会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 11. 发明公开
    • THICKNESS MEASUREMENT USING A PULSED EDDY CURRENT SYSTEM
    • EP4053494A1
    • 2022-09-07
    • EP21160295.8
    • 2021-03-02
    • ABB Schweiz AG
    • LINDER, StenSOBEL, JarlEIDENVALL, AndersHALDIN, MartinDZIECIOL, Aleksander
    • G01B7/06G01R27/00
    • The present disclosure relates to a method of non-contact measurement of a thickness (d) of an object (1) of an electrically conductive material by means of a Pulsed Eddy Current, PEC, system (10) comprising a transmitter coil (2) and a receiver coil (3). The method comprises, after having turned off a current in the transmitter coil, at the receiver coil, measuring a voltage induced by the decaying magnetic field at a first time point, a second time point and a third time point. The method also comprises calculating a total magnetic flux which is generated by the eddy currents in the object at the first time point and picked up by the receiver coil, by comparing the measured flux at the first time point with a predetermined total flux picked up by the receiver coil when no object is present. The method also comprises normalizing measured magnetic flux resulting from the eddy currents and picked up by the receiver coil, using the calculated total magnetic flux as a normalization factor such that the normalized eddy current flux is independent of a distance between the object and the transmitter and receiver coils. The method also comprising, based on the measurements at the first, second and third time points, determining the thickness and the resistivity of the object.