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    • 6. 发明公开
    • SHEET-LIKE PROBE, PROCESS FOR PRODUCING THE SAME AND ITS APPLICATION
    • 伊斯坦布尔的“魔兽世界”,“ZH IHRER HERSTELLUNG”,“IHRER ANWENDUNG”
    • EP1624309A4
    • 2006-05-31
    • EP04732418
    • 2004-05-12
    • JSR CORP
    • INOUE KAZUOSATO KATSUMI
    • G01R1/073G01R3/00
    • G01R1/0735G01R3/00
    • A sheet-like probe in which positional deviation between an electrode structure and an electrode under test due to temperature variation can be prevented surely in burn-in test even when a large area wafer having a diameter of 8 inch or larger or a circuit device where the electrode under test has an extremely small pitch is inspected, and thereby good electrical connection can be sustained stably. Its production process and application are also provided. In the sheet-like probe, a plurality of electrode structures, having surface electrode parts exposed to the surface and rear surface electrode parts exposed to the rear surface while being arranged according to a pattern corresponding to the electrodes being connected, comprise a contact film held by an insulating film of soft resin and a frame plate supporting that contact film.
    • 本文公开了一种片状探针,即使当检查对象是8英寸以上的大面积的晶片时,能够防止在老化试验中的温度变化来检查电极结构和电极之间的位置偏移的片状探针 直径或电路器件,其检查的电极的间距极小,因此能够稳定地保持良好的电连接状态及其制造方法和应用。 本发明的片状探针包括通过保持根据与要连接的各个电极相对应的图案布置的多个电极结构而获得的接触膜,并且具有暴露于前表面和背面的前表面电极部分 通过由柔性树脂构成的绝缘膜暴露于背面的表面电极部分和支撑接触膜的框架板。
    • 9. 发明公开
    • ANISOTROPIC CONDUCTIVE SHEET
    • ANISOTROPISCHELEITFÄHIGEFOLIE
    • EP1315241A4
    • 2008-03-19
    • EP01956808
    • 2001-08-08
    • JSR CORP
    • IGARASHI HISAOINOUE KAZUOSETAKA RYOJI
    • H01B1/20H01R13/24H01R11/01H01B5/16H01B13/00
    • H01R13/2414H01B1/20Y10T428/254Y10T428/2991Y10T428/2998Y10T428/32
    • An anisotropic conductive sheet which can retain electric charge on the surface thereof under no pressurization, and move the charge on the surface in a thickness direction under a thickness-direction pressurization to thereby control charge amounts on the surface, and which comprises magnetic, conductive particles (P) contained in an elastomer-made sheet substrate (10) so as to be aligned in the thickness direction thereof and dispersed in the surface direction thereof, wherein a volume resistance R1 is 1 x 10 to 1 x 10 OMEGA .m and a ratio (R0/R1) of volume resistance R0 to volume resistance R1 is 1 x 10 to 1 x 10 , where R0 is a thickness-direction volume resistance under no pressurization, and R1 thickness-direction volume resistance under a thickness-direction pressure of 1 g/mm .
    • 本发明提供一种各向异性导电片,其能够在不加压的情况下在其表面上保持电荷,并且使厚度方向上的表面上的电荷在厚度方向加压下移动,从而控制表面上的电荷量,并且其包括磁性导电颗粒 (P)包含在弹性体制成的片基板(10)中,以沿其厚度方向排列并在其表面方向上分散,其中体积电阻R1为1×10 7至1×10 12 > OMEGA·m,并且体积电阻R0与体积电阻R1之比(R0 / R1)为1×10 1至1×10 4,其中R 0为不加压时的厚度方向体积电阻,R1 在厚度方向压力下的厚度方向体积电阻为1g / mm 2。
    • 10. 发明公开
    • ANISOTROPIC CONDUCTIVE CONNECTOR, ITS MANUFACTURE METHOD AND PROBE MEMBER
    • “各向异性导电连接器,及其制造方法探头LINK”
    • EP1365479A4
    • 2007-12-26
    • EP02711328
    • 2002-02-06
    • JSR CORP
    • KOKUBO TERUKAZUSENO KOJINAOI MASAYAINOUE KAZUO
    • H01R11/01G01R1/06G01R1/073G01R31/26H01L21/66H01R13/24H01R43/00H01B5/16
    • H01R13/2414H01R43/007
    • Disclosed are an anisotropic conductive connector which can be easily aligned, held and fixed with respect to a wafer to be tested, even if the wafer has a large area and even if electrodes to be tested are arranged at small pitches and in which a satisfactory conductivity can be acquired for all conductive portions, and insulation from the adjoining conductive portions is set up; a method for manufacturing the connector; and a probe member. This anisotropic conductive connector comprises a frame plate having a plurality of holes for disposing anisotropic conductive films so formed as to correspond to the electrode regions of the wafer to be tested and a plurality of elastic anisotropic conductive films arranged in the respective anisotropic conductive film arranging holes and supported by the peripheral portions of the holes. Each of the elastic anisotropic conductive films includes a functional part having a plurality of conductive portions so arranged to correspond to the electrodes to be tested, extending in the direction of the thickness, and containing conductive particles exhibiting magnetism, and an insulating portion for insulating the conductive portions from one another and a supported part formed integrally with the periphery of the functional part and fixed to the peripheral portions of the anisotropic conductive film arranging holes . The supported portion contains conductive particles exhibiting the magnetism.