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1. 发明公开

EP4016191A1 A DEVICE AND A METHOD FOR IMAGING OF MICROSCOPIC OBJECTS 审中-实审
公开(公告)号：EP4016191A1
公开(公告)日：2022-06-22
申请号：EP20215954.7
申请日：2020-12-21
申请人： Imec VZW
发明人： LIN, Ziduo , JAYAPALA, Murali , VANMEERBEECK, Geert , YURT, Abdulkadir
IPC分类号： G03H1/04
摘要： According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:
an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm;
at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object;
wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light;
the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.

2. 发明公开

EP3382467A1 A DEVICE, A SYSTEM AND A METHOD IN HOLOGRAPHIC IMAGING 审中-实审
公开(公告)号：EP3382467A1
公开(公告)日：2018-10-03
申请号：EP18163359.5
申请日：2018-03-22
申请人： IMEC vzw
发明人： LIN, Ziduo , STAHL, Richard , YURT, Abdulkadir
IPC分类号： G03H1/02 , G03H1/04
CPC分类号： G03H1/02 , G02B27/0977 , G02B27/22 , G03H1/0244 , G03H1/0443 , G03H1/0465 , G03H2001/0212 , G03H2001/0447 , G03H2001/045 , G03H2001/0454 , G03H2001/2655 , G03H2001/266 , G03H2222/13 , G03H2222/34 , G03H2222/35 , G03H2223/23 , G03H2226/11
摘要： A device in, and system for, holographic imaging comprising: at least two light sources (102, 104, 106; 202, 204; 302, 304; 402, 404), wherein each of the at least two light sources is arranged to output light of a unique wavelength; and at least one holographic optical element (110; 208; 308; 410, 412, 414), wherein the at least two light sources and the at least one holographic optical element are arranged in relation to each other such that light from the at least two light sources incident on the at least one holographic optical element is diffractively diverted by the at least one holographic optical element to form wavefronts of similar and registered shape onto an image sensor (114, 210, 312).

3. 发明公开

EP3339963A1 AN APPARATUS AND A METHOD FOR IN-LINE HOLOGRAPHIC IMAGING 有权
公开(公告)号：EP3339963A1
公开(公告)日：2018-06-27
申请号：EP16205862.2
申请日：2016-12-21
申请人： IMEC vzw
发明人： YURT, Abdulkadir , VANMEERBEECK, Geert , STAHL, Richard , LIN, Ziduo
IPC分类号： G03H1/00 , G03H1/04
摘要： An apparatus for in-line holographic imaging is provided. The apparatus (100) comprises at least a first light source (102) and a second light source (104) arranged for illuminating an object (108) arranged in the apparatus (100) with a light beam; an image sensor (110) being arranged to detect at least a first and a second interference pattern, wherein the first interference pattern is formed when the object (108) is illuminated by the first light source (102) and the second interference pattern is formed when the object (108) is illuminated by the second light source (104), wherein the first and second interference patterns are formed by diffracted light, being scattered by the object (108), and undiffracted light of the light beam; wherein the at least first and second light sources (102, 104) are arranged at different angles in relation to the object (108), and possibly illuminate the object (108) using different wavelengths.

4. 发明公开

EP4016190A1 MULTI-SPECTRAL MICROSCOPIC IMAGING SPANNING THE VISIBLE AND SHORT-WAVE INFRARED RANGE 审中-实审
公开(公告)号：EP4016190A1
公开(公告)日：2022-06-22
申请号：EP20215951.3
申请日：2020-12-21
申请人： Imec VZW
发明人： VANMEERBEECK, Geert , LIN, Ziduo , JAYAPALA, Murali , YURT, Abdulkadir
IPC分类号： G03H1/04 , G01N21/00
摘要： According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:
an array of light sensitive areas, each being sensitive to detect light spanning a wavelength range of at least 400-1200 nm;
at least one light source configured to generate light at a plurality of wavelengths within the wavelength range, comprising at least one wavelength in a visible part of the wavelength range and at least one wavelength in a short-wave infrared, SWIR, part of the wavelength range, and arranged to illuminate the microscopic object with the generated light such that at least part of the light is scattered by the microscopic object;
wherein the device is configured to transmit the scattered light and non-scattered light, from the same light source, to the array of light sensitive areas configured to detect an interference pattern formed between the scattered light and the non-scattered light, for each wavelength.

5. 发明公开

EP3839636A1 A DEVICE FOR DETECTING PARTICLES IN AIR 有权
公开(公告)号：EP3839636A1
公开(公告)日：2021-06-23
申请号：EP19218700.3
申请日：2019-12-20
申请人： Imec VZW
发明人： STAHL, Richard , YURT, Abdulkadir , LIN, Ziduo , VANMEERBEECK, Geert , LAMBRECHTS, Andy
IPC分类号： G03H1/04 , G01N15/14 , G06K9/00
摘要： A device (1) for detecting particles (2) in air; said device (1) comprising:
a flow channel (30), wherein the flow channel (30) is configured to allow a flow of air (12) comprising particles (2) through the flow channel (30);
a light source (40) configured to illuminate the particles (2) in the flow of air (12), such that an interference pattern is formed by interference between light being scattered by the particles (2) and non-scattered light from the light source (40);
an image sensor (50) configured to detect incident light, the image sensor (50) being configured to detect the interference pattern, and wherein the image sensor (50) is configured to acquire a time-sequence of image frames, each image frame comprising a plurality of pixels, each pixel representing a detected intensity of light; and
a frame processor (70) configured to filter information in the time-sequence of image frames, wherein said filtering comprises:
identifying pixels of interest in the time-sequence of image frames, said pixels of interest picturing an interference pattern potentially representing a particle (2) in the flow of air (12), and
outputting said identified pixels of interest for performing digital holographic reconstruction on the identified pixels of interest.

6. 发明授权

EP3339963B1 AN APPARATUS AND A METHOD FOR IN-LINE HOLOGRAPHIC IMAGING 有权
公开(公告)号：EP3339963B1
公开(公告)日：2020-08-12
申请号：EP16205862.2
申请日：2016-12-21
申请人： IMEC vzw
发明人： YURT, Abdulkadir , VANMEERBEECK, Geert , STAHL, Richard , LIN, Ziduo
IPC分类号： G03H1/00 , G03H1/04

7. 发明公开

EP3552060A1 A METHOD AND AN IMAGING SYSTEM FOR HOLOGRAPHIC IMAGING 审中-公开
公开(公告)号：EP3552060A1
公开(公告)日：2019-10-16
申请号：EP17825408.2
申请日：2017-12-08
申请人： IMEC VZW
发明人： LIN, Ziduo , YURT, Abdulkadir , STAHL, Richard , VANMEERBEECK, Geert
IPC分类号： G03H1/04 , G03H1/00 , G03H1/02

8. 发明公开

EP3839479A1 A DEVICE FOR DETECTING PARTICLES IN AIR 有权转让
公开(公告)号：EP3839479A1
公开(公告)日：2021-06-23
申请号：EP19218692.2
申请日：2019-12-20
申请人： Imec VZW
发明人： VANMEERBEECK, Geert , LIN, Ziduo , YURT, Abdulkadir , STAHL, Richard , LAMBRECHTS, Andy
IPC分类号： G01N15/06 , G01N1/22 , G01N1/40 , G03H1/04
摘要： A device (1) for detecting particles in air; said device (1) comprising:
a receiver (10) for receiving a flow of air (12) comprising particles (2);
a particle capturing arrangement (20) configured to transfer the particles (2) from the flow of air (12) to a liquid for collection of a set of particles (2) in the liquid;
a flow channel (30) configured to pass a flow of the liquid comprising the set of particles (2) through the flow channel;
a light source (40) configured to illuminate the set of particles (2) in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles (2) and non-scattered light from the light source; and
an image sensor (50) comprising a plurality of photo-sensitive elements (52) configured to detect incident light, the image sensor (50) being configured to detect the interference pattern.

9. 发明公开

EP3839474A1 A COLLECTOR FOR COLLECTING PARTICLES IN AIR AND A DEVICE FOR DETECTING PARTICLES IN AIR 审中-实审
公开(公告)号：EP3839474A1
公开(公告)日：2021-06-23
申请号：EP19218696.3
申请日：2019-12-20
申请人： Imec VZW
发明人： LIN, Ziduo , YURT, Abdulkadir , STAHL, Richard , VANMEERBEECK, Geert , LAMBRECHTS, Andy
IPC分类号： G01N1/22 , G01N15/02 , G01N15/06 , G01N15/14 , G01N1/28
摘要： A collector (60, 90, 100) for collecting particles (2) in air, said collector (60, 90, 100) comprising:
a substrate (61), which is adapted to enable imaging of the particles (2);
an adhesive layer (65) arranged on a collector side (62) of the substrate (61), said adhesive layer (65) being formed by an adhesive material;
a protection element (67), which is configured to protect the adhesive layer (65) before collection of particles (2);
wherein the collector (60, 90, 100) is configured to allow release of protection of the adhesive layer (65) by the protection element (67) to expose an adhesive surface (66) of the adhesive layer (65) to ambient air for collecting particles (2) on the adhesive surface (66); and
wherein the collector (60, 90, 100) is further configured for presenting a particle sample carrier (70) having a smooth top surface (68) and a smooth bottom surface (69) for preventing light from being diffusely scattered by the particle sample carrier (70).

10. 发明公开

EP3839478A1 A DEVICE FOR DETECTING PARTICLES IN AIR 有权转让
公开(公告)号：EP3839478A1
公开(公告)日：2021-06-23
申请号：EP19218689.8
申请日：2019-12-20
申请人： Imec VZW
发明人： VANMEERBEECK, Geert , LIN, Ziduo , YURT, Abdulkadir , STAHL, Richard
IPC分类号： G01N15/06 , G01N35/10 , G01N15/00 , G01N15/14 , G01N1/22
摘要： The inventive concept relates to a device for detecting particles in air, said device comprising a receiver for receiving a flow of air comprising particles, a sample carrier, and a particle capturing arrangement. The particle capturing arrangement is configured to separate the particles from the flow of air for and to collect a set of particles on a surface of the sample carrier. The device further comprises a light source configured to illuminate the particles on the sample carrier, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source. The device further comprises an image sensor configured to detect the interference pattern. The device further comprises a cleaner configured for cleaning the surface of the sample carrier for enabling re-use of the surface for collection of a subsequent set of particles.

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