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1. 发明公开

EP2796917A1 A method for automated platform and/or reference object independent acquisition of positional information and localization of objects of interest in a microscope 审中-公开
标题翻译：一种用于自动平台和/或参考的方法对象的位置信息和感兴趣的对象的定位独立检测在显微镜
公开(公告)号：EP2796917A1
公开(公告)日：2014-10-29
申请号：EP13002262.7
申请日：2013-04-26
申请人： Baden-Württemberg Stiftung gGmbH
发明人： Erfle, Holger , Gunkel, Manuel , Reymann, Jürgen
IPC分类号： G02B21/36
CPC分类号： G02B21/365
摘要： The present invention relates to microscopic methods and respective apparatuses and/or systems for automated platform and/or reference object independent localization of objects of interest as well as microscopic methods and respective apparatuses for automated platform and/or reference object independent acquisition of positional data of objects of interest.
According to an aspect, there is provided a method for obtaining positional data of at least one object of interest within a probe by using a microscope comprising determining the positions of at least two reference markings in at least one image obtained by the microscope; determining a reference coordinate system associated with said reference markings based on the determined positions of the reference markings and data concerning the position of a probe positioning device of the microscope and determining positional information of one or more objects of interest in the reference coordinate system. The positional information may used by another microscope to re-locate objects of interest.
According to another aspect, which is particularly applicable for highly accurate, fine adjustment of positional information and/or object location, a method for obtaining positional information and/or object location is proposed, which relies on detecting specific target objects and/or regions and/or patterns within the image of the probe and using the detected target objects and/or regions and/or patterns for correcting positional data of objects of interest (hits). This method may be combined with any of the above described methods according to aspects of the invention.
摘要翻译：本发明涉及一种用于自动平台和/或感兴趣的对象的参考对象独立定位显微镜的方法和相应的设备和/或系统，以及显微方法和用于自动化平台和/或参考对象独立获取的位置数据的各装置感兴趣的对象。。根据上方面，提供了一种用于通过使用显微镜，包括确定性采矿获取的样品中的感兴趣的至少一个对象的位置数据的方法在由显微镜获得的至少一个图像的至少两个参考标记的位置; 确定性采矿参考坐标与基于基准标记和数据关于显微镜和在参考感兴趣的一个或多个对象的确定性采矿位置信息的样品定位装置的坐标系的位置的确定性开采位置，所述参考标记相关联的系统，该位置信息可以由另一个显微镜重新定位的感兴趣的对象。。根据另一个方面，所有这些是特别适用于的位置信息和/或对象的位置高精确度，精细调节，用于获得位置信息和/或对象位置的方法，提出了在检测到特定的目标物体和/或区域和其依赖 /或样本的图像内，并使用检测到的目标物体和/或区域和/或图案，用于校正的兴趣（匹配）的对象的位置数据的模式。该方法可以与任何上述方法雅丁到本发明的方面进行组合。

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