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    • 3. 发明专利
    • ELECTRIC SIGNAL SAMPLING SYSTEM USING MICROWAVE OPTICAL PULSE
    • JPH03102264A
    • 1991-04-26
    • JP12934290
    • 1990-05-21
    • UNIV ROCHESTER
    • SUCHIIIBUN UIRIAMUSON
    • G01R15/00G01R1/07G01R13/34G01R19/00G01R31/302G02F1/03
    • PURPOSE: To sample an electric signal with high sensitivity by using a Fabry- Perot interferometer modulator having electric field inducing variable refraction index or a thin layer composed of a piezoelectric material demarcating the concave part of an Fabry-Perot interferometer. CONSTITUTION: A modulator 18 uses a thin layer of an electrooptical sensing material and reflecting layers 22, 24. The reflecting layers 22, 24 demarcate the recessed part of a Fabry-Perot interferometer having a thin layer provided thereto and optical pulses 16 propagate through the width of the recessed part. The layer of the recessed part is set to thinness sufficient to form a transmission characteristic having width at least 10 times optical sampling pulses in the total width half the max. value to the modulator 18. A transmission curve has upper and lower band edge parts increased or decreased between upper and lower limits. The Fabry-Perot interferometer is adjusted by adjusting a pulse propagating distance and refractivity so that a spectrum of pulses enter one of the edge parts between the upper and lower limits. The optical sampling pulses are effectively modulated in amplitude by the small shift in the transmission curve.
    • 7. 发明专利
    • MEASUREMENT OF ELECTROOPTIC SIGNAL
    • JPH02134584A
    • 1990-05-23
    • JP17818889
    • 1989-07-12
    • UNIV ROCHESTER
    • SUCHIIIBUN ERU UIRIAMUSON
    • G01R1/07G01R15/24G01R31/302G01R31/319
    • PURPOSE: To extract a signal from the region of a conductor in micrometer range by setting a probe made of an electrooptical material in a surrounding electric field from the conductor, passing a light beam through the probe, and then converting it to an electrical signal. CONSTITUTION: Electrodes 12 and 14 are arranged on a substrate 10 while they are separated by, for example, 1 micrometer. To probe a surrounding magnetic field from this kind of electrode structure, a probe system 16 is used. In the probe 16, a multiple quantum well MQW structure 18 is provided between a semiconductor substrate 20 and an upper layer 22. The substrate 20 and the upper layer 22 are optical connected to glass prisms 24 and 26. A light beam from a laser are focused by a lens 28 and become a beam 30 and is totally reflected by the substrate 20, the upper layer 22, and an end face 13 of the MQW structure 18. The output beam is 32 focused on a photodetector by a lens 34 and are converted to electrical signals. An electric field due to signals in the conductor modulates a light beam due to the intensity of the electric field and generate an output signal that is the scale of the amplitude of an optical signal. The probe 16 is not in contact with the conductor 10 due to a gap 36.