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热词
    • 8. 发明公开
    • Integrated monolithic circuit comprising a test bus
    • Integrierte整理Schutung mit einemPrüfbus。
    • EP0333241A2
    • 1989-09-20
    • EP89200312.0
    • 1989-02-10
    • Philips Electronics N.V.
    • Jongepier, Abraham
    • G01R31/28
    • G01R31/318536G01R31/318558G06F11/2736
    • For the testing of an integrated monolithic circuit (IC) it is proposed to provide the integrated monolithic circuit with a test bus (tb) which extends along a functional part (F1, F2, ...) of the circuit which is partitioned into macro circuits (M1, M2) and which is coupled to the macro circuits, each macro circuit comprising a test interface circuit (T1, T2, ...) which is connected in series with test interface circuits of the other macro circuits; via the test interface circuits, the macro circuits can be coupled to the test bus. As a result, macro circuits can be separately tested and in the case of a hierarchic design of integrated circuits, utilizing previously designed macro circuits and test programs for previously designed macro circuits, test development times can be substantially reduced, this is an increasingly important aspect of increasingly complex circuits.
    • 对于集成单片电路(IC)的测试,建议为集成的单片电路提供一个测试总线(tb),该测试总线沿着分为宏的电路的功能部分(F1,F2,...)延伸 电路(M1,M2),并且耦合到宏电路,每个宏电路包括与其它宏电路的测试接口电路串联连接的测试接口电路(T1,T2,...) 通过测试接口电路,宏电路可以耦合到测试总线。 因此,宏电路可以单独测试,并且在集成电路的分级设计的情况下,利用先前设计的宏观电路和测试程序用于以前设计的宏观电路,可以大大降低测试开发时间,这是越来越重要的一个方面 越来越复杂的电路。