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1. 发明公开

EP3104115A1 PROBE CALIBRATION DEVICE WITH OPEN-ENDED CAVITY, METHOD OF CALIBRATING A PROBE AND METHOD OF FABRICATION 有权
标题翻译： SENENKALIBRIUNUNGSVORRICHTUNGEN UND VERFAHREN
公开(公告)号：EP3104115A1
公开(公告)日：2016-12-14
申请号：EP16174054.3
申请日：2016-06-10
申请人： The Boeing Company
发明人： FRASCH, Lydell L. , ROMAN, Nathaniel P.
IPC分类号： G01B7/06 , G01N22/00 , H01P7/06
摘要： A probe calibration device is disclosed that includes an open-ended cavity suitable as microwave resonator and comprising a
first offset element having a substantially rectangular first aperture, a tuned pass element disposed adjacent to the first offset element and having s a non-rectangular second aperture, a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. and having a substantially rectangular third aperture, and a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form the open-ended cavity.
Also discussed is a method of calibrating a probe and a method of manufacturing a calibration device.
摘要翻译：公开了一种探针校准装置，其包括适合作为微波谐振器的开放式腔，并且包括具有基本上矩形的第一孔的第一偏移元件，与第一偏移元件相邻设置且具有非矩形第二孔的调谐通道元件，邻近调谐传递元件设置的第二偏移元件和与第一偏移元件相对的一侧。并且具有基本上矩形的第三孔，以及邻近第二偏移元件设置的背衬元件。第一偏移元件，调谐传递元件，第二偏移元件和背衬元件形成开放式空腔。还讨论了校准探针的方法和制造校准装置的方法。

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