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    • 5. 发明申请
    • System and method for performing depth testing at top and bottom of graphics pipeline
    • 在图形管线顶部和底部进行深度测试的系统和方法
    • US20070291030A1
    • 2007-12-20
    • US11454267
    • 2006-06-16
    • Mark FowlerChris Brennan
    • Mark FowlerChris Brennan
    • G06T15/40
    • G06T15/405
    • Embodiments of a system and method including graphics processing of a pixel sample are described. According to an embodiment, a first depth test processes a value, such as a z/stencil value, of a pixel sample and determines whether the value of the pixel sample satisfies the first depth test. If the value of the pixel sample satisfies the first depth test, the value of the pixel sample is not immediately written to storage, such as a Z-buffer. That is, if the value of the pixel sample satisfies the first depth test, the depth processing logic prevents or delays a write operation for the value of the pixel sample to storage at that time. A second depth test is performed on the value of the pixel sample if the value of the pixel sample satisfied the first depth test. If the value of the pixel sample satisfies the second depth test, the value of the pixel sample is then written to storage.
    • 描述包括像素样本的图形处理的系统和方法的实施例。 根据实施例,第一深度测试处理像素样本的值,例如z /模板值,并且确定像素样本的值是否满足第一深度测试。 如果像素样本的值满足第一深度测试,则像素样本的值不会立即写入诸如Z缓冲器的存储。 也就是说,如果像素样本的值满足第一深度测试,则深度处理逻辑防止或延迟对像素样本的值进行存储的写入操作。 如果像素样本的值满足第一深度测试,则对像素样本的值执行第二深度测试。 如果像素样本的值满足第二深度测试,则将像素样本的值写入存储。
    • 6. 发明授权
    • System and method for performing depth testing at top and bottom of graphics pipeline
    • 在图形管线顶部和底部进行深度测试的系统和方法
    • US09076265B2
    • 2015-07-07
    • US11454267
    • 2006-06-16
    • Mark FowlerChris Brennan
    • Mark FowlerChris Brennan
    • G06T15/40
    • G06T15/405
    • Embodiments of a system and method including graphics processing of a pixel sample are described. According to an embodiment, a first depth test processes a value, such as a z/stencil value, of a pixel sample and determines whether the value of the pixel sample satisfies the first depth test. If the value of the pixel sample satisfies the first depth test, the value of the pixel sample is not immediately written to storage, such as a Z-buffer. That is, if the value of the pixel sample satisfies the first depth test, the depth processing logic prevents or delays a write operation for the value of the pixel sample to storage at that time. A second depth test is performed on the value of the pixel sample if the value of the pixel sample satisfied the first depth test. If the value of the pixel sample satisfies the second depth test, the value of the pixel sample is then written to storage.
    • 描述包括像素样本的图形处理的系统和方法的实施例。 根据实施例,第一深度测试处理像素样本的值,例如z /模板值,并且确定像素样本的值是否满足第一深度测试。 如果像素样本的值满足第一深度测试,则像素样本的值不会立即写入诸如Z缓冲器的存储。 也就是说,如果像素样本的值满足第一深度测试,则深度处理逻辑防止或延迟对像素样本的值进行存储的写入操作。 如果像素样本的值满足第一深度测试,则对像素样本的值执行第二深度测试。 如果像素样本的值满足第二深度测试,则将像素样本的值写入存储。
    • 10. 发明申请
    • Skimmer door assembly
    • 撇渣门总成
    • US20060260035A1
    • 2006-11-23
    • US11435516
    • 2006-05-17
    • Darrell BakerMark Fowler
    • Darrell BakerMark Fowler
    • E04H4/00
    • E04H4/1272
    • A skimmer door assembly for use with a skimmer having an opening therein, having a face plate for matingly engaging the skimmer around the opening of the skimmer. The face plate has an opening therein which communicates with the opening of the skimmer. A raised rib portion extends around a periphery of the opening of the face plate. A cover has a first, planar wall which closes the opening of the face plate. The cover has a groove formed on the planar wall which engages the rib of the face plate for sealing the face plate to prevent water from entering the opening of the face plate.
    • 一种用于与其中具有开口的撇渣器一起使用的撇渣器门组件,具有用于将撇渣器与撇渣器的开口配合地接合的面板。 面板在其中具有与分离器的开口连通的开口。 隆起的肋部分围绕面板的开口的周边延伸。 盖具有封闭面板的开口的第一平面壁。 所述盖具有形成在所述平面壁上的槽,所述凹槽与所述面板的所述肋接合以密封所述面板,以防止水进入所述面板的开口。