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    • 3. 发明公开
    • Address-enabling system and method for memory modules
    • Adressaktivierungsanordnung und VerfahrenfürSpeichermodule。
    • EP0462786A2
    • 1991-12-27
    • EP91305482.1
    • 1991-06-18
    • DELL USA L.P.
    • Durkin, Michael D.Stewart, Greg. N.Holman, Thomas H. Jr.
    • G06F12/06
    • G06F12/0684Y02D10/13
    • A memory circuit for use in a data processing system which is acccessed by address signals and includes interconnection means for at least one memory module, which at least one memory module may or may not be present, and means for transmitting the address signals to the interconnection means if and only if the at least one memory module is present. One embodiment of the present invention includes a line interconnecting the output enable pin of an address buffer to a SIMM socket location which interconnects with a grounded PRES pin on a SIMM when it is installed in the socket. The line to the address buffer enable pin includes a pull-up resistor portion so that the address buffer is disabled unless a SIMM is connected to the socket.
    • 一种在数据处理系统中使用的存储器电路,其由地址信号处理,并且包括用于至少一个存储器模块的至少一个存储器模块的互连装置,所述至少一个存储器模块可以存在或可以不存在,以及用于将地址信号发送到互连 意味着当且仅当存在至少一个存储器模块时。 本发明的一个实施例包括将地址缓冲器的输出使能引脚互连到SIMM插座位置的线路,该SIMM插座位置在SIMM安装在插座中时与SIMM上的接地PRES引脚相互连接。 地址缓冲器使能引脚的行包括一个上拉电阻部分,以便禁止地址缓冲区,除非SIMM连接到插槽。
    • 5. 发明公开
    • A semiconductor integrated circuit
    • 半导体集成电路
    • EP0485238A3
    • 1993-04-21
    • EP91310373.5
    • 1991-11-11
    • DELL USA L.P.
    • Longwell, Michael L.Parks, Terry J.
    • G06F11/24
    • G01R31/30G01R31/31937G06F2201/88
    • An electronic circuit for the detection of required operational speed of one or more integrated circuit semiconductor chips is used in conjunction with an off-the-shelf integrated circuit tester. The tester provides timing, control and a display. Each of the integrated circuit semiconductor chips is provided with a ring oscillator circuit for generating a series of pulses, timed by the tester for a fixed period of time. A counter, formed in each of the semiconductor chips counts the number of pulses generated during the fixed period of time. A number, generated in the tester, indicative of a required speed of operation is set in a latch assembly that is formed in each of the semiconductor chips. A comparator, also formed in each of the semiconductor chips, compares the contents of the latch with the contents of the counter and if the contents of the counter is equal to or larger than the contents of the latch, the tested semiconductor chip is acceptable. A display in the tester indicates the result. If the speed of operation is very high, then the numher indicative of a required speed of operation is divided by, for example, two. The output of the oscillator is also divided by two so that the size of the counter and the latch is not exceeded.
    • 8. 发明公开
    • A semiconductor integrated circuit
    • 一种半导体集成电路
    • EP0485238A2
    • 1992-05-13
    • EP91310373.5
    • 1991-11-11
    • DELL USA L.P.
    • Longwell, Michael L.Parks, Terry J.
    • G06F11/24
    • G01R31/30G01R31/31937G06F2201/88
    • An electronic circuit for the detection of required operational speed of one or more integrated circuit semiconductor chips is used in conjunction with an off-the-shelf integrated circuit tester. The tester provides timing, control and a display. Each of the integrated circuit semiconductor chips is provided with a ring oscillator circuit for generating a series of pulses, timed by the tester for a fixed period of time. A counter, formed in each of the semiconductor chips counts the number of pulses generated during the fixed period of time. A number, generated in the tester, indicative of a required speed of operation is set in a latch assembly that is formed in each of the semiconductor chips. A comparator, also formed in each of the semiconductor chips, compares the contents of the latch with the contents of the counter and if the contents of the counter is equal to or larger than the contents of the latch, the tested semiconductor chip is acceptable. A display in the tester indicates the result. If the speed of operation is very high, then the numher indicative of a required speed of operation is divided by, for example, two. The output of the oscillator is also divided by two so that the size of the counter and the latch is not exceeded.
    • 用于检测一个或多个集成电路半导体芯片的所需操作速度的电子电路与现成的集成电路测试器结合使用。 测试仪提供时序,控制和显示。 每个集成电路半导体芯片都配备有用于产生一系列脉冲的环形振荡器电路,由测试器定时一段固定的时间。 形成在每个半导体芯片中的计数器计数在固定时间段内产生的脉冲的数量。 在测试器中产生的指示所需操作速度的数字被设置在形成在每个半导体芯片中的闩锁组件中。 也在每个半导体芯片中形成的比较器将锁存器的内容与计数器的内容进行比较,并且如果计数器的内容等于或大于锁存器的内容,则被测试的半导体芯片是可接受的。 测试仪中的显示屏显示结果。 如果操作速度非常高,则表示所需操作速度的数字除以例如2。 振荡器的输出也被二分频,因此计数器和锁存器的大小不会超出。