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1. 发明公开

EP4361646A1 SOCKET 无效
公开(公告)号：EP4361646A1
公开(公告)日：2024-05-01
申请号：EP22828228.1
申请日：2022-06-08
申请人： Yokowo Co., Ltd.
发明人： HOSOKAWA Daisuke
IPC分类号： G01R1/06 , G01R1/067 , G01R31/26 , H01R13/24 , H01R33/76
CPC分类号： G01R1/06 , H01R13/24 , G01R1/067 , H01R33/76 , G01R31/26
摘要： A socket (10) includes a probe (100) having a first tapered portion (102) and an insulating support (200) provided with a through-hole (230) having a second tapered portion (202) to receive the first tapered portion (102). A first tapered angle (α) of the first tapered portion (102) is less than a second tapered angle (β) of the second tapered portion (202).

2. 发明公开

EP3166133A4 QUALITY EVALUATION METHOD FOR LAMINATE HAVING PROTECTIVE LAYER ON SURFACE OF OXIDE SEMICONDUCTOR THIN FILM AND QUALITY CONTROL METHOD FOR OXIDE SEMICONDUCTOR THIN FILM 审中-公开
公开(公告)号：EP3166133A4
公开(公告)日：2018-02-21
申请号：EP15814922
申请日：2015-06-22
申请人： KK KOBE SEIKO SHO (KOBE STEEL LTD )
发明人： HAYASHI KAZUSHI , MIKI AYA , KAWAKAMI NOBUYUKI
IPC分类号： H01L21/66 , G01R1/06 , G01R31/26 , G01R31/265 , G01R31/27 , H01L21/28 , H01L27/32 , H01L29/66 , H01L29/786
CPC分类号： G01R31/2656 , G01R1/06 , G01R31/2623 , G01R31/27 , H01L21/28 , H01L22/12 , H01L22/14 , H01L27/32 , H01L29/66969 , H01L29/786 , H01L29/7869 , H01L29/78693
摘要： Provided is a method for simply evaluating defects caused in interface states in oxide semiconductor thin films and protective films in TFTs having protective films formed on the surface of oxide semiconductor thin films without actually measuring the characteristics of the same. This evaluation method evaluates defects caused in the interface states by measuring electron states in the oxide semiconductor thin film by a contact method or noncontact method. The defects caused in the interface states are any of the following (1) - (3). (1) Threshold value voltage (V th ) when a positive bias is applied to the thin-film transistor (2) Difference in threshold value voltage (”V th ) before and after applying the positive bias to the thin-film transistor (3) Threshold value during the first measurement when a plurality of measurements is made of the threshold value voltage when a positive bias is applied to the thin-film transistor.

3. 发明公开

EP2657812A2 TOUCH SENSOR USING GRAPHIN FOR SIMULTANEOUSLY DETECTING PRESSURE AND POSITION 审中-公开
标题翻译： BERTHHRUNGSSENSOR MIT GRAPHIN ZUM GLEICHZEITIGEN ERFASSUNG VON DRUCK UND POSITION
公开(公告)号：EP2657812A2
公开(公告)日：2013-10-30
申请号：EP11852000.6
申请日：2011-12-23
申请人： Graphene Square Inc.
发明人： AHN, Jong-Hyun , HONG, Byung Hee , LEE, Young Bin , BAE, Su Kang , KIM, Hyeong Keun
IPC分类号： G06F3/041
CPC分类号： G01R1/06 , G06F3/041 , G06F3/044 , G06F3/045 , G06F2203/04103 , G06F2203/04106
摘要： Provided is a touch sensor for measuring a touch position and/or the degree of touching pressure by using graphin as an electrode and/or a strain gauge, and more particularly, to a touch sensor for simultaneously detecting pressure and position by means of change in resistance by using the graphin.
摘要翻译：提供一种用于通过使用石墨作为电极和/或应变计来测量触摸位置和/或接触压力的触摸传感器，更具体地，涉及一种用于通过改变来同时检测压力和位置的触摸传感器阻力通过使用graphin。

4. 发明公开

EP2211714A1 IMPEDANCE DETERMINATION 有权
标题翻译：证明阻抗的
公开(公告)号：EP2211714A1
公开(公告)日：2010-08-04
申请号：EP08800155.7
申请日：2008-10-15
申请人： Impedimed Limited
发明人： CHETHAM, Scott , DALY, Christopher Newton , BRUINSMA, Ian John
IPC分类号： A61B5/053
CPC分类号： G01R1/18 , A61B5/053 , A61B5/6885 , A61B5/7203 , G01R1/06 , G01R1/30 , G01R27/02
摘要： Apparatus for use in performing impedance measurements on a subject. The apparatus includes a processing system for causing a first signal to be applied to the subject, determining an indication of a second signal measured across the subject, using the indication of the second signal to determine any imbalance and if an imbalance exists, determining a modified first signal in accordance with the imbalance and causing the modified first signal to be applied to the subject to thereby allow at least one impedance measurement to be performed.

5. 发明公开

EP2016426A1 LUMPED RESISTANCE ELECTRICAL CABLE 审中-公开
标题翻译：含集中性电缆
公开(公告)号：EP2016426A1
公开(公告)日：2009-01-21
申请号：EP07761977.3
申请日：2007-05-07
申请人： Tektronix, Inc.
发明人： CLEM, Jonathan, D.
IPC分类号： G01R1/06
CPC分类号： G01R15/04 , G01R1/06 , G01R1/203 , H01R4/242 , H01R12/675 , H01R13/6616 , Y10S439/941 , Y10S439/947
摘要： A lumped resistance electrical cable has a multiple twisted pair ribbon cable having first and second conductive lines and twisted and untwisted portions. In the untwisted portions, one of the conductive lines on each of the twisted pairs is formed with an electrical open. Resistor blocks having resistive elements and electrical contacts is disposed on the untwisted portions with the electrical contacts electrically coupling the resistive elements across the electrical opens in the conductive lines. Other electrical contacts in the connector couple the other conductive lines of the twisted pairs to an ground plane formed on the resistor block.

6. 发明公开

EP1076827A1 METHOD AND APPARATUS FOR TESTING INTERCONNECT NETWORKS 审中-公开
标题翻译：方法和设备测试关系网
公开(公告)号：EP1076827A1
公开(公告)日：2001-02-21
申请号：EP99905146.9
申请日：1999-02-15
申请人： Exsight Electro Optical Systems Ltd.
发明人： BLAU, Pinhas , LEVY, Yaakov , NEGRI, Shabtai , BEN SHLOMO, Moshe , BANITT, David
IPC分类号： G01R1/07 , G01R31/302
CPC分类号： G01R1/06 , G01R1/07 , G01R31/02 , G01R31/302
摘要： Method and apparatus for testing interconnect networks, by generating at least two plasma jets, each in the vicinity of a distinct point (12, 13) of the circuit to be tested, applying a voltage difference whereby to cause an electric current to flow between the points through the circuit, to each point through the corresponding plasma jet and maintaining the current flow to carry out the testing process. Each plasma jet is generated by producing a discharge between two electrodes within a cavity, said plasma being ejected out through an orifice. The apparatus comprises at least two plasma injector-electrodes (14, 16) to drive an electric current between two points of the circuit to be tested, each so positioned or positionable as to direct the plasma generated thereby to one of the two points, a first electric circuit (21, 27) to supply voltage to each plasma injector-electrode, means (18, 20) for supplying gas to each plasma injector-electrode, and a second electric circuit (21, 27) similar or different from the first electric circuit, to sustain electric discharge.

7. 发明公开

EP0132328A1 Probe cable assemblies 失效
标题翻译：用于探针的电缆安排。
公开(公告)号：EP0132328A1
公开(公告)日：1985-01-30
申请号：EP84304439.7
申请日：1984-06-28
申请人： TEKTRONIX, INC.
发明人： Payne, David G.
IPC分类号： H01R11/18 , G01R1/06
CPC分类号： H01R11/18 , G01R1/06
摘要： A probe cable assembly for use in connecting a monitoring instrument to an electronic system under test comprises a sheet form cable having an instrument end, a probe end and an auxiliary interconnect end. A probe element (50) having a plurality of terminals is secured to the cable at the probe end thereof and is capable of fitting in a multiple terminal receptacle of the system under test. An auxiliary receptable (40) capable of receiving a multiple terminal electronic component from the system under test and having a plurality of terminals is also secured to the cable. A first group of conductors (16) of the cable extends between the instrument end (14) of the cable and the auxiliary interconnect end and terminates at the auxiliary interconnect end in an array corresponding to the arrangement of the terminals of the auxi!iary receptacle. A second group (20) of conductors extends between the terminals of the auxiliary receptacle and corresponding terminals of said probe element. The cable is folded to bring the terminations of the first group of conductors into registry with the terminals of the auxiliary receptacle so that conductors of the first group are connected both to predetermined terminals of the auxiliary receptacle and to corresponding terminals of the probe element.

8. 发明公开

EP3040450A4 METHOD FOR MANUFACTURING METAL-FILLED MICROSTRUCTURE 审中-公开
标题翻译：方法用于生产金属填充微细
公开(公告)号：EP3040450A4
公开(公告)日：2016-08-31
申请号：EP14839465
申请日：2014-08-21
申请人： FUJIFILM CORP
发明人： YAMASHITA KOSUKE
IPC分类号： C25D1/00 , C25D1/10 , C25D1/20 , C25D11/04 , C25D11/20 , C25D11/24
CPC分类号： C25D1/20 , C25D1/006 , C25D1/10 , C25D3/38 , C25D11/045 , C25D11/20 , C25D11/24 , G01R1/06 , H01L24/27 , H01R12/7076 , H01R2201/20 , H05K3/32 , H05K2203/162

9. 发明公开

EP2657812A4 TOUCH SENSOR USING GRAPHIN FOR SIMULTANEOUSLY DETECTING PRESSURE AND POSITION 审中-公开
标题翻译：与graphin触摸查询打印和位置同时检测
公开(公告)号：EP2657812A4
公开(公告)日：2015-06-17
申请号：EP11852000
申请日：2011-12-23
申请人： GRAPHENE SQUARE INC
发明人： AHN JONG-HYUN , HONG BYUNG HEE , LEE YOUNG BIN , BAE SU KANG , KIM HYEONG KEUN
IPC分类号： G06F3/041 , G06F3/044 , G06F3/045
CPC分类号： G01R1/06 , G06F3/041 , G06F3/044 , G06F3/045 , G06F2203/04103 , G06F2203/04106
摘要： Provided is a touch sensor for measuring a touch position and/or the degree of touching pressure by using graphin as an electrode and/or a strain gauge, and more particularly, to a touch sensor for simultaneously detecting pressure and position by means of change in resistance by using the graphin.

10. 发明公开

EP2553481A4 MAGNETIC JUMPER FOR BYPASSING ELECTRICAL CIRCUITS 审中-公开
标题翻译：磁跳线跳线电路
公开(公告)号：EP2553481A4
公开(公告)日：2014-05-21
申请号：EP11766259
申请日：2011-03-15
申请人： S & S MAGJUMPER LLC
发明人： S & S MAGJUMPER LLC
IPC分类号： H01R11/30 , G01R31/28 , H01R4/20 , H01R13/62
CPC分类号： H01R13/6205 , G01R1/06 , G01R1/06788 , H01R4/20 , H01R11/30 , H01R2201/20

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