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1. 发明公开

EP4328539A1 INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND PROGRAM 审中-实审
公开(公告)号：EP4328539A1
公开(公告)日：2024-02-28
申请号：EP22804362.6
申请日：2022-03-18
申请人： OMRON Corporation
发明人： NARUSE, Yosuke , OHNISHI, Yasuhiro
IPC分类号： G01B11/00 , G01B11/245
摘要： An information processing system includes an imaging controller that obtains N range images of a teaching object captured with the range image sensor at N imaging positions, where N > M, a data generator that generates a plurality of composite data pieces from a plurality of different combinations of the N range images, and a determiner that calculates accuracy of each of the plurality of composite data pieces indicating a degree of matching between the composite data piece and the teaching object and determines M imaging positions from the N imaging positions based on the accuracy of each of the plurality of composite data pieces.

2. 发明公开

EP3879486A1 IMAGE CAPTURE METHOD AND IMAGE CAPTURE DEVICE 审中-公开
公开(公告)号：EP3879486A1
公开(公告)日：2021-09-15
申请号：EP19882722.2
申请日：2019-10-25
申请人： OMRON Corporation
发明人： NARUSE, Yosuke
IPC分类号： G06T7/00
摘要： An image capture method used when inspecting an object using an inspection module including a machine learning model in order to be capable of assisting in optimizing the image capture conditions of the object, said image capture method comprising: illuminating an object having known label data, and capturing images of the object using a plurality of illumination parameters to obtain a plurality of captured images; on the basis of an image data set obtained by associating a captured image with an illumination parameter, generating an estimated image of the object on the assumption that the object is illuminated using the illumination parameter; setting the maximum number of captured images permitted for the object; and performing learning by means of a machine learning model using each integer number of captured images up to and including the maximum number of captured images, optimizing illumination parameters and inspection algorithm parameters on the basis of the result of a comparison between the label data of the object and results of estimation based on the machine learning model, calculating an index representing inspection performance that is expected to be achieved using each integer number of captured images, and presenting each calculated index to a user.

3. 发明公开

EP3762794A1 METHOD, DEVICE, SYSTEM AND PROGRAM FOR SETTING LIGHTING CONDITION AND STORAGE MEDIUM 审中-公开
公开(公告)号：EP3762794A1
公开(公告)日：2021-01-13
申请号：EP18722198.1
申请日：2018-03-05
申请人： Omron Corporation
发明人： NARUSE, Yosuke , KURITA, Masashi
IPC分类号： G05B19/418 , G01N21/88 , G06T7/00

4. 发明公开

EP4432037A1 INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM 审中-实审
公开(公告)号：EP4432037A1
公开(公告)日：2024-09-18
申请号：EP22892678.8
申请日：2022-11-01
申请人： OMRON Corporation
发明人： HIROHASHI, Yuki , NARUSE, Yosuke , TASAKI, Hiroshi
IPC分类号： G05D1/02 , G09B29/00 , G08G1/09 , G01C21/32 , G01C21/34
CPC分类号： G05D1/02 , G01C21/32 , G01C21/34 , G08G1/09 , G09B29/00
摘要： An information processing device 10 includes an acquisition unit 101, a processing unit 102 and an output unit 103. The acquisition unit 101 acquires a map that distinguishes a passable area for mobile robots from an impassable area, and information relating to sizes of the robots. The processing unit 102 divides the passable area of the map into a first area in which travel directions of the robots are determined and a second area in which travel directions of the robots are not determined. The processing unit 102 uses the information relating to sizes of the robots to generate a predetermined data structure, which stores information on whether or not the robots can pass by each other in the first area as first area information and stores information on a number of the robots that can be present simultaneously as second area information. The output unit 103 outputs the data structure generated by the processing unit 102.

5. 发明公开

EP4286939A1 IMAGING CONDITION SETTING SYSTEM, IMAGING CONDITION SETTING METHOD, AND PROGRAM 审中-实审
公开(公告)号：EP4286939A1
公开(公告)日：2023-12-06
申请号：EP21923010.9
申请日：2021-09-14
申请人： OMRON Corporation
发明人： NARUSE, Yosuke , TAGUCHI, Koichi
IPC分类号： G03B15/00 , G03B15/02 , G03B15/05 , G03B7/091 , H04N5/235 , G01N21/84
摘要： An imaging condition setting system sufficiently reduces the effects of ambient light in designing optimized illumination patterns for imaging an inspection target. The system includes an imager that captures an image of a workpiece being the inspection target, an illuminator including a light source that illuminates the workpiece with light, and an imaging condition setter that sets an imaging condition to capture an image of the workpiece. The imaging condition setter sets, for the image captured with light from the illuminator to the workpiece at a luminosity greater than or equal to a threshold, an exposure time of the imager to cause a value of a pixel in a specific area of the image of the workpiece to be within a specific range.

6. 发明公开

EP3940373A1 INSPECTION DEVICE AND METHOD 审中-公开
公开(公告)号：EP3940373A1
公开(公告)日：2022-01-19
申请号：EP20772697.7
申请日：2020-02-25
申请人： OMRON Corporation
发明人： NARUSE, Yosuke
IPC分类号： G01N21/84 , G01N21/88 , G06T7/00
摘要： This inspection device comprises: an image-capturing unit which obtains an evaluation workpiece image that is captured with a plurality of predetermined illumination light emission patterns in order to obtain an optimized illumination light emission pattern with which the influence of non-defective product variations of a workpiece can be suppressed while defects in a workpiece are emphasized; an image area setting unit which sets a plurality of image areas associated with a plurality of different labels; an optimization calculation unit which generates a first index of which the output value increases as a difference between an image area associated with a non-defective label and an image area associated with a defective label increases, and a second index of which the output value increases as a difference or contrast between the image areas associated with the non-defective label increases, and calculates an illumination light emission pattern for inspection such that the first index becomes larger and the second index becomes smaller; and a determination unit which performs image processing on an inspection workpiece image captured with the illumination light emission pattern for inspection, and determines a pass/fail label of a workpiece to be inspected.

7. 发明公开

EP3762795A1 METHOD, DEVICE, SYSTEM AND PROGRAM FOR SETTING LIGHTING CONDITION AND STORAGE MEDIUM 有权
公开(公告)号：EP3762795A1
公开(公告)日：2021-01-13
申请号：EP18725294.5
申请日：2018-03-06
申请人： Omron Corporation
发明人： NARUSE, Yosuke , KURITA, Masashi
IPC分类号： G05B19/418 , G01N21/88 , G06T7/00

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