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1. 发明公开

EP1715335A1 Workpiece inspection system 审中-公开
标题翻译： Werkstück-Untersuchungssystem
公开(公告)号：EP1715335A1
公开(公告)日：2006-10-25
申请号：EP06008207.0
申请日：2006-04-20
申请人： MECTRON ENGINEERING COMPANY
发明人： Hanna, James L.
IPC分类号： G01N27/90 , G01B5/00 , B65G47/28
CPC分类号： G01B5/18 , G01N27/902 , G01N27/9026
摘要： An inspection station for a workpiece including a conveyor, a mechanism for rotating the workpiece, and a probe. The conveyor includes a fixture for locating the workpiece and the conveyor is configured to translate the workpiece in a linear manner. A mechanism, such as a belt, engages the workpiece thereby rotating the workpiece within the fixture. The probe is configured to indicate if the workpiece conforms to quality criteria. To facilitate inspection while the conveyor translates the workpiece, the probe is attached to a stage where the stage is configured to move the probe synchronously with the workpiece over an inspection region.
摘要翻译：一种用于工件的检查站，包括输送机，用于旋转工件的机构和探头。输送机包括用于定位工件的固定器，并且输送机构造成以线性方式平移工件。诸如皮带的机构接合工件，从而使工件在夹具内旋转。探头被配置为指示工件是否符合质量标准。为了便于在输送机平移工件的同时进行检查，探针附接到载物台被配置成在检查区域上与工件同步地移动探针的阶段。

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