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    • 18. 发明公开
    • HOLOGRAPHIC MICROSCOPE AND DATA PROCESSING METHOD FOR HIGH-RESOLUTION HOLOGRAM IMAGE
    • HOLOGRAFISCHES MIKROSKOP UND DATENVERARBEITUNGSVERFAHRENFÜRHOCHAUFLÖSENDESHOLOGRAMMBILD
    • EP3065001A1
    • 2016-09-07
    • EP14857928.7
    • 2014-10-28
    • University of Hyogo
    • SATO, Kunihiro
    • G03H1/00G02B21/00
    • G03H1/0443G02B21/00G02B21/365G03H2001/005G03H2001/0445G03H2001/0447G03H2001/045G03H2001/0452G03H2001/046G03H2001/0463G03H2001/0469G03H2001/0471G03H2222/42G03H2222/44G03H2222/52G03H2240/56
    • The present invention can realize both a transmission type and a reflection type, and provides a holographic microscope which can exceed the resolution of the conventional optical microscope, a hologram data acquisition method for a high-resolution image, and a high-resolution hologram image reconstruction method. In-line spherical wave reference light (L) is recorded in a hologram (I LR ) using spherical wave reference light (R), and an object light (O j ) and an illumination light (Q j ) are recorded in a hologram (I j OQR ) using a spherical wave reference light (R) by illuminating the object with an illumination light (Q j , j=1, .., N) which is changed its incident direction. From those holograms, a hologram (J j OQL ), from which the component of the reference light (R) is removed, is generated, and from the hologram, a light wave (h j ) is generated. A light wave (c j ) of the illumination light (Q j ) is separated from the light wave (h j ), and using its phase component (ξ j =c j /|c j |), a phase adjustment reconstruction light wave is derived and added up as (H P =∑h j /ξ j ), and an object image (S P =|H P | 2 ) is reconstructed.
    • 本发明可以实现透射型和反射型,并且提供可以超过常规光学显微镜的分辨率的全息显微镜,用于高分辨率图像的全息图数据获取方法和高分辨率全息图像重构 方法。 使用球面波参考光(R)将线内球面参考光(L)记录在全息图(I LR)中,并且将目标光(O j)和照明光(Q j)记录在全息图 I j OQR),其通过用改变其入射方向的照明光(Q j,j = 1,...,N)照射物体来使用球面波参考光(R)。 从这些全息图中,生成参考光(R)的分量被去除的全息图(J j OQL),并且从全息图产生光波(h j)。 照明光(Q j)的光波(cj)与光波(hj)分离,并且使用其相位分量(¾j = cj / | cj |),导出并添加相位调整重建光波 (HP ='hj /¾j),并且重建对象图像(SP = | HP | 2)。
    • 20. 发明公开
    • ELECTRON MICROSCOPE AND COMPOSITE IRRADIATION LENS
    • ELEKTRONENMIKROSKOP UND ZUSAMMUSTRETZTE BESTRAHLUNGSLINSE
    • EP1852890A1
    • 2007-11-07
    • EP06714025.1
    • 2006-02-17
    • National University Corporation Kyoto Institute of Technology
    • ENDOH, Hisamitsu c/oNational University Corporation KyotoACHIHARA, Masato c/o National University Corporation KyotoTSUNO, KatsushigeOIKAWA, Tetsuo
    • H01J37/295H01J37/141
    • H01J37/26G03H1/0866G03H5/00G03H2001/045H01J37/141H01J37/295H01J2237/1415H01J2237/1514H01J2237/153H01J2237/228H01J2237/2614
    • An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope. The electron microscope according to the present invention has an electron source (11), a condenser lens (12), a biprism (13) to split an electron beam supplied from the condenser lens (12) into coherent first and second electron beams (L1, L2) that are parallel to each other, a combined illumination lens (15) to make the first electron beam (L1) into a parallel wave and the second electron beam (L2) into a converging wave that converges at a predetermined distance, a sample stage (16) to hold a sample illuminated with the first electron beam (L1), a detector (17) to detect a hologram of a diffraction pattern formed by interference of the first electron beam (L1) with the second electron beam (L2), a computing unit (18) to conduct a predetermined Fourier transform on the hologram supplied from the detector (17) and reconstruct a microscopic image of the sample, and a display (19) to display the reconstructed microscopic image.
    • 本发明的目的在于提供一种电子显微镜,其使用衍射图案的全息图来重构由于图像形成透镜而不涉及像差的微观图像,以及用于这种电子显微镜的组合式照明透镜。 根据本发明的电子显微镜具有电子源(11),聚光透镜(12),将从聚光透镜(12)提供的电子束分成相干的第一和第二电子束(L1)的双棱镜(13) ,L2),使第一电子束(L1)成并联波的组合照明透镜(15)和第二电子束(L2)成为以规定距离收敛的会聚波, 用于保持用第一电子束(L1)照射的样本的检测器(16),检测器(17),用于检测由第一电子束(L1)与第二电子束(L2)的干涉形成的衍射图案的全息图 ),计算单元(18),用于对从检测器(17)提供的全息图进行预定的傅立叶变换,并重建样本的显微镜图像,以及显示重建的显微图像(19)。