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1. 发明授权

EP2747210B1 CONTACTOR 有权
公开(公告)号：EP2747210B1
公开(公告)日：2017-08-16
申请号：EP12839653.8
申请日：2012-03-15
申请人： Omron Corporation
发明人： SAKAI, Takahiro , HEMMI, Yoshinobu
IPC分类号： H01R13/24 , H01R33/76 , G01R1/067
CPC分类号： G01R1/06716 , G01R1/06722 , H01R13/2428 , H01R2201/20

2. 发明公开

EP3037827A1 PROBE PIN AND ELECTRONIC DEVICE USING SAME 有权
标题翻译： SONDENSTIFT UND ELEKTRONISCHE VORRICHTUNG DAMIT
公开(公告)号：EP3037827A1
公开(公告)日：2016-06-29
申请号：EP14838744.2
申请日：2014-07-18
申请人： Omron Corporation
发明人： HEMMI, Yoshinobu , SAKAI, Takahiro , TERANISHI, Hirotada
IPC分类号： G01R1/067 , H01R13/24
CPC分类号： H01R4/48 , G01R1/0466 , G01R1/06722 , H01R13/2421 , H01R13/2471 , H01R2201/20
摘要： A probe pin comprises a coil spring (3), a first plunger (1) including a major portion (11), a first elastic extension (12) and a second elastic extension (13), the first and the second elastic extensions (12, 13) extending from the major portion (11) in the same direction and a second plunger (2) forcedly inserted between the first and the second elastic extensions (12, 13). The first and the second plungers (1, 2) have electric conductivity, and the first and the second plungers (1, 2) are inserted from one and the other ends of the coil spring (3), respectively, so that the first and the second elastic extensions (12, 13) of the first plunger (1) hold the second plunger (2) with the first elastic extension (12) making a forced contact with a surface of the second plunger (2) to form thereat an electric connection between the first and the second plungers (1, 2).
摘要翻译：探针包括螺旋弹簧（3），包括主要部分（11）的第一柱塞（1），第一弹性延伸部分（12）和第二弹性延伸部分（13），第一和第二弹性延伸部分，13）在相同方向上从主要部分（11）延伸，第二柱塞（2）被强制插入在第一和第二弹性延伸部分（12,13）之间。第一和第二柱塞（1,2）具有导电性，第一和第二柱塞（1,2）分别从螺旋弹簧（3）的一端和另一端插入，使得第一和第二柱塞第一柱塞（1）的第二弹性延伸部（12,13）用第一弹性延伸部（12）保持第二柱塞（2），从而与第二柱塞（2）的表面强制接触，以形成电第一和第二柱塞（1,2）之间的连接。

3. 发明公开

EP2747211A1 CONTACT AND PROBE USING SAME 有权
标题翻译： KONTAKTGEBER UND SONDE DAMIT
公开(公告)号：EP2747211A1
公开(公告)日：2014-06-25
申请号：EP12840524.8
申请日：2012-03-15
申请人： Omron Corporation
发明人： SAKAI, Takahiro , HEMMI, Yoshinobu
IPC分类号： H01R13/24 , H01R33/76
CPC分类号： G01R1/067 , G01R1/06722 , H01R13/2428 , H01R2201/20
摘要： Provided are a contactor and a probe using the same, the contactor being free of occurrence of processing strain and having a long life and low production cost even when it is a narrow and long contactor. To this end, a bellows body (20), a fixed portion (30) connected to one end (21) of the bellows body (20) and a movable portion (40) connected to the other end (22) of the bellows body (20) are integrally molded by electroforming. The movable portion (40) is depressed to compress the bellows body (20), thereby bringing adjacent arc portions (24, 24) of the bellows body (20) into contact with each other to cause a short circuit.
摘要翻译：提供一种接触器和使用该接触器的探头，该接触器即使是较长且长的接触器，也不会发生加工变形并且具有长的使用寿命和低的生产成本。为此，波纹管主体（20），连接到波纹管主体（20）的一端（21）的固定部分（30）和连接到波纹管主体（20）的另一端（22）的可移动部分（20）通过电铸整体模制。可动部分（40）被压下以压缩波纹管体（20），从而使波纹管体（20）的相邻的弧形部分（24,24）彼此接触以引起短路。

4. 发明授权

EP3156805B1 PROBE PIN AND ELECTRONIC DEVICE USING SAME 有权
公开(公告)号：EP3156805B1
公开(公告)日：2019-02-27
申请号：EP15809249.4
申请日：2015-06-04
申请人： Omron Corporation
发明人： TERANISHI, Hirotada , SAKAI, Takahiro
IPC分类号： G01R1/067 , G01R1/073

5. 发明公开

EP3444620A1 PROBE PIN AND ELECTRONIC DEVICE EMPLOYING SAME 审中-实审
公开(公告)号：EP3444620A1
公开(公告)日：2019-02-20
申请号：EP17782138.6
申请日：2017-02-27
申请人： Omron Corporation
发明人： TERANISHI, Hirotada , SAKAI, Takahiro , KONDO, Makoto , KIMURA, Naoyuki
IPC分类号： G01R1/067 , H01R13/24 , H01R33/76
摘要： A probe pin (10) includes: a coil spring (11) extending and contracting along a center line; a first contact (25) disposed on one side of the center line and having a rectangular cross section; and a second contact (34) disposed on the other side of the center line and having a rectangular cross section. The first contact (25) and the second contact (34) are supported so as to be reciprocable via the spring coil (11) and are electrically connected to each other. In particular, a contact surface of at least one of the first contact (25) and the second contact (34) is an inclined surface inclined so as to descend along a thickness direction (Y1-Y2 direction).

6. 发明公开

EP3156805A1 PROBE PIN AND ELECTRONIC DEVICE USING SAME 有权
标题翻译：探针和电子设备使用相同
公开(公告)号：EP3156805A1
公开(公告)日：2017-04-19
申请号：EP15809249.4
申请日：2015-06-04
申请人： Omron Corporation
发明人： TERANISHI, Hirotada , SAKAI, Takahiro
IPC分类号： G01R1/067 , G01R1/073 , G01R31/26
CPC分类号： G01R1/06722 , G01R1/067 , G01R1/06738 , G01R1/073 , H01R4/48
摘要： A probe pin (10) includes a coil spring (50), a first plunger (20), and second and third plungers (30 and 40). The second and third plungers (30 and 40) respectively are independently operable and include a main body (31 and 41) and first and second elastic pieces (32, 42, 34, and 44) that extend from the main body (31 and 41) in the same direction to each other. The first plunger (20) is inserted between the first and second elastic pieces (32, 42, 34, and 44) of each of the second and third plungers (30 and 40).
摘要翻译：探针（10）包括螺旋弹簧（50），第一柱塞（20）以及第二和第三柱塞（30和40）。第二和第三柱塞（30和40）分别是可独立操作的并且包括主体（31和41）以及从主体（31和41）延伸的第一和第二弹性件（32,42,34和44））在相同的方向彼此。第一柱塞（20）插入第二和第三柱塞（30和40）中的每一个的第一和第二弹性件（32,42,34和44）之间。

7. 发明公开

EP3115791A1 PROBE PIN AND ELECTRONIC DEVICE USING SAME 无效
标题翻译：探针和电子设备使用相同
公开(公告)号：EP3115791A1
公开(公告)日：2017-01-11
申请号：EP14884508.4
申请日：2014-11-21
申请人： Omron Corporation
发明人： TERANISHI, Hirotada , SAKAI, Takahiro
IPC分类号： G01R1/067 , H01R13/24
CPC分类号： G01R1/06722 , G01R1/0466 , G01R1/067 , H01R13/2407 , H01R2201/20
摘要： In a probe pin (1) including a coil spring (30), and first and second plungers (10, 20), when the first and second plungers are respectively inserted from both ends of the coil spring (30) toward an inside thereof, the first and second plungers are disposed in a reciprocable manner along an axis center of the coil spring while slide contact surfaces thereof (17, 27) are in slide contact with each other, and the first and second plungers are formed so that the coil spring can be held between a body portion (11) of the first plunger (10) and a body portion (21) of the second plunger (20). The first and second plungers are formed so that the first and second plungers are close to each other and a contact area where the slide contact surface (17) of the first plunger (10) is in contact with the slide contact surface (27) of the second plunger (20) is tilted with respect to the axis center.
摘要翻译：在包括螺旋弹簧（30）和第一和第二柱塞（10,20）的探针（1）中，当第一和第二柱塞分别从螺旋弹簧（30）的两端向其内部插入时，第一和第二柱塞以可往复的方式沿着螺旋弹簧的轴心设置，而其滑动接触表面彼此滑动接触，并且第一和第二柱塞形成为使得螺旋弹簧可以保持在第一柱塞（10）的主体部分（11）和第二柱塞（20）的主体部分（21）之间。第一柱塞和第二柱塞形成为使得第一柱塞和第二柱塞彼此靠近并且第一柱塞（10）的滑动接触表面（17）与第一柱塞（10）的滑动接触表面（27）接触的接触区域第二柱塞（20）相对于轴心倾斜。

8. 发明公开

EP2919020A1 CONNECTION TERMINAL AND CONDUCTIVITY INSPECTING EQUIPMENT USING SAME 无效
标题翻译：终端和导电性检查装置
公开(公告)号：EP2919020A1
公开(公告)日：2015-09-16
申请号：EP13854119.8
申请日：2013-10-22
申请人： Omron Corporation
发明人： TERANISHI, Hirotada , SAKAI, Takahiro
IPC分类号： G01R1/067 , G01R1/073 , H01R33/76
CPC分类号： G01R1/06727 , G01R1/0466 , G01R1/06716 , H01R13/2407
摘要： Provided is a contact terminal 11 with an elevated elasticity and contact reliability, and no harm to other components, which has a support section 20 for holding an elastically deformable axle 6 so as to rotate about the axle, a contact section 12 extending from the support section, the contact section having at a distal end thereof a contact portion 13 capable of making a contact with a testing element 7. The contact section is designed to deform elastically as it rotates with the support section by the contact of the contact portion with the testing element.

9. 发明公开

EP2747210A1 CONTACTOR 有权
标题翻译：接触器
公开(公告)号：EP2747210A1
公开(公告)日：2014-06-25
申请号：EP12839653.8
申请日：2012-03-15
申请人： Omron Corporation
发明人： SAKAI, Takahiro , HEMMI, Yoshinobu
IPC分类号： H01R13/24 , H01R33/76
CPC分类号： G01R1/06716 , G01R1/06722 , H01R13/2428 , H01R2201/20
摘要： Provided is a contactor having desired conductivity while ensuring a predetermined displacement amount. To this end, the contactor has: a bellows body (20); a fixed portion (30) connected to one end (21) of the bellows body (20); and a movable portion (40) connected to the other end (22) of the bellows body (20) and having a movable touch piece (42) that extends along the bellows body (20) from at least one side edge of the movable portion (40). The movable portion (40) is depressed to compress the bellows body (20) and bring a movable contact point (43), located at a free end of the movable touch piece (42), into contact with the fixed portion (30).
摘要翻译：提供了一种确保预定位移量的同时具有所需导电率的接触器。为此，接触器具有：波纹体（20）; 连接到波纹管体（20）的一端（21）的固定部分（30）; （20）的另一端（22）连接并具有可动接触件（42）的可动部分（40），所述可动接触件从所述可动部分（20）的至少一个侧边缘沿所述波纹管本体（40）。通过按压可动部40来压缩波纹体20，并使位于可动触摸片42的自由端的可动触点43与固定部30接触。

10. 发明授权

EP3037827B1 PROBE PIN AND ELECTRONIC DEVICE USING SAME 有权
公开(公告)号：EP3037827B1
公开(公告)日：2020-02-05
申请号：EP14838744.2
申请日：2014-07-18
申请人： Omron Corporation
发明人： HEMMI, Yoshinobu , SAKAI, Takahiro , TERANISHI, Hirotada
IPC分类号： G01R1/067 , H01R13/24 , G01R1/04

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