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1. 发明公开

EP1760595A1 SEMICONDUCTOR DEVICE HAVING POWER CONSUMPTION ANALYSIS PREVENTING FUNCTION 审中-公开
标题翻译：麻省理工学院麻省理工学院
公开(公告)号：EP1760595A1
公开(公告)日：2007-03-07
申请号：EP05737181.7
申请日：2005-05-09
申请人： SHARP KABUSHIKI KAISHA
发明人： OHYAMA, Shigeo
IPC分类号： G06F12/14 , G06K19/073
CPC分类号： G06K19/07363 , G06F21/755 , G06K19/073
摘要： There is a provided a semiconductor device having a high security whose power consumption is difficult to analyze even without setting up random characteristic to the processing time. The semiconductor device includes a target circuit (14), a sub-target circuit (15) having the same circuit configuration as the target circuit (14), and a dummy bit string generation circuit (11) for generating a bit string of a dummy serial input signal to be inputted to the sub-target circuit (15) according to the bit string of the serial input signal of the target circuit (14). The dummy bit string generation circuit (11) includes a hamming distance detection circuit (12) for detecting a hamming distance between two continuous bits of the serial input signal as a first hamming distance, and a conflicting signal generation circuit (13) for generating after the last bit, upon detection of the first hamming distance, an input bit having a hamming distance from the last bit of the bit string of the dummy serial input signal which distance is a second hamming distance conflicting with the first hamming distance.
摘要翻译：提供了具有高安全性的半导体器件，即使没有在处理时间内设置随机特性，其功耗难以分析。半导体器件包括目标电路（14），具有与目标电路（14）相同的电路结构的子目标电路（15），以及用于产生虚拟的位串的虚拟位串生成电路（11）串行输入信号根据目标电路（14）的串行输入信号的位串输入到子目标电路（15）。伪位串生成电路（11）包括：汉明距离检测电路（12），用于检测作为第一汉明距离的串行输入信号的两个连续位之间的汉明距离;以及冲突信号生成电路（13），用于在后在检测到第一汉明距离时，最后一位具有与虚拟串行输入信号的比特串的最后一位相距汉明距离的输入比特，该距离是与第一汉明距离相冲突的第二汉明距离。

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