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1. 发明公开

EP1279958A1 METHOD OF TREATING METAL ANALYSIS SAMPLE AND DEVICE THEREOF 审中-公开
标题翻译：方法处理金属分析的测试及其装置
公开(公告)号：EP1279958A1
公开(公告)日：2003-01-29
申请号：EP01974788.0
申请日：2001-10-11
申请人： Kawasaki Steel Corporation , Japan Analyst Corporation , Ulvac-PHI Incorporated , Iwai, Hideo , Abiko, Kenji
发明人： ABIKO, Kenji , YASUHARA, Hisao, c/o Kawasaki Steel Corporation , NIIDA, Takashi, c/o Japan Analyst Corporation , SHIMURA, Makoto, c/o Kawasaki Steel Corporation
IPC分类号： G01N33/20
CPC分类号： G01N1/32 , G01N33/20
摘要： The present invention provides a pre-treatment apparatus for an analytical metal sample, the apparatus including (1) a treatment chamber having a sample charging port which can be opened and closed and provided at the top of the chamber, a sample discharging port which can be opened and closed and provided at the bottom of the chamber, and a gas inlet and gas outlet, (2) a sample carrying bar joined to a sample holder also used as a sputtering electrode, and provided to pass through at least one side wall of the treatment chamber so as to be substantially horizontally movable and axially rotatable, and (3) a sputtering counter electrode at least having portions arranged opposite to each other in a region not inhibiting the charge and discharge of an analytical metal sample so that the sample holder can be arranged in the counter electrode. The present invention also provides a pre-treatment method capable of simply cleaning the surface of the analytical metal sample by using the pre-treatment apparatus and preventing re-contamination of the cleaned sample by exposure to the air or the like. Furthermore, the present invention provides an analysis apparatus provided with the pre-treatment apparatus to permit high-accuracy quantitative determination of trace elements of metals.

2. 发明公开

EP1279958A4 METHOD OF TREATING METAL ANALYSIS SAMPLE AND DEVICE THEREOF 审中-公开
标题翻译： VERFAHREN ZUR BEHANDLUNG EINER METALLANALYSEPROBE UND EINRICHTUNGHIERFÜR
公开(公告)号：EP1279958A4
公开(公告)日：2005-02-23
申请号：EP01974788
申请日：2001-10-11
申请人： JFE STEEL CORP , JAPAN ANALYST CORP , ULVAC PHI INC , IWAI HIDEO , ABIKO KENJI
发明人： ABIKO KENJI , YASUHARA HISAO , NIIDA TAKASHI , SHIMURA MAKOTO
IPC分类号： G01N1/32 , G01N33/20 , G01N1/34
CPC分类号： G01N1/32 , G01N33/20
摘要： A preliminary treating device for a metal analysis sample, comprising (1) a treating room having a closable sample charging inlet in the upper part thereof and a closable sample discharging outlet in the lower part thereof and provided with a gas inlet and a gas outlet, (2) a sample carrying rod joined to a sample receiver doubling as a sputtering-use one-sided electrode and installed to pass through at least one side wall of the treating room so as to be able to move horizontally and turn on the axis thereof, and (3) a sputtering-use counter electrodes installed at least facing each other in those regions in the treating room that do not obstruct the charging and discharging of a sample so as to be able to interpose the sample receiver between the counter poles. A preliminary treating method which uses this preliminary treating room, simply cleans the surface of a metal analysis sample by sputtering, and can prevent re-contamination of the cleaned sample by atmospheric exposure. An analysis device comprising this preliminary treating device to permit a high-accuracy quantification of trace elements in metal.
摘要翻译：本发明提供了一种用于分析金属样品的预处理装置，该装置包括（1）处理室，其具有可以打开和关闭并设置在室顶部的样品加料口，打开和关闭并设置在室的底部，以及气体入口和气体出口，（2）连接到样品保持器的样品携带杆，还用作溅射电极，并且设置成穿过至少一个侧壁以及（3）至少具有彼此相对布置的部分的溅射相对电极，所述溅射对电极在不抑制分析金属样品的充放电的区域中使样品支架可以布置在对电极中。本发明还提供了一种预处理方法，其能够通过使用预处理装置简单地清洁分析金属样品的表面，并防止通过暴露于空气等而对被清洁样品的再污染。此外，本发明提供一种具有预处理装置的分析装置，以允许金属微量元素的高精度定量测定。

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