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1. 发明授权

EP0310210B1 Measuring trace elements in gas 失效
标题翻译：测量气体中的跟踪元素
公开(公告)号：EP0310210B1
公开(公告)日：1991-05-15
申请号：EP88202520.8
申请日：1984-03-01
申请人： UTI Instruments Company
发明人： Lin, Kuo-chin , Pickett, Frederick P.
IPC分类号： G01N33/00 , H01J49/04
CPC分类号： H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/147 , H01J49/24 , Y10T137/85978

2. 发明授权

EP0311224B1 Electron impact ion source for trace analysis 失效
标题翻译：电子离子源的跟踪分析
公开(公告)号：EP0311224B1
公开(公告)日：1991-12-18
申请号：EP88202519.0
申请日：1984-03-01
申请人： UTI Instruments Company
发明人： Lin, Kuo-chin , Pickett, Frederick P.
IPC分类号： H01J49/04 , H01J49/14 , G01N33/00
CPC分类号： H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/147 , H01J49/24 , Y10T137/85978

3. 发明公开

EP0311224A1 Electron impact ion source for trace analysis 失效
标题翻译： Elektroneneinschlag-Ionenquelle zur Analysierung von Komponenten。
公开(公告)号：EP0311224A1
公开(公告)日：1989-04-12
申请号：EP88202519.0
申请日：1984-03-01
申请人： UTI Instruments Company
发明人： Lin, Kuo-chin , Pickett, Frederick P.
IPC分类号： H01J49/04 , H01J49/14 , G01N33/00
CPC分类号： H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/147 , H01J49/24 , Y10T137/85978
摘要： An apparatus for analyzing trace elements in a gas sample includes a feedback system (46, 64, 68, 70) for accurately regulating and sensing the pressure supplied to an ion chamber (32), and an ion detector (34) calibrated for accurately scaling the measurements of trace elements. The ion chamber (32) is a closed ion source which is resistant to corrosion and aids in the reduction of noise. Two filaments (96, 98) mounted outside the ion chamber (32) adjacent apertures (90) in the chamber wall are thereby shielded from the ions. A cylindrical reflector (94) is aligned to axial with and disposed around the ion chamber (32). A quadrupole analyser (23) receives the ions through an aperture (88) and is shielded by the ion chamber (32) from electrons from the filaments (96, 98).
摘要翻译：用于分析气体样品中的微量元素的装置包括用于精确地调节和感测供应到离子室（32）的压力的反馈系统（46,68,60,70）以及校正为精确地缩放的离子检测器（34）微量元素的测量。离子室（32）是封闭的离子源，其耐腐蚀并有助于降低噪音。因此，与离子室壁相邻的离子室（32）外的两个细丝（96,98）被隔离。圆柱形反射器（94）与离子室（32）的轴向对准并且设置在离子室（32）周围。四极分析器（23）通过孔（88）接收离子，并被来自细丝（96,98）的电子由离子室（32）屏蔽。

4. 发明公开

EP0310210A1 Measuring trace elements in gas 失效
标题翻译：在einem气体的Messen von Komponenten。
公开(公告)号：EP0310210A1
公开(公告)日：1989-04-05
申请号：EP88202520.8
申请日：1984-03-01
申请人： UTI Instruments Company
发明人： Lin, Kuo-chin , Pickett, Frederick P.
IPC分类号： G01N33/00 , H01J49/04
CPC分类号： H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/147 , H01J49/24 , Y10T137/85978
摘要： An apparatus for analyzing trace elements in a gas sample includes a feedback system (46, 64, 68, 70) for accurately regulating and sensing the pressure supplied to an ion chamber (32). The feedback system is capable of compensating for a wide range of input gas pressures from a source (36). The ion chamber (32) is a closed ion source which is resistant to corrosion and aids in the reduction of noise. An ion detector (34) is calibrated for accurately scaling the measurements of trace elements. A quadrupole analyser (23) receives the ions through an aperture (88) and is shielded by the ion chamber (32) from electrons from two thermionic filaments (96, 98) The ion detector (34) senses oligomers produced by the parent gas, and is so calibrated that the oligomer level measured matches the level calculated from the pressure within the ion chamber (32).
摘要翻译：用于分析气体样品中微量元素的装置包括用于精确地调节和感测供给到离子室（32）的压力的反馈系统（46,68,70）。反馈系统能够补偿来自源（36）的宽范围的输入气体压力。离子室（32）是封闭的离子源，其耐腐蚀并有助于降低噪音。校准离子检测器（34）以精确地缩放微量元素的测量值。四极分析器（23）通过孔（88）接收离子，并被来自两个热离子丝（96,98）的电子由离子室（32）屏蔽。离子检测器（34）感测由母体气体产生的低聚物，并且被校准使得所测量的低聚物水平符合从离子室（32）内的压力计算的水平。

5. 发明公开

EP0122006A3 Electron impact ion source for trace analysis 失效
标题翻译：用于跟踪分析的电子离子源
公开(公告)号：EP0122006A3
公开(公告)日：1987-01-21
申请号：EP84301357
申请日：1984-03-01
申请人： UTI Instruments Company
发明人： Lin, Kuo-chin , Pickett, Frederick P.
IPC分类号： H01J49/04 , H01J49/14 , G01N33/00
CPC分类号： H01J49/0422 , G01N30/7206 , H01J49/0009 , H01J49/147 , H01J49/24 , Y10T137/85978
摘要： @ An apparatus for analyzing trace elements in a gas sample includes a feedback system (46, 64, 68, 70) for accurately regulating and sensing the pressure supplied to an ion chamber (32). The feedback system is capable of compensating for a wide range of input gas pressures from a source (36). The ion chamber (32) is a closed ion source which is resistant to corrosion and aids in the reduction of noise. An ion detector (34) is calibrated for accurately scaling the measurements of trace elements. Two filaments (96, 98) mounted outiside the ion chamber (32) adjacent apertures (90) in the chamber wall are thereby shielded from the ions. A quadrupole analyser (23) receives the ions through an aperture (88) and is shielded by the ion chamber (32) from electrons from the filaments (96, 98). The feedback system controls the pressure in a regulator module (46), thereby determining the ion chamber pressure through the pressure drop through the exit aperture (56) of the regulator module (46).

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