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    • 29. 发明公开
    • Measurement of heat generated by a chemical or biologial process
    • 测量由化学或生物过程中产生的热量。
    • EP1612529A1
    • 2006-01-04
    • EP05447162.8
    • 2005-07-04
    • Vivactis NV
    • Verhaegen, Katarina
    • G01K17/00G01N25/48
    • G01K17/00G01N25/4846
    • The present invention provides a method for measuring the heat of a chemical or biological process between at least two samples being in partial equilibrium. By allowing the samples to first establish a partial equilibrium, the background noise coming from chemical non-equilibrium between components, e.g. buffers, of the samples can be minimised and hence, the signal to noise ratio of the signal that is measured may be improved. Partial equilibrium is established with the aid of a selective (e.g. semipermeable) wall between the samples. The selective wall lets the buffers pass, but not the reagents. The chemical reaction between the reagents is initiated by applying a stimulus (eg. piercing) the selective wall.
    • 本发明提供了用于测量至少两个样品中局部均衡为之间的化学或生物过程中的热量的方法。 通过使样品先建立局部均衡,背景噪声从化学非平衡来组件之间,E.G. 样品的缓冲液,可以被最小化,因此,该信号也被测量的信号的信噪比可以提高。 局部均衡建立了与样本之间的选择性(例如半透)壁的帮助。 选择性墙让缓冲区传球,而不是试剂。 试剂之间的化学反应是通过将刺激施加(例如穿孔)的选择性壁发起。
    • 30. 发明公开
    • System and method for calibrating contact thermal resistances in differential scanning calorimeters
    • 电子差分计分卡中的Verfahren zum Berechnen vonKontaktwärmewiderstand
    • EP1340969A1
    • 2003-09-03
    • EP03004195.8
    • 2003-02-27
    • Waters Investments Limited
    • Danley, Robert L.
    • G01K17/00
    • G01K17/00
    • A system and method for obtaining the contact thermal resistance for a sample and pan without a priori knowledge of the properties of either sample, by measuring the reversing heat capacity of a sample and its pan (or an empty pan on the reference side of the DSC) at a long period and a short period during a quasi-isothermal MDSC experiment and then finding the value of contact thermal resistance that makes the short and long period heat capacities match. Several different methods may be used to find the contact thermal resistance using quasi-isothermal MDSC with a long and a short period. Two methods are direct calculation methods that use the results from an MDSC experiment used with model equations to calculate the contact thermal resistance. A third method is another direct calculation method, based upon the phase angle between the heat flow and temperature signals. A fourth and fifth method use curve fitting of the apparent heat capacity for multiple values of pan contact thermal resistance.
    • 通过测量样品及其盘(或在DSC的参考侧上的空盘)来测量样品和盘的接触热阻的系统和方法,而没有对任一样品的性质的先验知识 )在准等温MDSC实验期间长时间和短时间,然后找到使短期和长周期热容匹配的接触热阻值。 可以使用几种不同的方法来使用具有长和短周期的准等温MDSC来找到接触热阻。 两种方法是直接计算方法,其使用与模型方程组合使用的MDSC实验的结果来计算接触热阻。 第三种方法是基于热流和温度信号之间的相位角的另一直接计算方法。 第四和第五种方法使用曲面拟合的多个锅接触热阻值的视在热容量。