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1. 发明公开

EP3051283A1 STRUCTURAL DEFORMATION DETECTING DEVICE 无效
标题翻译： VORRICHTUNG ZUR ERKENNUNG VON STRUKTURELLER VERFORMUNG
公开(公告)号：EP3051283A1
公开(公告)日：2016-08-03
申请号：EP16151073.0
申请日：2016-01-13
申请人： Toshiba TEC Kabushiki Kaisha
发明人： KOMIYA, Kenichi , ISHIKAWA, Daisuke
IPC分类号： G01N29/07
CPC分类号： G01N29/07 , G01N29/2418 , G01N29/4436 , G01N2291/011 , G01N2291/017 , G01N2291/023 , G01N2291/0232 , G01N2291/0258 , G01N2291/0289
摘要： A structural deformation detecting device (10) comprises a vibration section (1) configured to vibrate a specific vibration position on a measured structure in a non-contact manner, a first vibration measurement section (2) configured to detect the vibration generated in the measured object from any position in a non-contact manner, a housing (3) on which the vibration section and the vibration measurement section are arranged at a specific interval (LO), and a time measurement section configured to measure the time elapsing till the vibration of the measured object caused by the vibration section is detected by the first vibration measurement section.
摘要翻译：一种结构变形检测装置（10），包括：振动部（1），被配置为以非接触方式在测量结构上振动特定振动位置;第一振动测量部（2），被配置为检测所测量的振动以不接触的方式从任何位置接收物体，其中振动部分和振动测量部分以特定间隔（LO）布置在其上的壳体（3）;以及时间测量部分，被配置为测量经过振动的时间由振动部引起的测量对象由第一振动测量部检测。

2. 发明公开

EP3051284A1 STRUCTURAL DEFORMATION DETECTING DEVICE 无效
标题翻译：结构变形检测装置
公开(公告)号：EP3051284A1
公开(公告)日：2016-08-03
申请号：EP16151115.9
申请日：2016-01-13
申请人： Toshiba TEC Kabushiki Kaisha
发明人： KOMIYA, Kenichi , ISHIKAWA, Daisuke
IPC分类号： G01N29/07
CPC分类号： G01N29/2418 , G01N29/07 , G01N29/4436 , G01N2291/011 , G01N2291/017 , G01N2291/023 , G01N2291/0232 , G01N2291/0258 , G01N2291/0289 , G01N2291/044 , G01N2291/048
摘要： A structural deformation detecting device comprises a vibration section (2) provided with a plurality of vibrators for vibrating a structure (4) serving as a measured object in a non-contact manner, a vibration measurement section (1) configured to detect the vibration wave (6) generated in the measured object (4) at any measurement position in a non-contact manner, a housing (3) on which the vibration section (2) and the vibration measurement section (1) are arranged at a specific interval (L 0 ), a time measurement section configured to measure the time elapsing till the vibration wave (6) in the measured object (4) is detected by the first vibration measurement section (1) at a specific position, and a deformation determination section configured to determine whether or not there is a deformation (5) by comparing the time taken for the transmission of vibration from the vibration position to the measurement position in a deformation-free state with the time measured by the time measurement section.
Fig. 2
摘要翻译：本发明涉及一种结构变形检测装置，该结构变形检测装置包括：振动部分（2），该振动部分设置有用于以非接触方式振动用作被测物体的结构（4）的多个振动器;振动测量部分（1）（2）和振动测量部（1）以特定间隔（1）布置在其上的壳体（3），所述壳体（3）在测量对象（4） L0）;时间测量部分，被配置为测量在第一振动测量部分（1）在特定位置处检测到被测物体（4）中的振动波（6）之前所经过的时间;变形确定部分，通过比较在无变形状态下从振动位置到测量位置的振动传递所花费的时间与由时间测量所测量的时间的比较来确定是否存在变形（5） ement部分。图2

3. 发明授权

EP3199946B1 DEFORMATION DETECTING DEVICE 有权转让
公开(公告)号：EP3199946B1
公开(公告)日：2019-05-08
申请号：EP17151600.8
申请日：2017-01-16
申请人： Toshiba TEC Kabushiki Kaisha
发明人： KOMIYA, Kenichi , ISHIKAWA, Daisuke
IPC分类号： G01N29/07 , G01S17/08

4. 发明公开

EP3104193A1 DISTANCE MEASUREMENT APPARATUS 审中-公开
标题翻译： ABSTANDSMESSVORRICHTUNG
公开(公告)号：EP3104193A1
公开(公告)日：2016-12-14
申请号：EP16173928.9
申请日：2016-06-10
申请人： Toshiba TEC Kabushiki Kaisha
发明人： ISHIKAWA, Daisuke , KOMIYA, Kenichi
IPC分类号： G01S17/32 , G01S17/42 , G01S7/481 , G01S17/10 , G01S7/486 , G01S7/491
CPC分类号： G01S17/32 , G01S7/4808 , G01S7/4812 , G01S7/4817 , G01S7/486 , G01S7/4916 , G01S17/105 , G01S17/42
摘要： A distance measurement apparatus comprises an acquisition section which counts time between a first timing when an output of a photodiode built in a semiconductor laser exceeds a first threshold value because a laser element of the semiconductor laser starts to output laser light and a second timing when the output of the photodiode exceeds a second threshold value higher than the first threshold value because the laser light is reflected by a measurement object and returns to the laser element, and acquires the counted time as flight time of the laser light from a moment when the laser light is output to a moment when the laser light is reflected by the measurement object and returns to calculate a distance from the laser element to the measurement object or displacement of the distance.
摘要翻译：距离测量装置包括：获取部，其对半导体激光器内置的光电二极管的输出超过第一阈值的第一定时进行计时，这是因为半导体激光器的激光元件开始输出激光，当第二定时由于激光被测量对象反射并返回到激光元件，因此光电二极管的输出超过第一阈值的第二阈值，并且从激光器的时刻获取激光的飞行时间的计数时间光被输出到当激光被测量对象反射的时刻，并返回以计算从激光元件到测量对象的距离或距离的位移。

5. 发明公开

EP3199946A1 DEFORMATION DETECTING DEVICE 有权转让
标题翻译：变形检测装置
公开(公告)号：EP3199946A1
公开(公告)日：2017-08-02
申请号：EP17151600.8
申请日：2017-01-16
申请人： Toshiba TEC Kabushiki Kaisha
发明人： KOMIYA, Kenichi , ISHIKAWA, Daisuke
IPC分类号： G01N29/07
CPC分类号： G01N29/07 , G01N2291/011 , G01N2291/0289 , G01N2291/106 , G01S17/08
摘要： A deformation detecting device comprises a vibration module configured to vibrate a first point of a measuring plane of a measured object in a non-contact manner; a transmission time measurement module configured to measure transmission time of vibration from the first point to a second point of the measuring plane in a non-contact manner; an inclination measurement module configured to measure an inclination of the measuring plane to a reference surface in a non-contact manner; and a determination module configured to determine presence/absence of deformation in the measured object by comparing the transmission time with reference transmission time serving as transmission time of vibration from the first point to the second point in a case in which there is no inclination of the measuring plane and corrects the reference transmission time in response to the inclination of the measuring plane.
摘要翻译：变形检测装置包括：振动模块，用于以非接触方式振动被测物体的测量平面的第一点; 传输时间测量模块，被配置为以非接触方式测量从所述第一点到所述测量平面的第二点的振动传输时间; 倾斜度测量模块，其被配置为以非接触方式测量所述测量平面相对于参考表面的倾斜度; 以及确定模块，被配置为通过将所述传输时间与作为从所述第一点到所述第二点的振动的传输时间的参考传输时间进行比较来确定所述被测物体中变形的存在/不存在，测量平面并且响应于测量平面的倾斜度来校正参考传输时间。

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