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1. 发明公开

EP2335029A1 OPTISCHE POSITIONSMESSEINRICHTUNG 有权
公开(公告)号：EP2335029A1
公开(公告)日：2011-06-22
申请号：EP09781180.6
申请日：2009-07-28
申请人： Dr. Johannes Heidenhain GmbH
发明人： HOLZAPFEL, Wolfgang , LINGK, Christoph , VOGT, Gerhard
IPC分类号： G01D5/347
CPC分类号： G01D5/3473 , G01D5/34715 , G01D5/34746
摘要： The invention relates to an optical position measuring device which is used to determine the relative position of a sampling unit and a material measure which can be displaced at least in one measuring direction and which is arranged on the material measure plane. Said material measure extends along a first straight line or a curved line. Said sampling unit comprises a light source and a detector arrangement which extends along a second line and which is arranged on a detection plane, said curve being different from the first straight line or the first curved line. A stripe pattern resulting in the sampling of the material measure transforms into a stripe pattern extending along the second line. The material measure plane and the detection plane are not parallel to each other for transformation.
摘要翻译：本发明涉及一种光学位置测量装置，其用于确定采样单元的相对位置和至少可以在一个测量方向上移位并且布置在材料测量平面上的材料测量。所述材料测量沿第一直线或曲线延伸。所述采样单元包括光源和检测器装置，其沿着第二线延伸并且布置在检测平面上，所述曲线不同于第一直线或第一曲线。导致材料测量的采样的条纹图案变成沿着第二行延伸的条纹图案。材料测量平面和检测平面彼此不平行以进行变换。

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