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    • 2. 发明公开
    • APPARATUS AND METHOD FOR MEASURING POLARIZATION DEPENDENT LOSS USING REPEATED HIGH SPEED POLARIZATION SCRAMBLING
    • 使用重复的高速极化扰乱来测量极化相关损耗的装置和方法
    • EP1368678A1
    • 2003-12-10
    • EP02700829.1
    • 2002-02-07
    • Donam Systems Inc.
    • KOH, Yeon-WanLEE, Bong-WanKIM, Jung-Won
    • G02B5/30
    • G01M11/337G02B6/105
    • Disclosed is an apparatus and method for measuring a changing amount of insertion loss of an optical device depending on a polarization state of an incident light, i.e., a polarization-dependent loss. An incident light that is periodically subject to all polarization states passes through a testing optical device by a polarization scrambler including a piezoelectric element type optical fiber birefringence modulator, and an optical detector measures intensity of the passing light, in which the measured intensity values are averaged for birefringence modulation having a constant period, and then the polarization-dependent loss is computed from a ratio of maximum power to minimum power for the period. Use of the birefringence modulator shortens measuring time, and decreases an affect of external disturbance to the incident light that is incident into the testing optical component or occurrence probability of the external disturbance, so that the polarization-dependent loss can be precisely measured.
    • 公开了一种用于根据入射光的偏振状态,即偏振相关损耗来测量光学器件的插入损耗的改变量的设备和方法。 周期性地经受所有偏振态的入射光通过包括压电元件型光纤双折射调制器的偏振扰偏器穿过测试光学装置,并且光​​学检测器测量通过光的强度,其中测量的强度值被平均化 对于具有恒定周期的双折射调制,然后根据该周期的最大功率与最小功率的比率来计算偏振相关损耗。 使用双折射调制器缩短了测量时间,并降低了外部干扰对入射到测试光学部件中的入射光的影响或外部干扰的发生概率,从而可以精确测量偏振相关损耗。