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11. 发明授权

EP1946047B1 APPARATUS FOR INTERFEROMETRIC SENSING 有权
公开(公告)号：EP1946047B1
公开(公告)日：2019-05-15
申请号：EP06790399.7
申请日：2006-10-18
申请人： THE AUSTRALIAN NATIONAL UNIVERSITY
发明人： CHOW, Jong, H. , GRAY, Malcolm, B. , MCCLELLAND, David, E.
IPC分类号： G01B9/02 , G01J9/02 , G01D5/353

12. 发明授权

EP3290870B1 CLOSED-LOOP INTERFEROMETRIC SENSOR USING LOOP GAIN FOR DETERMINING INTERFERENCE CONTRAST 失效转让
公开(公告)号：EP3290870B1
公开(公告)日：2019-03-13
申请号：EP16187126.4
申请日：2016-09-02
申请人： ABB Schweiz AG
发明人： Gu, Xun , Machese, Sergio Vincenzo , Bohnert, Klaus
IPC分类号： G01D5/26 , G01B9/02 , G01J9/02

13. 发明授权

EP2839554B1 FREQUENCY TUNABLE LASER SYSTEM 有权
公开(公告)号：EP2839554B1
公开(公告)日：2018-10-24
申请号：EP13719631.7
申请日：2013-04-17
申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
发明人： NIEUWLAND, Remco Alexander , DE BOER, Bart Michiel
IPC分类号： G01J9/02 , H01S5/00 , H01S5/0687 , H01S3/13 , G01N21/25 , H01S5/062 , H01S5/14
CPC分类号： G01N21/255 , G01J9/0246 , G01N2201/06113 , G01N2201/08 , G01N2201/12 , H01S3/13 , H01S5/0014 , H01S5/0622 , H01S5/0687 , H01S5/14
摘要： There is provided a frequency tunable laser system (1) comprising a laser, frequency varying means (6) arranged for varying an optical frequency output of the laser (2), an intensity sensor (7m) arranged for receiving light (5b) from the laser (2), and a processor (8) arranged for controlling the frequency varying means (6) for varying the optical frequency output of the laser (2) and receiving an intensity signal (Sm) from the intensity sensor (7m) for monitoring the intensity output of the laser (2). The frequency tunable laser system (1) further comprises an external reflective surface (9), in use, fixedly arranged in a light path of the laser beam (5) outside the laser cavity (9) at a predefined distance (L) from the second reflective surface (2b) along the light path of the laser beam (5) to reflect part (5') of the emitted laser beam (5) back into the laser cavity (9). The processor (8) is further arranged for processing the intensity signal (Sm) and registering oscillations of the intensity output (I) caused by interference of the reflected part (5') of the laser beam (5) in the cavity (9) and responsive to a change in optical frequency and calculating the change in optical frequency output from the registered oscillations of the intensity output and predefined distance (L).

14. 发明授权

EP3194916B1 ANALYSEUR DE SURFACE D'ONDE ET PROCEDE POUR DETERMINER DES ECARTS DE PISTON ET DE TILT EXISTANT ENTRE PLUSIEURS FAISCEAUX LUMINEUX 有权
公开(公告)号：EP3194916B1
公开(公告)日：2018-08-29
申请号：EP15763638.2
申请日：2015-09-18
申请人： ONERA (Office National d'Etudes et de Recherches Aérospatiales)
发明人： BELLANGER, Cindy , DEPREZ, Maxime , LOMBARD, Laurent , PRIMOT, Jérôme
IPC分类号： G01J9/02
CPC分类号： G01J9/02 , G01J9/0215 , G01J2009/002

15. 发明授权

EP3104165B1 TERAHERTZ WAVE PHASE DIFFERENCE MEASUREMENT DEVICE 有权
公开(公告)号：EP3104165B1
公开(公告)日：2018-06-20
申请号：EP14881674.7
申请日：2014-09-22
申请人： Hitachi High-Technologies Corporation
发明人： SHIRAMIZU, Nobuhiro
IPC分类号： G01B9/02 , G01B11/06 , G01J9/02 , G01N21/3581
CPC分类号： G01J9/02 , G01B9/02041 , G01B11/0675 , G01N21/3581
摘要： In order to provide a high-sensitivity terahertz wave phase difference measurement system having a high S/N ratio, terahertz interference waves are observed using a half mirror and a movable reference mirror, and the phase difference is calculated, by a terahertz wave generation/detection device that obtains a high S/N ratio by employing a terahertz wave generator for irradiating a non-linear optical crystal with angular phase-matched pump light and seed light, and a terahertz wave detector for irradiating a non-linear optical crystal with angular phase-matched pump light and terahertz waves. In order to match the optical path length of the pump light and the terahertz waves irrespective of the position of the movable reference mirror and the position of a measured object, a first optical delay device, and a second optical delay device that operates in conjunction with movement of a movable reference mirror of a Michelson interferometer, are introduced on the optical path of the pump light.

16. 发明公开

EP3176552A4 COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD 有权
公开(公告)号：EP3176552A4
公开(公告)日：2018-02-14
申请号：EP15827109
申请日：2015-07-29
申请人： HAMAMATSU PHOTONICS KK
发明人： OKUMA JUNJI , IGASAKI YASUNORI
IPC分类号： G01J9/02 , G01B9/02 , G01M11/00
CPC分类号： G01M11/00 , G01J9/02 , G01J9/0215
摘要： A first reflection member 10, when light transmitted through a second reflection member 20 is incident, reflects a part of the light by a first reflection surface 11, reflects light transmitted through the first reflection surface 11 in the light by a second reflection surface 12, and emits reflected light components in an opposite direction. The second reflection member 20, when light emitted from the first reflection member 10 is incident, reflects a part of the light by a first reflection surface 21, reflects light transmitted through the first reflection surface 21 in the light by a second reflection surface 22, and emits reflected light components. Interference fringes are formed on a screen 30 by light L 12 reflected on the first reflection surface 11 of the first reflection member 10 and the second reflection surface 22 of the second reflection member 20 and light L 21 reflected on the second reflection surface 12 of the first reflection member 10 and the first reflection surface 21 of the second reflection member 20. Thus, a device and a method that can evaluate collimation of light with high sensitivity, even when a coherence length of the light is short, are realized.

17. 发明授权

EP3054274B1 DIFFERENTIAL POLARIZATION INTERFEROMETER 失效
标题翻译：差分极化干涉仪
公开(公告)号：EP3054274B1
公开(公告)日：2017-11-29
申请号：EP16154687.4
申请日：2016-02-08
申请人： The State Scientific Institution "B.I. Stepanov Institute of Physics of National Academy of Sciences of Belarus" , The State Scientific Institution "Institute of Chemistry of New Materials of National Academy of Sciences of Belarus" , King Abdulaziz City for Science and Technology
发明人： AGASHKOV, Alexander Vasilevich , KAZAK, Nikolai Stanislavovich , AGABEKOV, Vladimir Enokovich , ALSHAMMARI, Marzook Saleh , BINHUSSAIN, Mohammed
IPC分类号： G01J9/02 , G01B9/02
CPC分类号： G01B9/02011 , G01B9/0201 , G01J9/02
摘要： An interferometer includes a tunable laser source (1) of coherent radiation generating an input beam; a first polarizer (2) configured to transmit a polarized beam with adjustable intensities of orthogonally polarized components; a broadband non-polarizing beam splitter (3) forming two optically connected arms (I; II), first one with a transmitted beam, and sequentially comprising a birefringent element (4) configured to split the polarized input beam into two separate, parallel, orthogonally polarized reference beam and object beam and mounted on the base (5) with fine rotation, the birefringent element acts as both the splitter and the combiner in an interferometer; and a sample (6) with means of its shifting and inclining; and a chopper wheel (10) with a system of holes that opens sequentially for some time object and reference beams separately, then simultaneously, providing interference of said beams; and a broadband plane mirror (11) reflecting incident object and reference beams in the opposite direction and providing double passing of the beams through the sample and the birefringent element which converts two said beams into orthogonally polarized components of a single output beam falling on a non-polarizing beam splitter; this beam, been reflected, forms the second arm (II) of the interferometer, where there are sequentially arranged a controllable phase retarder (12), configured to introduce phase shift only into one polarization component of a said beam; and the second polarizer (13) that equalizes and mixes the polarization components of the input said beam and transforms input said beam into a beam, which is the result of interference of polarization components of the input beam; and a photodetector (14) configured to receive an input beam and transform an intensity of the beam into output electric signal (27), which can be amplified and analyzed by various electronic devices.

18. 发明公开

EP3183535A1 INTERFEROMETER 有权
标题翻译：干涉
公开(公告)号：EP3183535A1
公开(公告)日：2017-06-28
申请号：EP15753035.3
申请日：2015-08-19
申请人： Berz, Martin
发明人： Berz, Martin
IPC分类号： G01B11/24 , G01B9/02 , G02B21/00 , G01J9/02
CPC分类号： G01B9/02072 , G01B9/02097 , G01B11/2441 , G01J3/45 , G01J3/453 , G01J9/02
摘要： The invention relates to an interferometer, comprising a first interferometer arm and a second interferometer arm, wherein the first interferometer arm and the second interferometer arm are arranged in such a way that a first central beam, originating from a central pixel of an original image to be imaged, passes through the first interferometer arm, a second central beam, originating from the central pixel of the original image to be imaged, passes through the second interferometer arm, wherein, after passing through the first or second interferometer arm, the first central beam and the second central beam are superimposed and generate a k
perpendicular =0-interference at a superposition point of the first central beam and the second central beam, a first light beam, originating from a pixel of the original image to be imaged, passes through the first interferometer arm, and a second light beam, originating from a pixel of the original image to be imaged, passes through the second interferometer arm, wherein, after passing through the first or second interferometer arm, the first light beam and the second light beam overlap at the superposition point of the first central beam and the second central beam, and wherein, at the superposition point, a wave vector component of the first light beam, which is perpendicular to the first central beam, and a wave vector component of the second light beam, which is perpendicular to the second central beam, are arranged in an opposing manner. The invention also relates to a method for reconstructing an original image from an image measured using an interferometer according to the invention. The invention further relates to a method for calibrating an interferometer according to the invention.
摘要翻译：本发明涉及一种干涉仪，其包括第一干涉仪臂和第二干涉仪臂，其中第一干涉仪臂和第二干涉仪臂被布置为使得第一中心光束源自原始图像的中心像素到通过第一干涉仪臂，从待成像的原始图像的中心像素发出的第二中心光束通过第二干涉仪臂，其中，在通过第一或第二干涉仪臂之后，第一中心臂第一中心光束和第二中心光束叠加并且在第一中心光束和第二中心光束的重叠点处产生垂直= 0干涉，源于待成像的原始图像的像素的第一光束通过第一干涉仪臂和源自待成像的原始图像的像素的第二光束通过第二干涉仪臂其中，在通过所述第一或第二干涉仪臂之后，所述第一光束和所述第二光束在所述第一中心光束和所述第二中心光束的重叠点处重叠，并且其中，在所述重叠点处，垂直于第一中心波束的第一光束的矢量分量和垂直于第二中心波束的第二光束的波矢分量以相反的方式排列。本发明还涉及根据本发明的用于使用干涉仪测量的图像来重建原始图像的方法。本发明还涉及根据本发明的用于校准干涉仪的方法。

19. 发明公开

EP3176552A1 COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD 有权
标题翻译：科学评价装置与评价方法
公开(公告)号：EP3176552A1
公开(公告)日：2017-06-07
申请号：EP15827109.8
申请日：2015-07-29
申请人： Hamamatsu Photonics K.K.
发明人： OKUMA, Junji , IGASAKI, Yasunori
IPC分类号： G01J9/02 , G01B9/02 , G01M11/00
CPC分类号： G01M11/00 , G01J9/02 , G01J9/0215
摘要： A first reflection member 10, when light transmitted through a second reflection member 20 is incident, reflects a part of the light by a first reflection surface 11, reflects light transmitted through the first reflection surface 11 in the light by a second reflection surface 12, and emits reflected light components in an opposite direction. The second reflection member 20, when light emitted from the first reflection member 10 is incident, reflects a part of the light by a first reflection surface 21, reflects light transmitted through the first reflection surface 21 in the light by a second reflection surface 22, and emits reflected light components. Interference fringes are formed on a screen 30 by light L 12 reflected on the first reflection surface 11 of the first reflection member 10 and the second reflection surface 22 of the second reflection member 20 and light L 21 reflected on the second reflection surface 12 of the first reflection member 10 and the first reflection surface 21 of the second reflection member 20. Thus, a device and a method that can evaluate collimation of light with high sensitivity, even when a coherence length of the light is short, are realized.
摘要翻译：当透过第二反射构件20的光入射时，第一反射构件10通过第一反射面11反射一部分光，通过第二反射面12反射透过第一反射面11的光中的光，并沿相反方向发射反射光分量。当从第一反射构件10发射的光入射时，第二反射构件20通过第一反射表面21反射一部分光，通过第二反射表面22将透过第一反射表面21的光反射到光中，并发射反射光分量。通过在第一反射部件10的第一反射表面11和第二反射部件20的第二反射表面22上反射的光L12以及在第一反射的第二反射表面12上反射的光L21，在屏幕30上形成干涉条纹构件10和第二反射构件20的第一反射表面21.因此，实现了即使在光的相干长度短的情况下也能够以高灵敏度评估光的准直的装置和方法。

20. 发明公开

EP1946047A4 APPARATUS FOR INTERFEROMETRIC SENSING 审中-公开
标题翻译：用于测量干涉测量
公开(公告)号：EP1946047A4
公开(公告)日：2017-04-12
申请号：EP06790399
申请日：2006-10-18
申请人： THE AUSTRALIAN NAT UNIV
发明人： CHOW JONG H , GRAY MALCOLM B , MCCLELLAND DAVID E
IPC分类号： G01B9/02 , G01D5/353 , G01J9/02
CPC分类号： G01B9/02004 , G01B9/02002 , G01B9/02007 , G01B9/02027 , G01B9/02067 , G01B2290/25 , G01B2290/45 , G01D5/35312 , G01D5/35387
摘要： An apparatus for interferometric sensing, comprising a plurality of single-longitudinal mode laser sources to each provide radiation at a corresponding plurality of selected wavelengths, and at least one modulator to frequency or phase modulate the radiation from each laser; a plurality of Fabry-Perot interferometers formed by Bragg Gratings written into optical fibre, each interferometer being responsive to one of the said plurality of wavelengths to each produce a reflected or transmitted optical output signal dependent on the corresponding interferometer path length; and one or more demodulators to demodulate the optical output signals and produce a corresponding plurality of measurement signals indicative of optical path lengths of the respective interferometers.

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