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1. 发明授权

CN109557348B 一种智能电能表用磁扭矩正序逆序自我转换装置有权转让
公开(公告)号：CN109557348B
公开(公告)日：2021-02-23
申请号：CN201811432041.2
申请日：2018-11-28
申请人：哈尔滨汇鑫仪器仪表有限责任公司
发明人：李可 , 邱雅君
IPC分类号： G01R11/19 , G01R11/22
摘要：本发明公开了一种智能电能表用磁扭矩正序逆序自我转换装置，数字显示屏、电能表主体、接线端座、脉冲对接装置、固定螺栓，数字显示屏的背面嵌套于电能表主体的正面上，产生的有益效果是在磁力矩对接器的作用下，能够使电能表顺序与逆序接通三项电源的转换，在转换时，在其内部的正项对联器与交错连接器相互配合下，将没有规律的脉冲稳定下来，同时将其转变成规律的电压脉冲，降低电磁单元之间的工作磁通产生的作用力，以此来降低电费计算的误差，同时在双项顶联器的作用下，能够稳定其转动，避免其相互运动摩擦产生的损耗和跳动，而影响接触性能，提高电的接通的连续性。

2. 发明公开

CN109557348A 一种智能电能表用磁扭矩正序逆序自我转换装置有权转让
公开(公告)号：CN109557348A
公开(公告)日：2019-04-02
申请号：CN201811432041.2
申请日：2018-11-28
申请人：邱雅君
发明人：邱雅君
IPC分类号： G01R11/19 , G01R11/22
CPC分类号： G01R11/19 , G01R11/22
摘要：本发明公开了一种智能电能表用磁扭矩正序逆序自我转换装置，数字显示屏、电能表主体、接线端座、脉冲对接装置、固定螺栓，数字显示屏的背面嵌套于电能表主体的正面上，产生的有益效果是在磁力矩对接器的作用下，能够使电能表顺序与逆序接通三项电源的转换，在转换时，在其内部的正项对联器与交错连接器相互配合下，将没有规律的脉冲稳定下来，同时将其转变成规律的电压脉冲，降低电磁单元之间的工作磁通产生的作用力，以此来降低电费计算的误差，同时在双项顶联器的作用下，能够稳定其转动，避免其相互运动摩擦产生的损耗和跳动，而影响接触性能，提高电的接通的连续性。

3. 发明专利

JP2000011697A SEMICONDUCTOR MEMORY APPARATUS 失效
公开(公告)号：JP2000011697A
公开(公告)日：2000-01-14
申请号：JP18033498
申请日：1998-06-26
申请人： NEC CORP
发明人： HASHIMOTO HIROAKI
IPC分类号： G01R11/22 , G01R31/28 , G01R31/3185 , G11C11/401 , G11C11/407 , G11C11/413 , G11C29/00 , G11C29/14 , G11C29/46
摘要： PROBLEM TO BE SOLVED: To avoid a wrong entry to test mode by letting test mode signal go through when a mask control signal shows a non-mask state and outputting the test mode signal in a reset state when the mask control signal shows a mask state. SOLUTION: A DQM terminal is turned to a High level, which is latched at an initial stage circuit 103 of a test mode circuit. Outputs of NOR0-n receiving the High level of an OEMASK signal surely become a Low level, so that a wrong entry to a test mode is avoided. Meanwhile, when the OEMASK signal is a Low level and a control signal shows a test mode entry, a decode part 102 to which an output of a latch part 101 is input decodes an internal address signal and outputs the signal, and the NOR0-n output an inverting signal of the output of the decode part 102 as test mode signals test0 to testn, entering the test mode corresponding to the value.

4. 实用新型

JPS53158282U 失效
公开(公告)号：JPS53158282U
公开(公告)日：1978-12-12
申请号：JP6409077
申请日：1977-05-18
IPC分类号： G01R11/22

5. 发明授权

US3710245A Induction meter having power-factor-adjuster 失效
标题翻译：具有功率因数调节器的感应计
公开(公告)号：US3710245A
公开(公告)日：1973-01-09
申请号：US3710245D
申请日：1971-03-22
申请人： WESTINGHOUSE ELECTRIC CORP
发明人： CLAY J , KEEVER J
IPC分类号： G01R11/36 , G01R11/22
CPC分类号： G01R11/36
摘要： The voltage winding of an induction meter directs voltage magnetic fluxes through a first path including the armature of the meter and a second path spaced from the armature. An adjustable power-factor control is responsive to flux in the second path. A fixed power-factor control is responsive to flux in the first path and restrains the adjustable control against improper movement.
摘要翻译：感应计的电压绕组引导电压磁通通过包括仪表的电枢的第一路径和与电枢间隔开的第二路径。可调功率因数控制响应于第二路径中的通量。固定功率因数控制响应于第一路径中的通量，并且限制可调整的控制以防止不正确的运动。

6. 发明授权

US3688192A Multi-element induction device having common armature and power-factor adjusters 失效
标题翻译：具有普通武器和功率因数调节器的多元感应装置
公开(公告)号：US3688192A
公开(公告)日：1972-08-29
申请号：US3688192D
申请日：1970-12-03
申请人： WESTINGHOUSE ELECTRIC CORP
发明人： RAMSEY JAMES E JR
IPC分类号： G01R11/40 , G01R11/22
CPC分类号： G01R11/40
摘要： An induction watthour meter has multiple elements or electromagnets for applying torques to a common electroconductive armature. An element is provided with an E-shaped voltage electromagnet having a voltage pole and two auxiliary poles in a common plane. A power-factor compensator employs a magnetic path extending between the voltage pole and the auxiliary poles through a soft magnetic block attached to the voltage pole. This magnetic path is linked with an electro-conductive loading element. An adjustment is effected by rotation of a screw about an axis parallel to the common plane. The block also establishes another magnetic path which locates the element torque within a desired range.
摘要翻译：感应电度表具有用于向公共导电衔铁施加扭矩的多个元件或电磁体。元件设置有在公共平面中具有电压极和两个辅助极的E形电压电磁体。功率因数补偿器采用通过连接在电压极上的软磁块在电压极与辅助极之间延伸的磁路。该磁路与导电加载元件连接。通过围绕平行于公共平面的轴旋转螺钉来进行调整。该块还建立另一磁路，其将元件扭矩定位在期望的范围内。

7. 发明授权

US4673874A Annular rotor disk for electric meter 失效
标题翻译：电表环形转子盘
公开(公告)号：US4673874A
公开(公告)日：1987-06-16
申请号：US711643
申请日：1985-03-14
申请人： Harold L. Stucker
发明人： Harold L. Stucker
IPC分类号： G01R11/09 , G01R11/19 , G01R11/22 , G01R11/02
CPC分类号： G01R11/19 , G01R11/09 , G01R11/22
摘要： A disk for an electric meter includes a solid annulus of a conductive material with a center of the annulus filled with a non-conducting material. The non-conducting material is preferably molded in place both to capture the annulus and to secure a disk shaft into a unitary assembly. The annulus distorts eddy currents at distances from sets of potential and current stators of the electric meter to minimize radial components of eddy currents in the vicinity of neighboring sets of potential and current stators. The reduced radial components of eddy currents reduces the constructive or destructive interaction of the eddy currents with their neighboring sources of flux. Increasing the angular separation of the sets of potential and current stators further reduces interaction.
摘要翻译：用于电表的盘包括具有填充有非导电材料的环形空间中心的导电材料的固体环形区域。非导电材料优选地被模制在适当位置以捕获环空并将盘轴固定成单一组件。环形区域在距离电表的电位和当前定子的距离之间扭曲涡流，以使邻近电位和当前定子附近的涡流的径向分量最小化。涡流减小的径向分量减少了涡流与其相邻的磁通源的建构性或破坏性相互作用。增加潜在和当前定子组的角度间隔进一步降低了相互作用。

8. 发明授权

US5841713A Wafer test method capable of completing a wafer test in a short time 失效
标题翻译：能够在短时间内完成晶片试验的晶圆试验方法
公开(公告)号：US5841713A
公开(公告)日：1998-11-24
申请号：US111158
申请日：1998-07-07
申请人： Tetsunori Maeda
发明人： Tetsunori Maeda
IPC分类号： G01R11/22 , G01R31/3185 , G06F11/22 , H01L21/66 , G11C7/00
CPC分类号： G01R31/318505 , G01R31/318511 , G06F11/2273
摘要： On carrying out a wafer test for a plurality of semiconductor wafers, N in number, each having a plurality of chips, an initial wafer test is carried out for all of the semiconductor wafers to produce an initial wafer test result representing that each chip of each of the semiconductor wafers is any one of a good chip, a defective chip, and a predictive good chip which is predicted as the good chip if subjected to trimming. Subsequently, each of the predictive good chips is subjected to the trimming to be repaired as the good chips. After that, a final wafer test (8001-8012) is carried out for a reduced number M (M being a positive integer less than N) of sampled wafers sampled among the semiconductor wafers to produce a final wafer test result representing that each chip of each of the sampled wafers is any one of the good chip and the defective chip. The initial wafer test result for the semiconductor wafers except the sampled wafers is modified into a modified wafer test result for the semiconductor wafers except the sampled wafers so that each chip represented as the predictive good chip by the initial wafer test result is also represented as the good chip by the modified wafer test result. An entire wafer test result for all of the semiconductor wafers is produced by adding the modified wafer test result to the final wafer test result.
摘要翻译：在对多个半导体晶片进行晶片测试的情况下，每个具有多个芯片的数量为N，对所有半导体晶片进行初始晶片测试，以产生初始晶片测试结果，表示每个半导体晶片的每个芯片的半导体晶片是好的芯片，有缺陷的芯片和预测好的芯片中的任何一个，如果进行修整则被预测为好的芯片。随后，将每个预测好的芯片作为好的芯片进行修整以进行修复。之后，对在半导体晶片中取样的采样晶片的数目M（M为小于N的正整数）进行最终晶片测试（8001-8012），以产生最终晶片测试结果，表示每个芯片的每个采样的晶片都是好的芯片和有缺陷的芯片中的任何一个。除了采样晶片之外的半导体晶片的初始晶片测试结果被修改为除了采样晶片之外的半导体晶片的修改的晶片测试结果，使得通过初始晶片测试结果表示为预测良好芯片的每个芯片也表示为通过改进的晶圆测试结果可以获得良好的芯片。通过将修改的晶片测试结果添加到最终的晶片测试结果中，可以产生所有半导体晶片的整个晶片测试结果。

9. 发明授权

US08473229B2 Storage device energized actuator having diagnostics 有权
标题翻译：具有诊断功能的存储设备通电致动器
公开(公告)号：US08473229B2
公开(公告)日：2013-06-25
申请号：US12770908
申请日：2010-04-30
申请人： David Kucera , Pavel Kania , Shanna Lorraine Leeland , Peter Anderson
发明人： David Kucera , Pavel Kania , Shanna Lorraine Leeland , Peter Anderson
IPC分类号： G01R11/00 , G01R11/17 , G01R11/22 , G01R11/25
CPC分类号： G01R31/2829 , G01R31/3679
摘要： A system having unified diagnostics where an electrical energy storage device may supply an actuator. Various techniques may be used to determine energy storage capacity and actuator current usage. Measured storage capacity and actuator current may indicate the health of the energy storage device and the actuator, respectively. Also, operation of a service switch for the actuator may be checked relative to its state.
摘要翻译：具有统一诊断的系统，其中电能存储装置可以供应致动器。可以使用各种技术来确定能量存储容量和致动器电流使用。测量的存储容量和执行器电流可分别指示储能装置和执行器的运行状况。此外，可以相对于其状态来检查用于致动器的维修开关的操作。

10. 发明专利

JPH1126537A METHOD OF TESTING SEMICONDUCTOR WAFER DEVICE 失效
公开(公告)号：JPH1126537A
公开(公告)日：1999-01-29
申请号：JP19643797
申请日：1997-07-07
申请人： NEC CORP
发明人： MAEDA TETSUNORI
IPC分类号： G01R11/22 , G01R31/3185 , G06F11/22 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To reduce the investment on high-cost IC testers or wafer probers and product delivery time by obtaining the same result from a sampling test of wafers in a final wafer test as the 100% test result. SOLUTION: A host computer 100 receives measured results of a processed lot 700 from a measuring prober 400, saves the results per test process. About those wafers in the lot 700 not measured in a final wafer test, and measured result obtd. from a redundancy wafer test is added to that obtd. from the final wafer test to provide information of all the wafers in the lot 700. In the redundancy wafer test result those chips expected to be good if replaced with redundancy cells are judged to be good and others are judged to be no good. Defective marking follows according to this result.

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