会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明公开
    • Testing device and testing method thereof
    • Testvorrichtung und Testverfahrendafür
    • EP2743708A2
    • 2014-06-18
    • EP13192245.2
    • 2013-11-08
    • Princo Corp.
    • Shaue, Gan-howYang, Chih-kuang
    • G01R1/073
    • G01R31/2601G01R1/0735
    • Disclosed are a testing device and a testing method thereof. The testing device includes a frame, a flexible multi-layer substrate and at least one electrical testing point. The frame is positioned corresponding to a chip. At least one electrical connecting point is formed on a surface of the chip. The flexible multi-layer substrate is fixed in the frame. The electrical testing point is corresponding to the electrical connecting point and formed on an upper surface of the flexible multi-layer substrate for contacting the electrical connecting point and performing an electrical test to the chip. Furthermore, the electrical connecting point or the electrical testing point is a bump.
    • 公开了一种测试装置及其测试方法。 测试装置包括框架,柔性多层基板和至少一个电测试点。 框架对应于芯片定位。 在芯片的表面上形成至少一个电连接点。 柔性多层基板固定在框架中。 电测试点对应于电连接点并形成在柔性多层基板的上表面上,用于接触电连接点并对芯片进行电测试。 此外,电连接点或电测试点是凹凸。
    • 5. 发明公开
    • Testing device and testing method thereof
    • 测试装置及其测试方法
    • EP2743708A3
    • 2017-11-15
    • EP13192245.2
    • 2013-11-08
    • Princo Corp.
    • Shaue, Gan-howYang, Chih-kuang
    • G01R1/073G01R31/26
    • G01R31/2601G01R1/0735
    • Disclosed are a testing device and a testing method thereof. The testing device includes a frame, a flexible multi-layer substrate and at least one electrical testing point. The frame is positioned corresponding to a chip. At least one electrical connecting point is formed on a surface of the chip. The flexible multi-layer substrate is fixed in the frame. The electrical testing point is corresponding to the electrical connecting point and formed on an upper surface of the flexible multi-layer substrate for contacting the electrical connecting point and performing an electrical test to the chip. Furthermore, the electrical connecting point or the electrical testing point is a bump.
    • 公开了一种测试装置及其测试方法。 测试装置包括框架,柔性多层基板和至少一个电测试点。 该框架对应于芯片定位。 在芯片的表面上形成至少一个电连接点。 柔性多层基板固定在框架中。 电性测试点对应于电性连接点,并形成于柔性多层基板的上表面上,以接触电性连接点并对芯片进行电性测试。 此外,电连接点或电测试点是碰撞。
    • 9. 发明公开
    • Wristwatch structure, electronic crown for wristwatch, and wristwatch having display
    • Armbanduhrstruktur,elektronische Kronefüreine Armbanduhr,und Armbanduhr mit Anzeige
    • EP2801869A2
    • 2014-11-12
    • EP14158981.2
    • 2014-03-11
    • Princo Corp.
    • Yang, Chih-kuangGuu, Yeong-yanChang, Cheng-yiShaue, Gan-how
    • G04C3/12G04C3/00
    • G04G9/0064G04C3/004G04C3/007G04C3/008G04C3/12G04G17/04
    • The present invention provides a wristwatch structure, an electronic crown for wristwatch, and a wristwatch having a display. The wristwatch structure comprises an electric driving component; an electronic core having a plurality of two-dimensional joints; and an electronic crown comprising a rotating portion and a fixed detecting portion, the detecting portion detecting electronic signals according to a rotation of the rotating portion; wherein the detecting portion of the electronic crown exports the electronic signals to the electronic core via one of the joints, and the electric driving component is electrically connected to one set of joints among the two-dimensional joints. The present invention can improve compatibility for various designs, thereby shortening product development cycle. Also, the present invention is suitable for developing a product with appearance similar to a mechanical watch.
    • 本发明提供一种手表结构,手表用电子表冠和具有显示器的手表。 手表结构包括电驱动部件; 具有多个二维接头的电子芯体; 以及电子表冠,其包括旋转部和固定检测部,所述检测部根据所述旋转部的旋转来检测电子信号; 其中电子表冠的检测部分经由一个接头将电子信号输出到电子芯,并且电驱动部件电连接到二维接头中的一组接头。 本发明可以改善各种设计的兼容性,从而缩短产品开发周期。 另外,本发明适用于开发出类似于机械表的外观的产品。