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    • 2. 发明公开
    • POLISHING COMPOSITION
    • POLIERZUSAMMENSETZUNG
    • EP2628567A4
    • 2017-05-24
    • EP11832479
    • 2011-10-06
    • FUJIMI INC
    • ASHITAKA KEIJIMORINAGA HITOSHIYASUI AKIHITO
    • B24B37/00C09G1/02C09K3/14H01L21/304H01L21/3105
    • C09K3/1409C09G1/02C09K3/1463H01L21/31053
    • A polishing composition contains colloidal silica particles having protrusions on the surfaces thereof. The average of values respectively obtained by dividing the height of a protrusion on the surface of each particle belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles by the width of a base portion of the same protrusion is no less than 0.245. Preferably, the part of the colloidal silica particles that has larger particle diameter than the volume average particle diameter of the colloidal silica particles has an average aspect ratio of no less than 1.15. Preferably, the protrusions on the surfaces of particles belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles have an average height of no less than 3.5 nm.
    • 抛光组合物包含在其表面上具有突起的胶体二氧化硅颗粒。 将属于胶体二氧化硅粒子的粒径大于胶体二氧化硅粒子的体积平均粒径的部分的粒子表面的突起的高度除以基体的宽度而得到的值的平均值 相同突起的部分不小于0.245。 优选地,具有比胶态二氧化硅颗粒的体积平均粒径更大的粒径的胶态二氧化硅颗粒的部分具有不小于1.15的平均长宽比。 优选地,属于胶体二氧化硅颗粒的粒径大于胶体二氧化硅颗粒的体积平均粒径的部分的颗粒表面上的突起的平均高度不小于3.5nm。