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1. 发明专利

JPH03102264A ELECTRIC SIGNAL SAMPLING SYSTEM USING MICROWAVE OPTICAL PULSE 失效
公开(公告)号：JPH03102264A
公开(公告)日：1991-04-26
申请号：JP12934290
申请日：1990-05-21
申请人： UNIV ROCHESTER
发明人： SUCHIIIBUN UIRIAMUSON
IPC分类号： G01R15/00 , G01R1/07 , G01R13/34 , G01R19/00 , G01R31/302 , G02F1/03
摘要： PURPOSE: To sample an electric signal with high sensitivity by using a Fabry- Perot interferometer modulator having electric field inducing variable refraction index or a thin layer composed of a piezoelectric material demarcating the concave part of an Fabry-Perot interferometer. CONSTITUTION: A modulator 18 uses a thin layer of an electrooptical sensing material and reflecting layers 22, 24. The reflecting layers 22, 24 demarcate the recessed part of a Fabry-Perot interferometer having a thin layer provided thereto and optical pulses 16 propagate through the width of the recessed part. The layer of the recessed part is set to thinness sufficient to form a transmission characteristic having width at least 10 times optical sampling pulses in the total width half the max. value to the modulator 18. A transmission curve has upper and lower band edge parts increased or decreased between upper and lower limits. The Fabry-Perot interferometer is adjusted by adjusting a pulse propagating distance and refractivity so that a spectrum of pulses enter one of the edge parts between the upper and lower limits. The optical sampling pulses are effectively modulated in amplitude by the small shift in the transmission curve.

2. 发明专利

JPH0318780A MEASUREMENT OF ELECTRO-OPTIC SIGNAL 失效
公开(公告)号：JPH0318780A
公开(公告)日：1991-01-28
申请号：JP12934190
申请日：1990-05-21
申请人： UNIV ROCHESTER
发明人： SUCHIIIBUN UIRIAMUSON
IPC分类号： G01R31/302 , G01R1/07 , G01R15/24
摘要： PURPOSE: To protect a probe against the physical damage by providing the improved probe constituted by a support having a surface part and an edge and a strip extended over the edge. CONSTITUTION: A tester (DUT) is mounted on an X-Y-X stage moving in upward or right or left direction and the direction perpendicular to the sheet as shown by arrows (x), (y), (z). The stage is moved until a cantilever beam is bent. The beam received by the detector at this time is out of a focus, and the amplitude of the signal measured by a display unit 35 is reduced. A stage is returned to slightly separate, thereby increasing the amplitude of the signal. At this time, the probe is disengaged from the contact with the DUT, and existed in an outer edge electric field. Further, if the probe drops on a hard surface, a plate spring absorbs the impact instead of the damage of the probe to reduce the possibility of the damage.

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