会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明公开
    • Electronic device having a part which is subject to temperature dependent deterioration
    • Elektronische Vorrichtung mit einem Teil mittemperatursabhängigerVerschlechterung
    • EP2985755A1
    • 2016-02-17
    • EP14180481.5
    • 2014-08-11
    • TP Vision Holding B.V.
    • Lanoye, Lieve Lea AndreaCatteau, Benoit Didier RaphaelVan Parys, Hans Achiel GilbertePeeters, Luc Henri JozefPenninck, Lieven Henri
    • G09G3/34G09G3/20G09G3/36
    • G09G3/3406G09G3/20G09G3/3611G09G2320/041G09G2320/048G09G2330/021
    • An electronic device (1;100) comprises circuitry (7;101) and a part (5;102) with a deterioration which is dependent on a temperature behaviour of the part in a preceding period means. The device (1;100) further comprises means for deriving (12;103) an estimate of a thermal accumulated deterioration of the part (5;102) caused by the temperature behaviour in the preceding period. The device (1;100) is controlled in dependence on the estimate of the thermal accumulated deterioration, so as to cause that said part deteriorate in a defined manner.
      The invention is in particular suitable for thin LCD displays (2) in which the backlight is generated by LEDs (5). Due to the thin dimensions the temperature of the LEDs (5) and the solder joint with which the LEDs (5) are fixed to a circuit board in the backlight unit (3,4) can reach high levels which can cause substantial deterioration of the LEDS (5) and solder joints. In case the accumulated deterioration exceeds a reference level (Ref) belonging to the total time (Ttot) that the display device (1) is already in operation, then the average power to the LEDs (5) in the backlight units (3,4) is reduced. So it is achieved that the thermal accumulated damages is kept below the values belonging to the total operation time. In this way it is prevented that the lifespan of the display device (1) is reached too early.
    • 电子设备(1; 100)包括电路(7; 101)和具有劣化的部分(5; 102),所述劣化取决于前一周期装置中部件的温度行为。 装置(1; 100)还包括用于导出(12; 103)由前一周期中的温度行为引起的部分(5; 102)的热累积恶化的估计的装置。 根据热累积劣化的估计值来控制装置(1; 100),从而使所述部件以规定的方式劣化。 本发明特别适用于其中由LED(5)产生背光的薄型LCD显示器(2)。 由于尺寸薄,LED(5)的温度和LED(5)固定在背光单元(3,4)中的电路板上的焊点可能达到高水平,这可能导致 LEDS(5)和焊点。 在累积劣化超过属于显示装置(1)已经在运行的总时间(Ttot)的参考电平(Ref)的情况下,背光单元(3,4)中的LED(5)的平均功率 ) 降低了。 因此,实现热累积损伤保持在低于总操作时间的值。 以这种方式,可以防止显示装置(1)的寿命过早地到达。