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1. 发明授权

US06518568B1 Method and apparatus of mass-correlated pulsed extraction for a time-of-flight mass spectrometer 有权
标题翻译：飞行时间质谱仪质量相关脉冲提取的方法和装置
公开(公告)号：US06518568B1
公开(公告)日：2003-02-11
申请号：US09589480
申请日：2000-06-07
申请人： Viatcheslav V. Kovtoun , Robert J. Cotter
发明人： Viatcheslav V. Kovtoun , Robert J. Cotter
IPC分类号： H01J4840
CPC分类号： H01J49/40
摘要： A time-of-flight mass spectrometer includes a sample holder for a sample and an ionizer for ionizing the sample to form ions. A first element is spaced downstream from the sample holder, a second element is spaced downstream from the first element, and a drift region is downstream of the second element. An electric field is established between the sample holder and the first element at a time subsequent to ionizing the sample in order to extract the ions. A time-dependent and mass-correlated electric field is established between at least one of: (a) the first element and the second element, and (b) the sample holder and the first element. In turn, a detector detects the ions.
摘要翻译：飞行时间质谱仪包括用于样品的样品保持器和用于电离样品以形成离子的离子发生器。第一元件与样品保持器的下游间隔开，第二元件与第一元件的下游间隔开，漂移区域位于第二元件的下游。在电离样品之后的时间，在样品保持器和第一元件之间建立电场以提取离子。在（a）第一元件和第二元件中的至少一个以及（b）样品保持器和第一元件中的至少一个之间建立时间依赖和质量相关的电场。反过来，检测器检测离子。

2. 发明授权

US06469296B1 Ion acceleration apparatus and method 有权
公开(公告)号：US06469296B1
公开(公告)日：2002-10-22
申请号：US09484374
申请日：2000-01-14
申请人： Stuart C. Hansen , James Foote
发明人： Stuart C. Hansen , James Foote
IPC分类号： H01J4840
CPC分类号： H01J49/403
摘要： An ion acceleration apparatus and method, and a mass spectrometer using the apparatus and method, require only a single pulse generator for the collection and acceleration of ions. The apparatus, method and mass spectrometer are useful in time-of-flight mass spectrometry (TOFMS). The apparatus, method and spectrometer save on manufacturing costs and complexity, without compromising measurement sensitivity or reliability. The ion acceleration apparatus comprises a plurality of conductive plates comprising a pulser electrode, three grids and preferably, a plurality of frames units, in a stacked relationship. The pulser electrode and a third grid form the outside ends of the ion acceleration apparatus. The plates of the stack are spaced apart and electrically insulated from one another. A power source provides fill, pulse and bias voltages to the plates. The power source comprises a pulse generator that provides fill and pulse voltages to the pulser electrode and to a first grid that is adjacent to the pulser electrode. A second grid is electrically connected to ground potential and is between the first grid and the plurality of guard frames. The power source further comprises a voltage source for supplying a fixed high voltage bias to the third grid and preferably to the frame units. During the fill period, analyte ions from an ion source are collected in a fill region between the pulser electrode and the first grid. The pulser electrode and first grid are supplied with a small magnitude voltage of a polarity opposite to a polarity of a charge of the analyte ions. During the pulse period, the analyte ions are induced to move from the fill region and into an acceleration region by the application of the pulse voltage to the pulse electrode and the first grid. The pulse voltage is a large magnitude voltage of the same polarity as the polarity of the charge on the analyte ions. A field produced by the fixed voltage bias applied to the third grid and guard frames accelerates the analyte ions once they enter the acceleration region.

3. 发明授权

US06281495B1 Method of producing magnetic force image and scanning probe microscope 失效
标题翻译：产生磁力图像和扫描探针显微镜的方法
公开(公告)号：US06281495B1
公开(公告)日：2001-08-28
申请号：US09198992
申请日：1998-11-23
申请人： Shinichi Kitamura
发明人： Shinichi Kitamura
IPC分类号： H01J4840
CPC分类号： G01Q30/04 , G01Q60/08 , G01R33/0385 , Y10S977/852 , Y10S977/865
摘要： There is disclosed a scanning probe microscope for producing a topographic image of a surface of a sample by noncontact AFM (atomic force microscopy). First, a first topographic image of the sample undergoing magnetic effects is produced from the resonance frequency of a cantilever by FM detection. Then, a second topographic image of the sample free of magnetic effects is produced from the amplitude of the cantilever by slope detection. The difference between these two topographic images is taken. Thus, a magnetic force image is produced.
摘要翻译：公开了一种扫描探针显微镜，用于通过非接触AFM（原子力显微镜）产生样品表面的地形图像。首先，通过FM检测从悬臂的共振频率产生经历磁效应的样品的第一个地形图像。然后，通过斜率检测从悬臂的幅度产生没有磁效应的样品的第二个地形图像。采用这两种地形图像之间的区别。因此，产生磁力图像。

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