专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

CZ938U1 Circuit arrangement of measuring instrument intended for measuring intermediate resistance 未知
公开(公告)号：CZ938U1
公开(公告)日：1994-01-19
申请号：CS15692
申请日：1992-12-16
申请人： BARNA JOSEF ING
发明人： BARNA JOSEF ING
IPC分类号： G01R27/08 , G01R27/20 , G01R027/08 , G01R027/20

2. 发明申请

US20040263187A1 Oil deterioration sensor 失效
标题翻译：油劣化传感器
公开(公告)号：US20040263187A1
公开(公告)日：2004-12-30
申请号：US10491124
申请日：2004-03-29
发明人： Shinichi Hayashi , Hisashi Sasaki
IPC分类号： G01R027/08
CPC分类号： G01N33/2888 , G01N27/228
摘要： An engine oil deterioration detection apparatus 1 includes a sensing capacitor CS formed of paired electrodes dipped into engine oil whose deterioration is to be detected, the engine oil deterioration detection apparatus detecting deterioration of the engine oil on the basis of a change in electrostatic capacitance of the sensing capacitor CS. A measurement signal generation circuit 10 generates a measurement signal (6) to be supplied to the sensing capacitor CS in order to measure the electrostatic capacitance of the sensing capacitor CS. A detection signal output circuit 30 outputs a detection signal (10) on the basis of a response wave signal (7) produced from the sensing capacitor CS in response to supply of the measurement signal (6) thereto, the detection signal reflecting the electrostatic capacitance of the sensing capacitor CS. A temperature compensation mechanism 31 is provided in order to compensate for a level change of the detection signal (10) stemming from a temperature characteristic and/or a time-course deterioration of the detection signal output circuit. Thus, deterioration of oil can be accurately detected all times on the basis of electrostatic capacitance of the oil, even when the temperature of the circuit system for measurement changes or the circuit system deteriorates with time.
摘要翻译：发动机油劣化检测装置1包括由浸没在要检测的劣化的发动机油中的成对电极形成的感测电容器CS，发动机油劣化检测装置根据所述发动机油的静电电容的变化来检测发动机油的劣化感测电容器CS。测量信号产生电路10产生要提供给感测电容器CS的测量信号（6），以便测量感测电容器CS的静电电容。检测信号输出电路30根据从感测电容器CS产生的响应波信号（7）响应于其测量信号（6）的供应而输出检测信号（10），反映静电电容的检测信号的感测电容器CS。提供温度补偿机构31，以便补偿由于检测信号输出电路的温度特性和/或时间过程恶化引起的检测信号（10）的电平变化。因此，即使当测量用电路系统的温度变化或电路系统随时间劣化时，也可以基于油的静电容量一次精确地检测油的劣化。

3. 发明申请

US20040257101A1 Probe area setting method and probe device 失效
标题翻译：探头区域设置方法和探头设备
公开(公告)号：US20040257101A1
公开(公告)日：2004-12-23
申请号：US10492557
申请日：2004-04-14
发明人： Youzou Miura , Tomokazu Ozawa
IPC分类号： G01R031/02 , G01R027/08
CPC分类号： H01L22/20 , G01R1/06794 , H01L21/681 , H01L2924/0002 , H01L2924/00
摘要： With a wafer having an indefinite shape or a broken wafer, it is hard for an operator to assign the design address of an edge chip and set a probe area. In a probe-area setting method of this invention, a wafer W is placed on a main chuck (18) that is movable at least in the X- and Y-directions. The main chuck (18) is moved, thus moving wafer W in the X- and Y-directions. All edge chips formed on the wafer W are retrieved by means of an upper camera (21A), thereby setting a probe area. To retrieve the edge chips, an edge chip is selected as one with which the retrieval should be started. The edge chips are successively retrieved in the turning direction of the wafer, as the chip retrieval direction is changed to the X- or Y-direction.
摘要翻译：对于具有不确定形状或破碎的晶片的晶片，操作者难以分配边缘芯片的设计地址并设置探针区域。在本发明的探针区域设定方法中，将晶片W放置在能够至少沿X方向和Y方向移动的主卡盘（18）上。主卡盘（18）移动，从而使晶片W沿X方向和Y方向移动。形成在晶片W上的所有边缘芯片通过上摄像机（21A）被检索，从而设置探针区域。为了检索边缘芯片，选择一个边缘芯片作为启动检索的芯片。当芯片取回方向改变为X方向或Y方向时，沿着晶片的转动方向连续地取出边缘芯片。

4. 发明申请

US20040239346A1 Method of determining current-voltage characteristics of a device 有权
标题翻译：确定器件的电流 - 电压特性的方法
公开(公告)号：US20040239346A1
公开(公告)日：2004-12-02
申请号：US10817764
申请日：2004-04-02
发明人： Natarajan Mahadeva Iyer , Steven Thijs , Vesselin K. Vassilev , Tom Daenen , Vincent De Heyn
IPC分类号： G01R027/08
CPC分类号： G01R27/02 , G01R31/002 , G01R31/2632
摘要： A method and system for evaluating the current-voltage characteristics of devices where negative resistance behavior is observed. More particularly the present invention relates to a method and system for evaluating accurately the electrical overstress or ESD performance of semiconductor devices during the voltage transition region (positive to negative). The method comprises applying a signal comprising at least two amplitudes within the pulse. By suitably adjusting the amplitude of the first level, such that it is high enough to trigger the device-under-test, and subsequently applying one or more levels within the same signal while keeping the device-under-test in the on-state, the device IV characteristics can be comprehensively extracted, without being limited by the system loadline. The method may use a rectangular pulse testing set-up, also known as transmission line measurement set-up, with a single loadline characteristic to determine a portion or the complete ESD characteristic of the device-under test.
摘要翻译：用于评估观测到负电阻行为的器件的电流 - 电压特性的方法和系统。更具体地，本发明涉及用于在电压转换区域（正到负）期间准确地评估半导体器件的电应力或ESD性能的方法和系统。该方法包括在脉冲内施加包括至少两个幅度的信号。通过适当地调节第一电平的幅度，使得其足够高以触发待测器件，并且随后在保持被测器件处于导通状态的同一信号中施加一个或多个电平，可以全面提取设备IV特性，而不受系统负载线的限制。该方法可以使用矩形脉冲测试设置，也称为传输线测量设置，具有单个负载线特性以确定被测器件的一部分或完整的ESD特性。

5. 发明申请

US20040232924A1 Methods and systems for automated pipeline testing 失效
标题翻译：自动化管道测试的方法和系统
公开(公告)号：US20040232924A1
公开(公告)日：2004-11-25
申请号：US10873473
申请日：2004-06-22
发明人： Thomas N. Hilleary , Perry B. Peden JR.
IPC分类号： G01R031/02 , G01R027/08 , H04Q009/00
CPC分类号： G01N17/02 , C23F13/22 , C23F2213/32 , F16L58/00
摘要： A method for testing a cathodic protection system is disclosed where the system includes a cathodic protection rectifier configured to apply a voltage across a pipeline and a reference point. The method includes measuring a magnitude of an output voltage of the cathodic protection rectifier, transmitting to a site remote from the rectifier, the measured output voltage magnitude using a cellular control channel, receiving the transmitted measurement at the remote site, and using the transmitted measurement to determine whether the cathodic protection system is operational.
摘要翻译：公开了一种用于测试阴极保护系统的方法，其中系统包括被配置为跨越管道和参考点施加电压的阴极保护整流器。该方法包括测量阴极保护整流器的输出电压的大小，使用蜂窝控制信道传输到远离整流器的位置，测量的输出电压幅度，在远程站点接收所发送的测量值，以及使用所传送的测量值以确定阴极保护系统是否可操作。

6. 发明申请

US20040212375A1 Method and apparatus for stabilizing parasitic error capacitance in oil quality sensors 失效
标题翻译：用于稳定油质量传感器中的寄生误差电容的方法和装置
公开(公告)号：US20040212375A1
公开(公告)日：2004-10-28
申请号：US10426131
申请日：2003-04-28
申请人： Detroit Diesel Corporation
发明人： Gary A. Marszalek
IPC分类号： G01R027/08
CPC分类号： G01N33/2888 , G01N27/226
摘要： A sensor for detecting changes in the dielectric constant of a liquid is described. The sensor has two electrodes immersed in the liquid with dielectric surfaces substantially parallel with each other, and a ramp disposed on a support between the electrodes. The ramp intersects the surfaces at obtuse and acute angles respectively and provides a surface disposed at an angle relative to an electric field extending between the two electrodes, thereby reducing parasitic effects of the sensed dielectric content of the liquid. Slots in the electrode adjacent the lower end of the ramp reduce the strength of the field proximate to the ramp and thereby further reduce the parasitic effects.
摘要翻译：描述了用于检测液体的介电常数变化的传感器。该传感器具有浸入液体中的两个电极，电介质表面基本上彼此平行，以及设置在电极之间的支撑件上的斜面。斜坡分别以钝角和锐角与表面相交，并且提供相对于在两个电极之间延伸的电场成一定角度设置的表面，从而减少所检测的液体的电介质含量的寄生效应。邻近斜坡的电极中的狭槽减小了靠近斜坡的场强，从而进一步降低了寄生效应。

7. 发明申请

US20040178809A1 Plasma display panel 有权
标题翻译：等离子显示面板
公开(公告)号：US20040178809A1
公开(公告)日：2004-09-16
申请号：US10738136
申请日：2003-12-18
发明人： Shinichi Fujino , Junichi Sakano , Toshiyuki Innami , Kohsei Goto
IPC分类号： G01R027/08
CPC分类号： H02M7/537 , H02M7/53871 , H02M2001/0009
摘要： A current sensor has a power MOSFET Q1, connected between an electric load and a power supply, for controlling current that flows through said electric load, a mirror MOSFET Q2, connected in parallel to said power MOSFET Q1, in which a portion of the current flowing through said power MOSFET flows, and a current detection resistor RC connected between a source electrode of said power MOSFET and a source electrode of said mirror MOSFET. An inverting amplifier circuit CP of the current sensor 3 inverts and amplifies the voltage signal, which has been converted to voltage by the current detection resistor RC, and outputs the signal, thereby converting positive and nega tive voltages generated across the current detection resistor RC to a positive voltage.
摘要翻译：电流传感器具有连接在电负载和电源之间的用于控制流过所述电负载的电流的功率MOSFET Q1，与所述功率MOSFET Q1并联连接的反射镜MOSFET Q2，其中电流的一部分流过所述功率MOSFET的电流检测电阻和连接在所述功率MOSFET的源电极和所述反射镜MOSFET的源电极之间的电流检测电阻RC。电流传感器3的反相放大器电路CP对由电流检测电阻RC转换为电压的电压信号进行反相放大，并输出该信号，由此将电流检测电阻RC两端产生的正和负电压转换为正电压。

8. 发明申请

US20040178806A1 Micropower apparatus for low impedance measurements 有权
标题翻译：用于低阻抗测量的微功率设备
公开(公告)号：US20040178806A1
公开(公告)日：2004-09-16
申请号：US10383689
申请日：2003-03-10
发明人： Donald S. Foreman , Russell D. Braunling , Darryl J. Wrest
IPC分类号： G01R027/08
CPC分类号： G01R27/205 , G01N17/043
摘要： A micropower apparatus and method for milliohm resistance detection includes a drive circuit and a monitoring circuit. The drive circuit includes a step up current transformer that is driven by a square wave oscillator via a low pass filter and voltage-driven current source. The drive circuit drives a series arranged test coupon and reference coupon, the latter being exposed to the elements. The coupons are Kelvin connected to the monitoring circuit, which includes a pair of low noise, low offset pre-amplifiers, a pair of post amplifiers connected to outputs of the pair of pre-amplifiers, a pair of full wave rectifiers connected to outputs of the pair of post amplifiers, and a pair of low pass filters connected to the outputs of the pair of full-wave rectifiers. Resistance values of the test and reference coupons can accordingly be monitored ratiometrically to determine a state of a selected environment by, for example, detecting changes in electrical resistance due to corrosion of the test coupon.
摘要翻译：用于毫欧电阻检测的微功率装置和方法包括驱动电路和监视电路。驱动电路包括升压电流互感器，其通过低通滤波器和电压驱动电流源由方波振荡器驱动。驱动电路驱动串联的测试试剂和参考试样，后者暴露于元件。优惠券是开尔文连接到监控电路，其包括一对低噪声，低偏移预放大器，一对连接到一对前置放大器的输出的后置放大器，一对全波整流器连接到一对后置放大器和一对连接到该对全波整流器的输出的低通滤波器。因此，可以按比例监测测试和参考试样的电阻值，以通过例如检测由于试样腐蚀导致的电阻变化来确定所选择的环境的状态。

9. 发明申请

US20040150414A1 Test circuit and multi-chip package type semiconductor device having the test circuit 失效
公开(公告)号：US20040150414A1
公开(公告)日：2004-08-05
申请号：US10747153
申请日：2003-12-30
发明人： Kazutoshi Inoue , Mitsuya Ohie
IPC分类号： G01R027/08
CPC分类号： G01R31/318505 , H01L2224/05554 , H01L2224/48091 , H01L2224/48137 , H01L2224/49175 , H01L2924/3011 , H01L2924/00014 , H01L2924/00
摘要： A MCP semiconductor device includes at least first and second chips, each of which has internal pads and an internal circuit, encapsulated by a sealing material together. The device further includes a test circuit. The test circuit connects each of the internal pads to one of the internal circuits under a normal operation mode of the device, and disconnect between them under a test mode.

10. 发明申请

US20040124858A1 Long-life conductivity sensor system and method for using same 失效
公开(公告)号：US20040124858A1
公开(公告)日：2004-07-01
申请号：US10344000
申请日：2003-02-06
发明人： Rengaswamy Srinivasan , Francis B. Weiskopf Jr , Kenneth R. Grossman , Russell P. Cain , Hassan Saffarian
IPC分类号： G01R027/08
CPC分类号： G01N27/04 , G01N33/383
摘要： A long-life conductivity sensor system and method that is embeddable or immersible in a medium. The conductivity sensor system includes at least a housing with an enclosing wall that defines an interior volume and that has at least one aperture through the wall; a pair of electrodes protruding through the aperture into a medium surrounding the sensor housing; and conductivity sensing electronics contained within the sensor housing interior volume and connected to the pair of electrodes. The conductivity sensing electronics include a galvanostat connected to the electrodes for inducing discrete constant current pulses between the electrodes creating a transient voltage signal between the electrodes; and a high-speed voltmeter/A-D Converter connected to the electrodes for measuring the transient voltage signal between the electrodes, the transient voltage signal being a function of the conductivity of the medium surrounding the sensor housing.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式