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    • 1. 发明专利
    • Spectrally resolved detection of ionizing radiation
    • AU2001228960B2
    • 2005-09-22
    • AU2001228960
    • 2001-01-12
    • XCOUNTER AB
    • FRANCKE TOM
    • G01T1/18G01T20060101G01T1/185G01T1/36H01J47/02G01T001/36
    • Spectrally resolved detection of ionizing radiation in a detector comprising a chamber (13) filled with an ionizable substance, a radiation entrance (33), an electron avalanche amplification means, and a read-out arrangement (29), comprises introducing a broadband radiation beam (1) into the chamber between and in parallel first and second electrode arrangements for ionization of the ionizable substance and avalanche amplifying said electrons. By means of the read-out arrangement (29) electron avalanches (SX1, SX2, . . . SXN), derivable mainly from ionization in sections (X1, H2, . . . , XN) of the chamber that are separated in the direction of the introduced radiation beam, are separately detected. From spectrally resolved absorption data, weighting factors (W11, W21, . . . , WM1, W12, W22, . . . , WM2, . . . , W1N, W2N, . . . , WMN) for different spectral components (E1, E2, . . . , EM) of the radiation (1) and for different sections (X1, X2, . . . , XN) of the chamber are deduced, each of said weighting factors being substantially proportional to the photon flux (phi11, phi21, . . . , phiM1, phi12, phi22, . . . , phiM2, . . . , phi1N, phi2N, . . . , phiMN) of the respective spectral component (E1, E2, . . . , EM) in the respective section (X1, X2, . . . , XN). Finally, by means of said detected electron avalanches (SX1, SX2, . . . , SXN) and said weighting factors, the respective detected electron avalanches (SE1, SE2, . . . , SEM) that are derivable from ionization by the respective spectral component of said broadband radiation are deduced.
    • 4. 发明申请
    • X-RAY FLUORESCENCE ANALYSIS AND APPARATUS THEREFOR
    • X射线荧光分析及其设备
    • US20030152191A1
    • 2003-08-14
    • US10068953
    • 2002-02-11
    • Motoyuki Yamagami
    • G01T001/36G01N023/223
    • G01N23/223G01N2223/076
    • In order to render the value of the fluorescent X-ray strength Ia2 of a standard sample 2 multiplied by the ratio PF1/PF2 between respective grading coefficients of standard samples 1 and 2 to approach the value of the fluorescent X-ray strength Ia1 of the standard sample 1, specific glancing angles nulla* and nullb* are determined. The abundance of a substance of interest is determined from fluorescent X-ray strengths Ia3 and Ib3 of a sample to be measured that is irradiated at the determined specific glancing angles nulla* and nullb*, to thereby provide an accurate determination of the abundance of the substance of interest.
    • 为了使标准样品2的荧光X射线强度Ia2的值乘以标准样品1和2的各个分级系数之间的比值PF1 / PF2,以接近标准样品2的荧光X射线强度Ia1的值 标准样品1,确定具体的俯视角度øa*和øb*。 感兴趣的物质的丰度是根据以确定的具体的瞥眼角度øa*和øb*照射的待测样品的荧光X射线强度Ia3和Ib3来确定的,以便准确地确定 感兴趣的物质
    • 8. 发明申请
    • ENERGY DISPERSION-TYPE X-RAY DETECTION SYSTEM
    • 能量分散型X射线检测系统
    • US20020071519A1
    • 2002-06-13
    • US09934006
    • 2001-08-20
    • Masao Satoh
    • G01T001/36G01N023/223
    • G01N23/223G01N2223/076
    • In order to realize accurate analysis with a fluorescent X-ray analyzer characterized by being non-destructive and non-contacting, in a short period of time, there is provided a common X-ray generating source, a collimator for focusing primary X-rays, and, as an energy dispersion type X-ray detection system for analyzing fluorescent X-rays as a means of elemental analysis, an energy dispersion type detector where a sensor with a low count rate but having superior energy resolution and a sensor with poor energy resolution but having a superior count rate are juxtaposed. In a method where a detector signal with superior energy resolution is utilized as foreseeable information in quantitative analysis and then utilized in qualitative analysis and a detection signal with a superior count rate is utilized in quantitative analysis, after a latter stage comprising a preamplifier of the detector, a linear amplifier and pulse height analyzer is provided individually, and qualitative and quantitative spectral processing is carried out using a common control and computing unit.
    • 为了实现具有非破坏性和非接触性的荧光X射线分析仪的精确分析,在短时间内提供了普通的X射线产生源,用于聚焦主X射线的准直仪 作为分析荧光X射线的能量分散型X射线检测系统,作为能量分散型检测器,其具有低计数率但具有优异能量分辨率的传感器和能量差的传感器 但是具有优越的计数率是并列的。 在具有优异能量分辨率的检测器信号用作定量分析中的可预见信息,然后用于定性分析的方法中,并且在定量分析中使用具有优越计数率的检测信号,后一阶段包括检测器的前置放大器 ,单独提供线性放大器和脉冲高度分析仪,并使用通用控制和计算单元进行定性和定量的光谱处理。
    • 9. 发明申请
    • Element-specific X-ray fluorescence microscope and method of operation
    • 元素特异性X射线荧光显微镜及其操作方法
    • US20030223536A1
    • 2003-12-04
    • US10157089
    • 2002-05-29
    • Xradia, Inc.
    • Wenbing YunKenneth W. Nill
    • G01T001/36G01N023/223
    • B82Y10/00G01N23/223G01N2223/076G21K1/062
    • An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The preferential imaging of the optical train is achieved using a chromatic lens in a suitably configured imaging system. A zone plate is an example of such a chromatic lens; its focal length is inversely proportional to the X-ray wavelength. Enhancement of preferential imaging of a given element in the test sample can be obtained if the zone plate lens itself is made of a compound containing substantially the same element. For example, when imaging copper using the Cu La spectral line, a copper zone plate lens is used. This enhances the preferential imaging of the zone plate lens because its diffraction efficiency (percent of incident energy diffracted into the focus) changes rapidly near an absorption line and can be made to peak at the X-ray fluorescence line of the element from which it is fabricated. In another embodiment, a spectral filter, such as a multilayer optic or crystal, is used in the optical train to achieve preferential imaging in a fluorescence microscope employing either a chromatic or an achromatic lens.
    • 元素特异性成像技术利用由初级电离辐射诱导的元素特异性荧光X射线。 然后使用光学列车将来自感兴趣元素的荧光X射线优先成像到检测器上。 使用适当配置的成像系统中的色差透镜实现光学列表的优选成像。 区域板是这种彩色透镜的示例; 其焦距与X射线波长成反比。 如果区域透镜本身由含有基本上相同的元素的化合物制成,则可以获得对测试样品中给定元素的优先成像的增强。 例如,当使用Cu La光谱线成像铜时,使用铜带平板透镜。 这增强了带状透镜的优选成像,因为它的衍射效率(衍射到聚焦中的入射能量的百分比)在吸收线附近快速变化,并且可以在其所在元素的X射线荧光线处达到峰值 制造。 在另一个实施例中,在光学系列中使用光谱滤光器,例如多层光学元件或晶体,以在使用有色或无色透镜的荧光显微镜中实现优先成像。
    • 10. 发明申请
    • Radiation imaging apparatus and radiographing method for radiation imaging apparatus
    • 辐射成像装置和放射线成像装置的放射摄影方法
    • US20030165215A1
    • 2003-09-04
    • US10370832
    • 2003-02-21
    • Sumiya Nagatsuka
    • G01T001/36
    • G01N23/223G01N23/04G01N2223/076G01T1/2928
    • A radiation imaging apparatus, including a radiation or fluorescence detecting device on which a plurality of imaging elements are arranged in a form of a plane, having a sensor element, arranged on the imaging element, to detect radiation or fluorescence converted from the radiation which have passed through a subject, and to form radiation intensity signals, and a switching element, arranged on the imaging element, to perform switching of read-out of signals that show the intensity of radiation outputted from the sensor element; and a correcting device for correcting the radiation intensity signals, based on an angle of incidence of the radiation to the sensor element.
    • 一种放射线成像装置,包括放射线或荧光检测装置,多个成像元件以平面形式布置,其具有设置在成像元件上的传感器元件,以检测从辐射转换的辐射或荧光,其具有 通过被摄体,并且形成放射线强度信号,以及布置在成像元件上的开关元件,以执行显示从传感器元件输出的辐射强度的信号的读出的切换; 以及基于辐射对传感器元件的入射角校正辐射强度信号的校正装置。