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    • 1. 发明公开
    • Method for lattice matched growth of semiconductor layers
    • Verfahren zum gitterangepassten Aufwachsen von Halbleiterschichten
    • EP0689230A2
    • 1995-12-27
    • EP95304091.2
    • 1995-06-14
    • AT&T Corp.
    • Cunningham, John EdwardPathak, Rajiv NathGoossen, Keith Wayne
    • H01L21/20G02F1/015
    • G02F1/017B82Y20/00G02B2006/12142G02F2001/01766G02F2202/102G02F2203/02H01L21/02392H01L21/02461H01L21/02463H01L21/02507H01L21/02543H01L21/02546Y10S438/938
    • An in-situ method is disclosed for highly accurate lattice matching using reflection high energy electron diffraction dynamics. The method includes the steps of providing a substrate of a first semiconductor material and initiating growth of a second semiconductor material thereon. The oscillation amplitude of intensity I of waveform cycles is monitored using reflection high energy electron diffraction. A maximum intensity I + and a minimum intensity I - is determined over a predetermined number of waveform cycles. The intensity drop ΔI from initial reflectivity to minimum reflectivity of the waveform cycles is determined and a normalized figure of merit FM is calculated for the predetermined number of waveform cycles using the relationship: FM = Σ(I + - I - ) ΔI
      The fluxes of the second semiconductor material are then adjusted to maximize FM and optimize lattice matching.
      A multiple quantum well light modulator is also provided including a semiconductor substrate of InP, a multiple quantum well region, disposed above the InP substrate, composed of InGaAs and having a thickness of about 4 µm. The modulator is characterized by a lattice mismatch of less than 2 x 10 -4 .
    • 公开了一种使用反射高能电子衍射动力学进行高精度晶格匹配的现场方法。 该方法包括以下步骤:提供第一半导体材料的衬底并且在其上起始第二半导体材料的生长。 使用反射高能电子衍射监测波形周期的强度I的振荡幅度。 在预定数量的波形周期内确定最大强度I +和最小强度I 1。 确定从初始反射率到波形周期的最小反射率的强度降DELTA I,并且使用以下关系计算预定数量的波形周期的归一化品质因数FM:然后调整第二半导体材料的通量 以最大化FM并优化晶格匹配。 还提供了一种多量子阱光调制器,其包括设置在InP衬底上方的InGaAs并具有约4μm厚度的InP的多个量子阱区的半导体衬底。 调制器的特征在于小于2×10 -4的晶格失配。