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1. 发明公开

EP3327402A4 INSPECTION SYSTEM AND INSPECTION METHOD 有权
公开(公告)号：EP3327402A4
公开(公告)日：2018-05-30
申请号：EP16828022
申请日：2016-07-18
申请人： KOH YOUNG TECH INC
发明人： SEO SEUNG AE , AHN WON MI , LEE HYE IN , LEE JONG HUI
IPC分类号： G01B11/25 , G01B11/02 , G01B11/06 , G01N21/956 , G06T7/00 , G06T7/50 , G06T7/60 , H05K1/02 , H05K13/08
CPC分类号： G01B11/02 , G01B11/0608 , G01B11/25 , G01B11/2527 , G01N21/95684 , G01N2021/95615 , G01N2021/95646 , G06T7/00 , G06T7/0004 , G06T7/50 , G06T7/60 , G06T2207/30152 , H05K1/0269 , H05K3/3478 , H05K2203/163
摘要： Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

2. 发明公开

EP3306266A4 THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS 有权
公开(公告)号：EP3306266A4
公开(公告)日：2018-04-25
申请号：EP16807737
申请日：2016-06-03
申请人： KOH YOUNG TECH INC
发明人： JEON MOON YOUNG
IPC分类号： G01B11/25 , G01B11/245 , G01N21/956 , G06T7/521 , G06T7/593 , H04N13/254
CPC分类号： G01B11/2545 , G01B11/245 , G01N21/95684 , G01N2021/95638 , G06T7/521 , G06T7/593 , H04N13/0253
摘要： A three-dimensional shape measurement apparatus includes a plurality of main pattern illumination parts, a plurality of main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light that is illuminated from the main pattern illumination parts to the measurement target and obliquely reflected by the measurement target. The control part produces height data of the measurement target by using grating pattern images of the measurement target, or produces height data of the measurement target by using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target. Thus, a three-dimensional shape may be measured more easily and accurately.

3. 发明公开

EP3181085A4 TRACKING SYSTEM AND TRACKING METHOD USING SAME 有权
公开(公告)号：EP3181085A4
公开(公告)日：2018-04-04
申请号：EP15832127
申请日：2015-08-11
申请人： KOH YOUNG TECH INC , KYUNGPOOK NATIONAL UNIV INDUSTRY ACADEMIC COOPERATION FOUNDATION
发明人： LEE HYUN KI , OH HYUN MIN , KIM MIN YOUNG
IPC分类号： A61B34/20 , A61B90/00
CPC分类号： A61B34/20 , A61B90/39 , A61B2034/2048 , A61B2034/2055 , A61B2034/2057 , A61B2090/0818 , A61B2090/3983
摘要： A tracking system and a tracking method using the same are disclosed. The tracking system includes a marker, a camera unit, a first inertial measuring unit, a second inertial measuring unit and a tracking processing unit. The marker is fixed on the measurement object, and the camera unit outputs a marker image by photographing the marker. The first inertial measuring unit is fixed on the camera unit, and measures and outputs first inertia comprising first accelerated velocity and first angular velocity. The second inertial measuring unit is fixed to one of the measurement object and the marker, and measures and outputs second inertia comprising second accelerated velocity and second angular velocity. The tracking processing unit primarily extracts the position and the posture of the measurement object using the marker image, and secondarily extracts the position and the posture of the measurement object using the first and second inertias.

4. 发明公开

EP3151196A4 OPTICAL TRACKING SYSTEM, AND METHOD FOR CALCULATING POSTURE AND LOCATION OF MARKER PART IN OPTICAL TRACKING SYSTEM 有权
公开(公告)号：EP3151196A4
公开(公告)日：2017-11-22
申请号：EP15800560
申请日：2015-05-29
申请人： KOH YOUNG TECH INC , KYUNGPOOK NAT UNIV INDUSTRY-ACADEMIC COOP FOUND
发明人： LEE HYUN KI , CHAE YOU SEONG , KIM MIN YOUNG
IPC分类号： G06T7/20 , G06T7/70
CPC分类号： G06T7/246 , G06T7/20 , G06T7/70 , G06T7/73 , G06T7/80 , G06T2207/10056 , G06T2207/30204
摘要： An optical tracking system includes a marker part, an image forming part, and a processing part. The marker part includes a pattern having particular information and a first lens. First and second image forming parts include second and third lenses and first and second image forming units. The processing part determines the posture of the marker part from a first coordinate conversion formula between a coordinate on the pattern surface of a pattern and first pixel coordinate on a first image of the pattern, and a second coordinate conversion formula between a coordinate on the pattern surface of the pattern and second pixel coordinate on a second image of the pattern, the second coordinate conversion formula including the rotation conversion between the first pixel coordinate and the second pixel coordinate and tracks the marker part by using the posture of the marker part.

5. 发明公开

EP3223594A4 COMPONENT INSPECTION APPARATUS AND COMPONENT MOUNTING SYSTEM HAVING SAME 有权
公开(公告)号：EP3223594A4
公开(公告)日：2018-07-04
申请号：EP15860117
申请日：2015-11-20
申请人： KOH YOUNG TECH INC
发明人： KIM JEONG-YEOB
IPC分类号： H05K13/04 , B23K3/08 , B23K101/42 , H05K13/08
CPC分类号： H05K13/08 , B23K3/08 , B23K2201/42 , H05K13/04
摘要： A component mounting system and a method for inspecting mounted components are provided. A component mounting system according to an embodiment, comprises a solder inspection apparatus comparing coordinate information of the solder, which is obtained through measurement of a substrate to which solder is applied, with reference coordinate information to generate coordinate correction data; and a first mounting inspection apparatus comparing a first measurement data obtained by measuring mounting state of a component when the component is mounted based on the coordination correction data through a component mounting apparatus, with the coordinate correction data to verify whether a component is mounted on a position corrected based on the coordinate correction data. In this manner, by adding the verification function for the performance function of the component mounting apparatus to the inspection apparatus, it is possible to monitor the operation state of the component mounting apparatus in each process step.

6. 发明公开

EP3235460A4 OPTICAL TRACKING SYSTEM AND TRACKING METHOD FOR OPTICAL TRACKING SYSTEM 有权
公开(公告)号：EP3235460A4
公开(公告)日：2018-03-21
申请号：EP15870379
申请日：2015-12-18
申请人： KOH YOUNG TECH INC
发明人： KIM SANG YONG
IPC分类号： A61B34/20 , A61B90/00
CPC分类号： A61B34/00 , A61B34/20 , A61B2034/2055 , A61B2034/2065 , A61B2090/363 , A61B2090/364 , A61B2090/373 , A61B2090/3735 , A61B2090/3937 , A61B2090/3983
摘要： An optical tracking system includes a reference marker part stationarily disposed relative to a first region; a sticker marker part attached in a sticker form to a second region capable of being rigidly registered with the first region; a shape measurement part measuring three-dimensional shapes of the first region and the second region; a tracking sensor part sensing the reference marker part and the shape measurement part; and a processing part acquiring a first coordinate transformation relationship among the reference marker part, the tracking sensor part, the shape measurement part, and the first region of the patent and a second coordinate transformation relationship among the reference marker part, the tracking sensor part, the shape measurement part, and the second region of the patient and tracking the first region by extracting a third coordinate transformation relationship between the first region and the second region.

7. 发明公开

EP3195823A4 OPTICAL TRACKING SYSTEM AND COORDINATE MATCHING METHOD FOR OPTICAL TRACKING SYSTEM 有权
标题翻译：选择SPURFOLGEVERFAHREN UND KOORDINATENABSTIMMUNGSVERFAHRENFÜR选择SPURFOLGESYSTEM
公开(公告)号：EP3195823A4
公开(公告)日：2017-09-20
申请号：EP15843042
申请日：2015-09-18
申请人： KOH YOUNG TECH INC
发明人： LEE HYUN KI
IPC分类号： A61B34/00 , A61B34/20 , A61B90/00
CPC分类号： A61B5/06 , A61B34/20 , A61B90/36 , A61B2034/2046 , A61B2034/2055 , A61B2034/2057 , A61B2090/365 , A61B2090/373 , G01B11/002
摘要： An optical tracking system may comprise a reference marker unit stationarily disposed relative to a patient, a shape measurement unit configured to measure the three-dimensional shape of a specified part of the patient corresponding to a three-dimensional image, a tracking sensor unit configured to sense the reference marker unit and the shape measurement unit, and a processing unit. The processing unit may acquire a coordinate transformation relationship between the reference marker unit and the tracking sensor unit and a coordinate transformation relationship between the shape measurement unit and the tracking sensor unit based on a sensing result of the tracking sensor unit, acquire a coordinate transformation relationship between the specified part of the patient and the shape measurement unit based on a measurement result of the shape measurement unit, and define a coordinate system of the patient relative to the reference marker unit from the acquired coordinate transformation relationships.
摘要翻译：一种光学追踪系统可以包括：参考标记单元，相对于患者静止地设置;形状测量单元，被配置为测量与三维图像相对应的患者的特定部分的三维形状;跟踪传感器单元，被配置为感测参考标记单元和形状测量单元，以及处理单元。处理单元可以基于跟踪传感器单元的感测结果获取参考标记单元和跟踪传感器单元之间的坐标转换关系以及形状测量单元和跟踪传感器单元之间的坐标转换关系，获取坐标转换关系基于所述形状测量单元的测量结果，在所述患者的所述指定部位与所述形状测量单元之间，根据所获取的坐标转换关系来定义所述患者相对于所述基准标记单元的坐标系。

8. 发明公开

EP2960538A4 MAGNETIC BRAKE 审中-公开
标题翻译： MAGNETBREMSE
公开(公告)号：EP2960538A4
公开(公告)日：2016-10-26
申请号：EP14754781
申请日：2014-02-18
申请人： KOH YOUNG TECH INC , UNIV SOGANG IND UNIV COOP FOUN
发明人： YI BYUNG-JU , SEO JONG-TAE
IPC分类号： F16D65/28 , B25J19/00 , B60T13/74 , F16D63/00 , F16D65/18 , F16F1/32
CPC分类号： F16D27/04 , B25J19/0004 , B60T13/748 , F16D27/14 , F16D63/002 , F16D65/186 , F16D65/28 , F16D2121/20

9. 发明公开

EP2946741A4 TRACKING SYSTEM AND TRACKING METHOD USING SAME 审中-公开
标题翻译：追踪系统和跟踪及其方法使用
公开(公告)号：EP2946741A4
公开(公告)日：2016-09-07
申请号：EP14740207
申请日：2014-01-15
申请人： KOH YOUNG TECH INC , KYUNGPOOK NAT UNIV IND ACAD
发明人： HONG JONG-KYU , LEE HYUN-KI , CHUNG JAE-HEON , KIM MIN-YOUNG
IPC分类号： A61B34/20 , A61B1/313
CPC分类号： A61B34/20 , A61B34/70 , A61B2034/2055 , A61B2034/2057 , A61B2034/2065

10. 发明公开

EP3306235A4 HUMID AIR FORMING DEVICE, INSPECTION DEVICE COMPRISING SAME, AND INSPECTION METHOD 有权
公开(公告)号：EP3306235A4
公开(公告)日：2018-04-11
申请号：EP16807795
申请日：2016-06-08
申请人： KOH YOUNG TECH INC
发明人： SER JANG IL , KIM HYO BIN , SHIN YONG SEUNG , KIM HONG KI , LEE HO JUN
IPC分类号： F25B41/00 , F25B21/02 , G01B11/24 , G01B11/25 , H01L21/66
CPC分类号： F25B21/02 , B01F3/022 , B01F5/0485 , B01L1/04 , B01L2200/147 , B01L2300/024 , B01L2300/10 , B01L2300/18 , B01L2300/1894 , F25B41/00 , F28C3/08 , G01B11/25 , G01N21/958 , G01N2021/845
摘要： A humid air forming device, which cools an object to be measured to a predetermined temperature, and which sprays humid air having a predetermined temperature to the cooled object to be measured, thereby forming moisture particles on the surface of the object to be measured, and a measurement system including the same. The humid air forming device includes a cooling unit that cools the object to be measured to a first temperature or lower; and a humid air supply unit that forms humid air having a second temperature, which is higher than the first temperature, and spraying the humid air toward the surface of the cooled object to be measured, thereby forming moisture particles on the surface of the cooled object to be measured.

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