申请人： Rhode & Schwarz GmbH & Co. Kg
发明人： PESCHKE, Martin , SCHILD, Alexander
IPC分类号： G01R1/067 , G01R1/30
CPC分类号： G01R13/20 , G01R1/06 , G01R1/067 , G01R1/06766 , G01R1/30 , G01R13/22 , G01R13/34 , G01R31/02
摘要： Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.
摘要翻译：本发明公开了一种用于示波器的探针，其包括充当阻抗变换器的多级晶体管放大器。所述放大器是直流耦合射极跟随器电路，其由双极晶体管或由场效应晶体管组成的直流耦合源极跟随器电路组成，并且其连续放大器元件的尺寸和调谐方式如下输入和输出之间产生的偏移直流电压最小。

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