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1. 发明授权

EP1887356B1 Automatic analyzer 有权转让
公开(公告)号：EP1887356B1
公开(公告)日：2018-03-21
申请号：EP07015277.2
申请日：2007-08-03
申请人： Hitachi High-Technologies Corporation
发明人： Yagi, Kenichi , Noda, Takayuki , Takahashi, Kenichi , Teshigawara, Kenji , Suzuki, Atsushi
IPC分类号： G01N35/00 , G01N35/02
CPC分类号： G01N35/00603 , G01N35/02 , Y10T436/113332
摘要： The present invention provides an automatic analysis system that is capable of quickly performing reinspection The automatic analysis system comprises: a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and control means for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.

2. 发明公开

EP1887356A3 Automatic analyzer 有权转让
标题翻译：自动分析仪
公开(公告)号：EP1887356A3
公开(公告)日：2010-02-24
申请号：EP07015277.2
申请日：2007-08-03
申请人： Hitachi High-Technologies Corporation
发明人： Yagi, Kenichi , Noda, Takayuki , Takahashi, Kenichi , Teshigawara, Kenji , Suzuki, Atsushi
IPC分类号： G01N33/493 , G01N35/02
CPC分类号： G01N35/00603 , G01N35/02 , Y10T436/113332
摘要： The present invention provides an automatic analysis system that is capable of quickly performing reinspection The automatic analysis system comprises: a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and control means for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.
摘要翻译：本发明提供能够快速进行再检查的自动分析系统。自动分析系统包括：样本架，其容纳含有样本的样本容器; 样架输入单元，其中输入样架; 承载样架的承载线; 沿载体线布置的多个自动分析器; 样架保持单元，其保持存储分析样本的样架; 样本架收集单元，其收集存储分析样本的样本架; 用于根据分析结果返回含有经过复验的样品的样品架的复验用载体线; 以及控制单元，其使来自样品架保持单元的样架通过载运线返回以进行再检测，并且控制与先前进行过分析的自动分析器中的任一个不同的自动分析器以执行样品的再分析。

3. 发明公开

EP1887356A2 Automatic analyzer 有权转让
标题翻译：自动分析仪
公开(公告)号：EP1887356A2
公开(公告)日：2008-02-13
申请号：EP07015277.2
申请日：2007-08-03
申请人： Hitachi High-Technologies Corporation
发明人： Yagi, Kenichi , Noda, Takayuki , Takahashi, Kenichi , Teshigawara, Kenji , Suzuki, Atsushi
IPC分类号： G01N33/493 , G01N35/02
CPC分类号： G01N35/00603 , G01N35/02 , Y10T436/113332
摘要： The present invention provides an automatic analysis system that is capable of quickly performing reinspection The automatic analysis system comprises: a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and control means for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.
摘要翻译：本发明提供一种能够快速进行再检测的自动分析系统。该自动分析系统包括：样品架，其容纳包含样品的样品容器; 样品架输入单元，其中输入样架; 承载样品架的载体线; 沿着载体线布置的多个自动分析器; 样品架保持单元，其容纳存储分析样品的样品架; 样品架收集单元，其收集存储分析样品的样品架; 用于重新检查的载体线，其根据分析结果返回包含经受再检测的样品的样品架; 以及控制装置，用于使样架从样品架保持单元通过载体线进行再次检测，并控制与以前进行分析的自动分析仪不同的一个自动分析仪，以进行样品的再分析。

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