会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Structure and method to measure waveguide power absorption by surface plasmon element
    • 用表面等离子体元素测量波导功率吸收的结构和方法
    • US08749790B1
    • 2014-06-10
    • US13314962
    • 2011-12-08
    • Shawn M. TannerYufeng HuUt TranZhongyan WangZhong ShiSergei Sochava
    • Shawn M. TannerYufeng HuUt TranZhongyan WangZhong ShiSergei Sochava
    • G01N21/55
    • G01N21/553G01N21/7703
    • A structure for measuring energy absorption by a surface plasmon receptor or NFT on a waveguide comprises a first waveguide, a first input grating for coupling light comprising a first wavelength into the first waveguide, a first output grating for coupling light out of the first waveguide, a first plurality of surface plasmon receptors in cooperation with the first waveguide to receive light energy and located between the first input grating and the first output grating. The structure may further comprise a second waveguide, a second input grating for coupling light into the second waveguide, a second output grating for coupling light out of the second waveguide, a second plurality of surface plasmon receptors between the second input grating and the second output grating and in cooperation with the second waveguide to receive light energy, wherein the second plurality may be less than or greater than the first plurality.
    • 用于测量波导上的表面等离子体激元受体或NFT的能量吸收的结构包括:第一波导,用于将包含第一波长的光引入第一波导的第一输入光栅,用于将光从第一波导耦合的第一输出光栅, 与第一波导协作以接收光能并位于第一输入光栅和第一输出光栅之间的第一多个表面等离子体激元受体。 该结构还可以包括第二波导,用于将光耦合到第二波导中的第二输入光栅,用于将光从第二波导耦合的第二输出光栅,在第二输入光栅和第二输出之间的第二多个表面等离子体激元 光栅并与第二波导配合以接收光能,其中第二多个可以小于或大于第一多个。
    • 6. 发明授权
    • Methods and apparatuses for performing wafer level characterization of a plasmon element
    • 用于执行等离子体元件的晶片级表征的方法和装置
    • US08753903B1
    • 2014-06-17
    • US13478058
    • 2012-05-22
    • Shawn M. TannerYufeng HuSergei Sochava
    • Shawn M. TannerYufeng HuSergei Sochava
    • H01L21/66
    • H01L22/12
    • Improved pump-probe testing methods and apparatuses for measuring the performance of a plasmon element at wafer level are provided. In one embodiment, the apparatus includes a light source configured to output a first light beam on a grating located at a first end of a waveguide, the waveguide being configured to couple energy of the first light beam to the plasmon element located at a second end of the waveguide, and an optical probe assembly positioned above a top surface of the wafer. The optical probe assembly is configured to direct a second light beam on an area of the wafer including the plasmon element and detect a portion of the second light beam reflected from the area.
    • 提供了用于测量晶圆级别的等离子体元件的性能的改进的泵浦探针测试方法和装置。 在一个实施例中,该设备包括配置成在位于波导的第一端的光栅上输出第一光束的光源,该波导被配置为将第一光束的能量耦合到位于第二端的等离子体元件 以及位于晶片顶表面上方的光学探头组件。 光探针组件被配置为将第二光束引导到包括等离子体元件的晶片的区域上,并检测从该区域反射的第二光束的一部分。