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    • 1. 发明公开
    • Ionisation method for a universal gas analyzer
    • Ionisierungsverfahrenfürein Universalgasanalysegertt
    • EP2421024A1
    • 2012-02-22
    • EP10173224.6
    • 2010-08-18
    • Ionicon Analytik Gesellschaft m.b.h.
    • Sulzer, PhillippJordan, AlfonsHartungen, EugenMärk, Tilmann
    • H01J49/14
    • G01N27/62H01J49/145Y10T436/24
    • The invention provides a method and system for analyzing a gas for the presence of a reactant compound via reaction of primary ions of a specific type. A source gas is introduced to a reaction chamber and ionized in this chamber. The pressure in the reaction chamber is adjusted to avoid the formation of protonated species and other impurities. The primary ions generated in the reaction chamber are transferred to a drift tube. The gas to be analyzed is diluted with a carrier gas and the resulting mixture is introduced into the drift tube. The ionization energy of the carrier gas is equal to or higher than the ionization energy of the primary ions. The product ions resulting in the drift tube from a reaction of the primary ions with the reactant present in the gas to be analyzed are then detected, for example using a mass spectrometer. Preferably, an existing PTR-MS setup is used to perform the method of the present invention.
    • 本发明提供了一种用于通过特定类型的初级离子的反应分析气体存在反应物化合物的方法和系统。 将源气体引入反应室并在该室中离子化。 调整反应室中的压力以避免质子化物质和其它杂质的形成。 在反应室中产生的主要离子被转移到漂移管中。 待分析的气体用载气稀释,并将所得混合物引入漂移管中。 载气的电离能等于或高于初级离子的电离能。 然后,例如使用质谱仪来检测产生离子的原子离子与待分析气体中存在的反应物的反应产生的漂移管。 优选地,使用现有的PTR-MS设置来执行本发明的方法。