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1. 发明公开

EP3923812A1 ACTIVE GRATINGS POSITION TRACKING IN GRATINGS-BASED PHASE-CONTRAST AND DARK-FIELD IMAGING 有权
公开(公告)号：EP3923812A1
公开(公告)日：2021-12-22
申请号：EP20800656.9
申请日：2020-11-06
申请人： Koninklijke Philips N.V.
发明人： PREVRHAL, Sven Peter , KOEHLER, Thomas , YAROSHENKO, Andriy
IPC分类号： A61B6/00 , G01B9/02 , G01B11/14 , G01D5/26 , G01N23/041 , G01S7/48 , G01S17/06 , G01S17/66

2. 发明公开

EP3786981A1 STABLE TOP-BRIDGE MANUFACTURING FOR DAX GRATINGS 审中-公开
公开(公告)号：EP3786981A1
公开(公告)日：2021-03-03
申请号：EP19194586.4
申请日：2019-08-30
申请人： Koninklijke Philips N.V. , Karlsruher Institut für Technologie
发明人： KOEHLER, Thomas , YAROSHENKO, Andriy , VOGTMEIER, Gereon , DAVID, Bernd Rudi , MOHR, Juergen , VAN BEERS, Paul , MEYER, Pascal , RICHTER, Michael , SCHULZ, Joachim
IPC分类号： G21K1/02
摘要： In order to improve the mechanical stability of an X-ray grating with top bridges for X-ray dark field imaging and/or X-ray phase contrast imaging, it is proposed to reduce or prevent the undesired high stress on the top bridges by a change in the manufacturing process. Specifically, it is proposed to electroplate the top bridges after the bending. In other words, the electroplating of the top bridges is performed on the bent geometry.

3. 发明公开

EP3705044A1 SYSTEM FOR X-RAY DARK FIELD; PHASE CONTRAST AND ATTENUATION TOMOSYNTHESIS IMAGE ACQUISITION 审中-公开
公开(公告)号：EP3705044A1
公开(公告)日：2020-09-09
申请号：EP19161518.6
申请日：2019-03-08
申请人： Koninklijke Philips N.V.
发明人： KOEHLER, Thomas , YAROSHENKO, Andriy , BRENDEL, Bernhard Johannes
IPC分类号： A61B6/00 , G01N23/041
摘要： The present invention relates to a system (10) for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition. The system comprises an X-ray source (20), an interferometer arrangement (30), an X-ray detector (40), a control unit (50), and an output unit. A first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray. The first axis extends through the examination region, and the examination region is configured to enable location of an objection to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating (32) and a second grating (34). A second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating. The control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states, wherein the X-ray source and X-ray detector are configured to operate to acquire image data. For each of the plurality of image acquisition states the first axis extends through the examination region at a different angle. The control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis. For each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions. The output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data.

4. 发明公开

EP3502674A1 TESTING OF CURVED X-RAY GRATINGS 审中-公开
公开(公告)号：EP3502674A1
公开(公告)日：2019-06-26
申请号：EP17208415.4
申请日：2017-12-19
申请人： Koninklijke Philips N.V.
发明人： YAROSHENKO, Andriy , KOEHLER, Thomas , MAACK, Hanns-Ingo , TEDERS, Matthias
IPC分类号： G01N23/041 , G03F1/84 , G01N21/956 , G21K1/06 , G01B11/24
摘要： The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating,. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface. The method comprises determining whether a projection of the reflected beam in a plane at or near the source point is present outside a central region around the source point, in which an absence of this projection outside the central region indicates that a radius of curvature of the concave reflective surface corresponds to the predetermined distance and/or that the reflective surface is substantially homogeneously curved along a curve formed by the beam impinging on the concave reflective surface.

5. 发明公开

EP3498171A1 SINGLE SHOT X-RAY PHASE-CONTRAST AND DARK FIELD IMAGING 审中-公开
公开(公告)号：EP3498171A1
公开(公告)日：2019-06-19
申请号：EP17207719.0
申请日：2017-12-15
申请人： Koninklijke Philips N.V.
发明人： YAROSHENKO, Andriy , KOEHLER, Thomas
IPC分类号： A61B6/00 , G01N23/041
摘要： A component (XS) for an X-ray detector device (XD), comprising a layer (SL) tessellated in a plurality of different regions (Rj), the regions having respective periodic structures at a respective phase, wherein two neighboring regions have periodic structures at different phases

6. 发明公开

EP4029451A1 AN X-RAY IMAGING SYSTEM AND METHOD 无效
公开(公告)号：EP4029451A1
公开(公告)日：2022-07-20
申请号：EP21152312.1
申请日：2021-01-19
申请人： Koninklijke Philips N.V.
发明人： YAROSHENKO, Andriy , KOEHLER, Thomas
IPC分类号： A61B6/00
摘要： Concepts for multi-energy dark-field (DAX) and phase-contrast (PC) X-ray imaging are proposed. One such concept comprise aqcuring a set of low energy images with phase stepping and a set of high energy images (with or without phase stepping). Transmission, DAX, and PC images are obtained from the phase-stepped low energy images using phase retrieval. Also, a high energy transmission image is obtained from the high energy image(s). Based on the transmission image from the low energy images and the transmission image from the high energy image(s), a modified transmission image is generated.

7. 发明公开

EP4022654A1 STABLE TOP-BRIDGE MANUFACTURING FOR DAX GRATINGS 审中-公开
公开(公告)号：EP4022654A1
公开(公告)日：2022-07-06
申请号：EP20757894.9
申请日：2020-08-18
申请人： Koninklijke Philips N.V.
发明人： KOEHLER, Thomas , YAROSHENKO, Andriy , VOGTMEIER, Gereon , DAVID, Bernd, Rudi , MOHR, Juergen , VAN BEERS, Paulus, René, Maria , MEYER, Pascal , RICHTER, Michael , SCHULZ, Joachim
IPC分类号： G21K1/02

8. 发明公开

EP3828831A1 MOTION ARTIFACT CORRECTION FOR PHASE-CONTRAST AND DARK-FIELD IMAGING 审中-公开
公开(公告)号：EP3828831A1
公开(公告)日：2021-06-02
申请号：EP19212117.6
申请日：2019-11-28
申请人： Koninklijke Philips N.V.
发明人： KOEHLER, Thomas , YAROSHENKO, Andriy , MAACK, Hanns-Ingo , PRALOW, Thomas , LUNDT, Bernd
IPC分类号： G06T11/00 , G06T5/00 , G06T5/50 , A61B6/00
摘要： A system (IPS) and related method for image processing, in particular dark-field or phase contrast imaging to reduce motion artifacts. The system comprises an input interface (IN) for receiving a series of projection images (π) acquired by an X-ray imaging apparatus (XI) of an object (OB) for a given projection direction, the imaging apparatus (XI) configured for phase-contrast and/or dark-field imaging. A phase-contrast and/or dark-field image generator (IGEN) applies an image generation algorithm to compute a first image based on the series the projection images (π). A motion artifact detector (MD) detects a motion artifact in the first image. A combiner (Σ) combines, if a motion artifact is so detected, a part of the first image with a part of at least one auxiliary image to obtain a combined image. The auxiliary image was previously computed by a gated application of the image generation algorithm in respect of a subset of the series of the projection images (π). The combined image may be output at an output interface (OUT) as a motion artifact reduced image.

9. 发明公开

EP3612095A1 BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING 有权转让
公开(公告)号：EP3612095A1
公开(公告)日：2020-02-26
申请号：EP18719504.5
申请日：2018-04-17
申请人： Koninklijke Philips N.V.
发明人： YAROSHENKO, Andriy , MAACK, Hanns-Ingo , KOEHLER, Thomas , DE MARCO, Fabio , GROMANN, Lukas, Benedict , WILLER, Konstantin , NOEL, Peter
IPC分类号： A61B6/00 , G01V5/00

10. 发明公开

EP3600043A1 SENSITIVITY OPTIMIZED PATIENT POSITIONING SYSTEM FOR DARK-FIELD X-RAY IMAGING 审中-公开
公开(公告)号：EP3600043A1
公开(公告)日：2020-02-05
申请号：EP18711236.2
申请日：2018-02-27
申请人： Koninklijke Philips N.V.
发明人： KOEHLER, Thomas , YAROSHENKO, Andriy
IPC分类号： A61B6/00 , A61B6/08

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