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1. 发明授权

US06792690B2 Inside micrometer 有权
标题翻译：内径千分尺
公开(公告)号：US06792690B2
公开(公告)日：2004-09-21
申请号：US10217625
申请日：2002-08-14
申请人： Katsunobu Terui , Tadashi Konishi , Minoru Shibahashi
发明人： Katsunobu Terui , Tadashi Konishi , Minoru Shibahashi
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： An inside micrometer including an inside micrometer body (1) with a first spindle (11) screwed in an advanceable and retractable manner in an axial direction, to which anvil (30) having different length in increments of a predetermined dimension and an extending collar (40) interposed between the anvil (30) and the inside micrometer body (1) are selectively attached to adjust the measurement range, has an extending rod (50) selectively attached to the inside micrometer body (1) in an attachable and detachable manner and having a second spindle 58 which is advanced and retracted together with the first spindle (11), so that the length of the second spindle (58) is added to the measurement range extended from one of the anvils (30) as well as the length of the extending collar (40), thereby reducing the number of the anvils (30).
摘要翻译：一种内测微计，其包括具有以轴向方向可前进和缩回的方式旋拧的第一心轴（11）的内测微器体（1），具有预定尺寸的增量具有不同长度的砧座（30）和延伸颈圈插入在砧座（30）和内部测微器主体（1）之间的导轨40（40）被选择性地附接以调节测量范围，具有以可附接和可拆卸的方式选择性地附接到内测微器本体（1）的延伸杆（50）具有与第一主轴（11）一起前进和缩回的第二主轴58，使得第二主轴（58）的长度被添加到从一个砧座（30）延伸的测量范围以及长度（40），从而减少砧座（30）的数量。

2. 发明授权

US06519867B1 Measuring device 失效
标题翻译：测量工具
公开(公告)号：US06519867B1
公开(公告)日：2003-02-18
申请号：US09613142
申请日：2000-07-10
申请人： Akitomo Saeki
发明人： Akitomo Saeki
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： A micrometer comprising a thimble made, at least in part, of a translucent material, a vernier scale on an inner circumference of the thimble along the circumferential direction and a vernier numeral on an outer circumference of the thimble along the circumferential direction, whereby reading error during measurement can be reduced.
摘要翻译：一种测微计，包括至少部分由半透明材料制成的顶针，沿着圆周方向在套管的内周上具有游标，并且沿周向方向在套管的外周上具有游标数字，由此读误差在测量过程中可以减少。

3. 发明授权

US06553685B2 Measuring instruments 有权
公开(公告)号：US06553685B2
公开(公告)日：2003-04-29
申请号：US09909800
申请日：2001-07-23
申请人： Shingo Nishina , Masahiko Tachikake , Yoshiaki Shiraishi , Rie Tanaka , Shuuji Hayashida , Yoshitaka Kuji , Osamu Saito , Tetsuya Nakadoi
发明人： Shingo Nishina , Masahiko Tachikake , Yoshiaki Shiraishi , Rie Tanaka , Shuuji Hayashida , Yoshitaka Kuji , Osamu Saito , Tetsuya Nakadoi
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： A measuring instrument includes a spindle (11) provided to a body (1), a sleeve (31) movable in the same direction as the spindle and stoppable at a desired position, a connector (41) for connecting the sleeve and the spindle and allowing relative movement of the sleeve and the spindle in the moving direction thereof by a predetermined stroke; a pressure spring (61) accommodated in the sleeve for biasing the spindle in a direction for the spindle to abut to the workpiece through the connector, and a biasing force indicator (71) for indicating the pressure spring.

4. 发明授权

US06243965B1 Electronic micrometer 有权
标题翻译：电子千分尺
公开(公告)号：US06243965B1
公开(公告)日：2001-06-12
申请号：US09354335
申请日：1999-07-16
申请人： Adriano Zanier , Arthur Bovey , Lucien Borgognon
发明人： Adriano Zanier , Arthur Bovey , Lucien Borgognon
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： The electronic micrometer includes a casing defining at least an internal volume, in which are disposed a sleeve having an at least partially threaded inner surface. A screw is engaged in this sleeve and is able to be put in rotation with respect to the sleeve in such a way as to displace itself along the longitudinal measuring axis (x) of the device. There is a capacitive system of measurement for measuring the relative rotation of the screw with respect to the sleeve and for determining, starting with that measurement, the longitudinal position of the screw. The casing comprises two half-shells. At least one filiform joint allows the internal volume inside the casing to be sealed. Other sealing means are provided to prevent any infiltration of water or of dust into this internal volume. Accordingly, micrometer are protected.
摘要翻译：电子千分尺包括限定至少内部体积的壳体，其中设置有具有至少部分带有螺纹的内表面的套筒。螺钉接合在该套筒中，并且能够以相对于套筒旋转的方式使其沿着装置的纵向测量轴线（x）自身移动。存在用于测量螺杆相对于套筒的相对旋转的电容测量系统，并且用该测量开始确定螺杆的纵向位置。套管包括两个半壳。至少一个丝状接头允许将壳体内部的体积密封。提供其他密封装置以防止水或灰尘进入该内部容积的任何渗透。因此，千分尺保护。

5. 发明授权

US06176021B1 Micrometer 失效
标题翻译：千分尺
公开(公告)号：US06176021B1
公开(公告)日：2001-01-23
申请号：US09036675
申请日：1998-03-09
申请人： Hajime Sato , Kiyohiro Nakata , Chikashi Hamano , Toshihiko Mishima , Tohru Fujimitsu
发明人： Hajime Sato , Kiyohiro Nakata , Chikashi Hamano , Toshihiko Mishima , Tohru Fujimitsu
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： A micrometer includes a main body holding an anvil at one end portion and a spindle at the other end portion through an inner sleeve is formed with a frame which is made by placing a pair of frame elements, which are formed by bending metal plates, one upon the other to reduce weight while ensuring rigidity. The outside of the frame is covered with resin to reduce the weight, enhance the rigidity, and prevent the influence caused by the heat of hand when the frame is gripped.
摘要翻译：千分尺包括在一端部保持砧座的主体和通过内套筒的另一端部的主轴形成有框架，该框架通过放置通过弯曲金属板形成的一对框架元件，一个框架元件另一方面减轻重量，同时确保刚性。框架的外侧被树脂覆盖以减轻重量，增强刚性，并且防止当握住框架时由手的热量引起的影响。

6. 发明授权

US06505414B2 Comparator 有权
标题翻译：比较器
公开(公告)号：US06505414B2
公开(公告)日：2003-01-14
申请号：US09879140
申请日：2001-06-13
申请人： Yuji Fujikawa
发明人： Yuji Fujikawa
IPC分类号： G01B318
CPC分类号： G01B3/18 , G01B3/008
摘要： A comparator (1) has: a frame (2); a spindle and an anvil (4) supported by the frame (2) to be advanceable and retractable in the axial direction thereof; a biaser (39) for biasing the anvil (4) toward the spindle; a release (6) for retracting the anvil relative to the spindle against the biaser (39); an indicator (7); and an indicator driver (8) for transmitting the movement of the anvil (4) to the indicator (7), where a seal member (40, 43, 47) provided on the border between an outer surface of the frame (2) and at least one of the anvil (4), the biaser (39), the release (6) and the indicator (7) and a biasing force adjuster (5) for varying the biasing force of the biaser (39) are provided.
摘要翻译：比较器（1）具有：框架（2）; 由所述框架（2）支撑的主轴和砧座（4）能够沿其轴向前进和后退; 用于将所述砧座（4）偏压到所述心轴的冲击器（39）用于相对于所述冲击器（39）相对于所述心轴回缩所述砧座的释放件（6）; 指标（7）; 以及用于将砧座（4）的运动传递到指示器（7）的指示器驱动器（8），其中设置在框架（2）的外表面和框架（2）的外表面之间的边界上的密封构件（40,43,47）提供了砧座（4），冲击器（39），释放件（6）和指示器（7）中的至少一个以及用于改变冲击器（39）的偏置力的偏置力调节器（5）。

7. 发明授权

US06502057B1 Transmitter unit for measuring instrument 有权
标题翻译：变送器用于测量仪器
公开(公告)号：US06502057B1
公开(公告)日：2002-12-31
申请号：US09347921
申请日：1999-07-06
申请人： Miyoshi Suzuki
发明人： Miyoshi Suzuki
IPC分类号： G01B318
CPC分类号： G01B3/205 , G01B2210/58 , G01D11/24 , G08C17/02
摘要： A main unit (21) attached onto rear side (opposite to a side equipped with a digital display) of a slider (14) and accommodating a transmission circuit inside to transmit measurement data by wireless, and an attachment module (40) to retain the main unit attachably and detachably to the slider are provided. Front profile of the main unit (21) is formed at least not to protrude beyond front profile of the slider. The attachment module (40) is constituted to be plugged into and unplugged from an output connector (18) on the slider (14), and has a connector (44) to connect the output connector and the transmission circuit in the main unit.
摘要翻译：附接到滑块（14）的后侧（与配备有数字显示器的一侧相反）并且内部容纳传输电路以通过无线传送测量数据的主单元（21），以及附接模块（40），用于保持提供可拆卸地连接到滑块的主单元。主单元（21）的前轮廓形成为至少不会突出超过滑块的前轮廓。连接模块（40）被构造成插入到滑块（14）上的输出连接器（18）上并从其上拔出，并且具有用于连接主单元中的输出连接器和传输电路的连接器（44）。

8. 发明授权

US06354014B1 Micrometer 有权
标题翻译：千分尺
公开(公告)号：US06354014B1
公开(公告)日：2002-03-12
申请号：US09525853
申请日：2000-03-14
申请人： Nobuaki Yamakawa , Shigeji Kudo
发明人： Nobuaki Yamakawa , Shigeji Kudo
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： A micrometer (1) includes an anvil (3) and a spindle (4) having a flat plate-like distal end. The anvil (3) includes a small-diameter pin (3C) of a predetermined length formed on a distal end portion of a rod-like anvil body (3A), and a detection portion (5) of a tubular shape fitted on the anvil body (3A) to be slidably moved along the anvil body (3A), a distal end of the detection portion (5) being formed into a plate-like shape, a pin insertion hole being formed in a central portion of the distal end of the detection portion (5), and the pin being inserted in the pin insertion hole. The anvil (3) further includes a dial gauge (10) which is contacted at its distal end with the detection portion (5), and indicates a plus value and a minus value in accordance with the movement of the detection portion (5). The distal end of the anvil (3) is abutted against the distal end of the spindle (4), and when a distal end of the pin (3C) of the anvil (3) coincides with the distal end of the detection portion (5), the dial gauge (10) is set to a zero point. An object (11) to be measured is inserted between the anvil (3) and the spindle (4), and when the distal end of the anvil (3) is brought into abutting engagement with the object to be measured, it is detected from the amount of movement of the detection portion (5) relative to the pin of the anvil body (3A) whether the object to be measured is an appropriate one.
摘要翻译：千分尺（1）包括砧（3）和具有平板状远端的心轴（4）。砧座（3）包括形成在杆状砧体（3A）的远端部分上的预定长度的小直径销（3C）和安装在砧座上的管状检测部分（5）主体（3A）沿着砧体（3A）可滑动地移动，所述检测部（5）的前端形成为板状，销插入孔形成在所述远端的中心部检测部分（5），并且销插入销插入孔中。砧座（3）还包括在其远端与检测部分（5）接触的千分表（10），并且根据检测部分（5）的移动表示正值和负值。砧座（3）的前端与主轴（4）的前端抵接，当砧座（3）的销钉（3C）的前端与检测部（5）的前端一致时，），千分表（10）被设定为零点。待测量物体（11）插入在砧座（3）和主轴（4）之间，并且当砧座（3）的远端与被测量物体抵接时，从检测部分（5）相对于砧体（3A）的销的移动量是否是适当的。

9. 发明授权

US06286227B1 Micrometer system and process of use therefor 失效
标题翻译：千分尺系统及其使用过程
公开(公告)号：US06286227B1
公开(公告)日：2001-09-11
申请号：US09128586
申请日：1998-08-03
申请人： Nelson Raymond Corby, Jr.
发明人： Nelson Raymond Corby, Jr.
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： A micrometer system includes a motorized drive for repeatedly advancing and retracting the micrometer barrel, and a touch sensor for sensing when the barrel tip has just touched the target surface. The drive is preferably mounted on the micrometer body. By performing a measurement repeatedly, a series of readings can be obtained which cumulatively increases measurement accuracy, especially when contact must be made to a compliant surface.
摘要翻译：千分尺系统包括用于重复推进和缩回千分尺筒的电动驱动器，以及用于感测当枪管尖端刚好接触目标表面时的触摸传感器。驱动器优选安装在千分尺体上。通过重复进行测量，可以获得一系列读数，累积地提高测量精度，特别是当必须对柔顺表面进行接触时。

10. 发明授权

US06247244B1 Device for longitudinal measurement 有权
标题翻译：纵向测量装置
公开(公告)号：US06247244B1
公开(公告)日：2001-06-19
申请号：US09352940
申请日：1999-07-14
申请人： Adriano Zanier , Arthur Bovey , Michel Paudex
发明人： Adriano Zanier , Arthur Bovey , Michel Paudex
IPC分类号： G01B318
CPC分类号： G01B3/18
摘要： The micrometer includes a sleeve provided with an at least partially threaded inner surface and an at least partially threaded outer surface. The outer surface includes at least one deformable, tapered portion. A micrometric screw is engaged in the sleeve, and is able to be set in rotation with respect to the sleeve in such a way as to displace itself along the longitudinal measuring axis (x) of the device. A nut is engaged on the external threading of the sleeve and is able to be put in contact with the tapered portion in such a way as to deform it in order to adjust the play between the screw and the sleeve. The tapered portion is devoid of longitudinal slits; its deformability is provided by an external diameter variable along its periphery, preferably by an odd number of flat segments.
摘要翻译：测微计包括设置有至少部分带螺纹的内表面和至少部分螺纹的外表面的套筒。外表面包括至少一个可变形的锥形部分。微型螺杆接合在套筒中，并且能够以相对于套筒旋转的方式被设置成沿着装置的纵向测量轴线（x）自身移动。螺母在套筒的外螺纹上接合，并且能够与锥形部分接触以使其变形，以便调节螺钉和套筒之间的间隙。锥形部分没有纵向狭缝; 其变形能力由其外围的外径变量提供，优选由奇数个扁平段提供。

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