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1. 发明公开

EP4413916A2 OPHTHALMIC DEVICE AND METHOD FOR CONTROLLING SAME 审中-公开
公开(公告)号：EP4413916A2
公开(公告)日：2024-08-14
申请号：EP24182193.3
申请日：2020-07-10
申请人： TOPCON CORPORATION
发明人： SUZUKI, Masaya , NAKAJIMA, Masashi , SHIMIZU, Hitoshi
IPC分类号： A61B3/14
CPC分类号： A61B3/12 , A61B3/14
摘要： In a method of controlling an ophthalmic apparatus, the ophthalmic apparatus comprises:
a light source; an illumination optical system including a slit with a slit-shaped aperture capable of being arranged at a position substantially conjugate optically to a fundus of a subject's eye, and configured to generate slit-shaped illumination light using light from the light source; a first movement mechanism configured to move the slit in an optical axis direction of the illumination optical system; an optical scanner configured to deflect the illumination light to guide the illumination light to the fundus; an imaging optical system configured to guide returning light of the illumination light from the fundus to an image sensor; and a controller configured to control the image sensor using a rolling shutter method so as to acquire light receiving result of the returning light corresponding to an irradiated position of the illumination light on the fundus. The method comprises an acquisition step of acquiring a dioptric power of the subject's eye, and a first control step of controlling the first movement mechanism based on the dioptric power acquired in the acquisition step.

2. 发明公开

EP4133993A1 OPHTHALMOLOGICAL DEVICE 审中-实审
公开(公告)号：EP4133993A1
公开(公告)日：2023-02-15
申请号：EP21783915.8
申请日：2021-03-31
申请人： TOPCON CORPORATION
发明人： SUZUKI, Masaya , YAMADA, Kazuhiro , SHIMIZU, Hitoshi , NAKAJIMA, Masashi
IPC分类号： A61B3/10
摘要： An ophthalmic apparatus includes an illumination optical system including a slit in which a slit-shaped aperture is formed and an iris aperture in which two apertures are formed at positions away from an optical axis position, the iris aperture being arranged at a position substantially conjugate optically to an iris of a subject's eye between a light source and the slit, and configured to generate slit-shaped illumination light using light from the light source and to guide the illumination light to a fundus of the subject's eye; and an imaging optical system including an imaging aperture in which an aperture is formed, and configured to guide returning light of the illumination light to an image sensor, the returning light being guided from the fundus by pupil division and passing through the aperture formed in the imaging aperture. A width of the slit-shaped aperture, a distance between the two apertures, and a size of the aperture in the imaging aperture are set so that an overlap region of a light flux region of the illumination light and a light flux region of the returning light is located on a side of the fundus from a posterior surface of lens of the subject's eye within the eye of the subject eye.

3. 发明公开

EP3808250A1 SLIT LAMP MICROSCOPE AND OPHTHALMIC SYSTEM 审中-实审
公开(公告)号：EP3808250A1
公开(公告)日：2021-04-21
申请号：EP19818732.0
申请日：2019-06-12
申请人： TOPCON CORPORATION
发明人： OOMORI, Kazuhiro , FUKUMA, Yasufumi , SHIMIZU, Hitoshi
IPC分类号： A61B3/135
摘要： A slit lamp microscope according to an exemplary embodiment comprises an illumination system, an imaging system, and a movement mechanism. The illumination system emits slit light to the anterior segment of an eye being examined. The imaging system comprises: an optical system that guides light from the anterior segment which is being irradiated with the slit light; and an imaging element that receives the light guided by the optical system on an imaging plane. The movement mechanism moves the illumination system and the imaging system. An object plane along the optical axis of the illumination system and the imaging plane of the optical system satisfy the Scheimpflug principle. The imaging system repeatedly images the anterior eye segment to acquire a plurality of images thereof while the illumination system and imaging system are moved by the movement mechanism.

4. 发明公开

EP4023142A1 SLIT-LAMP MICROSCOPE, OPHTHALMIC SYSTEM, METHOD OF CONTROLLING SLIT-LAMP MICROSCOPE, AND RECORDING MEDIUM 审中-实审
公开(公告)号：EP4023142A1
公开(公告)日：2022-07-06
申请号：EP20858277.5
申请日：2020-06-01
申请人： TOPCON CORPORATION
发明人： SHIMIZU, Hitoshi , OMORI, Kazuhiro , TSUKADA, Hisashi
IPC分类号： A61B3/135
摘要： A slit-lamp microscope according to an exemplary embodiment comprises a scanning unit, a control unit, and an image set creating unit. The scanning unit scans, with slit light, an anterior eye part of an eye to be inspected, and collects an image group. The control unit controls the scanning unit to apply two or more scans to the anterior eye part. The image set creation unit creates an image set by selecting, from two or more image groups collected by the scanning unit in response to the two or more scans, a series of images corresponding to a scanning range.

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