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    • 2. 发明公开
    • Integrated optoelectronic system
    • 光学系统
    • EP1674856A1
    • 2006-06-28
    • EP05257862.2
    • 2005-12-20
    • Agilent Technologies, Inc.
    • Fouquet, JulieHardcastle, IanHelbing, ReneGrot, Annette C.Petrilla, John
    • G01N21/64
    • G01N21/6408
    • An optoelectronic system for measuring fluorescence or luminescence emission decay, includes (a) a light source (104) being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit (102) comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode (108) detecting the emission; (d) a second integrated circuit comprising a detection analysis system (110) determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure (126) enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.
    • 一种用于测量荧光或发光衰减的光电子系统,包括:(a)作为发光二极管的光源(104),半导体激光器或闪光管; (b)第一集成电路(102),包括至少一个电路,使得所述光源向所述样品发射光脉冲,从而导致来自所述样品的荧光或发光发射; (c)检测发光的光电二极管(108); (d)第二集成电路,包括检测分析系统(110),通过分析检测到的发射的衰减来确定关于样品的信息; 和(e)封闭光源的外壳(126),第一集成电路,第二集成电路和光电二极管。