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1. 发明授权

US07869643B2 Advanced cell-to-cell inspection 有权
标题翻译：先进的细胞间细胞检查
公开(公告)号：US07869643B2
公开(公告)日：2011-01-11
申请号：US11700408
申请日：2007-01-31
申请人： Zeev Litichever , Erez Sali , Oren Cohen
发明人： Zeev Litichever , Erez Sali , Oren Cohen
IPC分类号： G06K9/00 , G06K9/68
CPC分类号： G06T7/001 , G06T2207/10056 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers may proceed on a cell-to-cell or die-to-die basis. An image of a wafer may be obtained and the cells or dies shown therein can be inspected using any combination of appropriate die-to-die or cell-to-cell inspection methods. For example, one or more areas may be designated for cell-to-cell inspection. For each cell type, a reference image can be generated by obtaining an image of the area and displacing the image by an amount equal to the repetition vector for that cell type in opposite directions. The displaced images and the original image can be combined into a single reference image. The original image can then be compared to the reference image. In some embodiments, the displaced images are also compared to the reference image to statistically determine the presence or absence of defects.
摘要翻译：诸如半导体晶片的物体的检查可以在细胞间或细胞死亡的基础上进行。可以获得晶片的图像，并且可以使用适当的芯片到芯片或细胞间细胞检查方法的任何组合来检查其中所示的细胞或裸片。例如，可以将一个或多个区域指定用于细胞到细胞检查。对于每个单元格类型，可以通过获得该区域的图像并且将图像移位相当于相反方向上该单元格类型的重复向量的量来产生参考图像。移位图像和原始图像可以组合成单个参考图像。然后将原始图像与参考图像进行比较。在一些实施例中，也将移位的图像与参考图像进行比较，以统计确定缺陷的存在或不存在。

2. 发明申请

US20080181484A1 Advanced cell-to-cell inspection 有权
标题翻译：先进的细胞间细胞检查
公开(公告)号：US20080181484A1
公开(公告)日：2008-07-31
申请号：US11700408
申请日：2007-01-31
申请人： Zeev Litichever , Erez Sali , Oren Cohen
发明人： Zeev Litichever , Erez Sali , Oren Cohen
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/10056 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers may proceed on a cell-to-cell or die-to-die basis. An image of a wafer may be obtained and the cells or dies shown therein can be inspected using any combination of appropriate die-to-die or cell-to-cell inspection methods. For example, one or more areas may be designated for cell-to-cell inspection. For each cell type, a reference image can be generated by obtaining an image of the area and displacing the image by an amount equal to the repetition vector for that cell type in opposite directions. The displaced images and the original image can be combined into a single reference image. The original image can then be compared to the reference image. In some embodiments, the displaced images are also compared to the reference image to statistically determine the presence or absence of defects.
摘要翻译：诸如半导体晶片的物体的检查可以在细胞间或细胞死亡的基础上进行。可以获得晶片的图像，并且可以使用适当的芯片到芯片或细胞间细胞检查方法的任何组合来检查其中所示的细胞或裸片。例如，可以将一个或多个区域指定用于细胞到细胞检查。对于每个单元格类型，可以通过获得该区域的图像并且将图像移位相当于相反方向上该单元格类型的重复向量的量来产生参考图像。移位图像和原始图像可以组合成单个参考图像。然后将原始图像与参考图像进行比较。在一些实施例中，也将移位的图像与参考图像进行比较，以统计确定缺陷的存在或不存在。

3. 发明授权

US07369236B1 Defect detection through image comparison using relative measures 有权
标题翻译：通过图像比较使用相对措施进行缺陷检测
公开(公告)号：US07369236B1
公开(公告)日：2008-05-06
申请号：US11590650
申请日：2006-10-31
申请人： Erez Sali , Oren Cohen
发明人： Erez Sali , Oren Cohen
IPC分类号： G01B11/00 , G01N21/00 , G06K9/00
CPC分类号： G01N21/95607 , G06T7/001 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by relative brightness in each image. Alternatively, directional vectors may be defined based on slopes between pixels and their neighbors. Various comparison metrics may be utilized to determine the degree of correlation between the relative values for pixels in the inspection image and corresponding pixels in the reference image. Relative values may be combined with conventional techniques as part of an inspection process. The inspection may be performed using an optical inspection tool that uses conventional techniques to identify defect candidates, with relative value analysis performed on areas containing defect candidates to confirm or deny the existence of a defect.
摘要翻译：检查诸如半导体晶片的物体可以包括检查和参考图像之间的形状的比较。作为检查过程的一部分，可以基于这些像素与相邻像素的比较将相对值分配给每个图像内的像素。例如，像素可以通过每个图像中的相对亮度进行排序。或者，可以基于像素与其邻居之间的斜率来定义方向向量。可以使用各种比较度量来确定检查图像中的像素和参考图像中的对应像素的相对值之间的相关度。作为检查过程的一部分，相对值可以与常规技术相结合。可以使用使用常规技术来识别缺陷候选的光学检查工具进行检查，对包含缺陷候选的区域进行相对值分析以确认或拒绝存在缺陷。

4. 发明申请

US20080100844A1 DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES 有权
标题翻译：通过使用相对措施的图像比较缺陷检测
公开(公告)号：US20080100844A1
公开(公告)日：2008-05-01
申请号：US11590650
申请日：2006-10-31
申请人： Erez Sali , Oren Cohen
发明人： Erez Sali , Oren Cohen
IPC分类号： G01N21/00 , G01B11/00
CPC分类号： G01N21/95607 , G06T7/001 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by relative brightness in each image. Alternatively, directional vectors may be defined based on slopes between pixels and their neighbors. Various comparison metrics may be utilized to determine the degree of correlation between the relative values for pixels in the inspection image and corresponding pixels in the reference image. Relative values may be combined with conventional techniques as part of an inspection process. The inspection may be performed using an optical inspection tool that uses conventional techniques to identify defect candidates, with relative value analysis performed on areas containing defect candidates to confirm or deny the existence of a defect.
摘要翻译：检查诸如半导体晶片的物体可以包括检查和参考图像之间的形状的比较。作为检查过程的一部分，可以基于这些像素与相邻像素的比较将相对值分配给每个图像内的像素。例如，像素可以通过每个图像中的相对亮度进行排序。或者，可以基于像素与其邻居之间的斜率来定义方向向量。可以使用各种比较度量来确定检查图像中的像素和参考图像中的对应像素的相对值之间的相关度。作为检查过程的一部分，相对值可以与常规技术相结合。可以使用使用常规技术来识别缺陷候选的光学检查工具进行检查，对包含缺陷候选的区域进行相对值分析以确认或拒绝存在缺陷。

5. 发明授权

US07916286B2 Defect detection through image comparison using relative measures 有权
标题翻译：通过图像比较使用相对措施进行缺陷检测
公开(公告)号：US07916286B2
公开(公告)日：2011-03-29
申请号：US11958731
申请日：2007-12-18
申请人： Erez Sali , Oren Cohen
发明人： Erez Sali , Oren Cohen
IPC分类号： G01B11/00 , G01N21/00 , G06K9/00 , G06K9/03
CPC分类号： G01N21/95607 , G06T7/001 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by relative brightness in each image. Alternatively, directional vectors may be defined based on slopes between pixels and their neighbors. Various comparison metrics may be utilized to determine the degree of correlation between the relative values for pixels in the inspection image and corresponding pixels in the reference image. Relative values may be combined with conventional techniques as part of an inspection process. The inspection may be performed using an optical inspection tool that uses conventional techniques to identify defect candidates, with relative value analysis performed on areas containing defect candidates to confirm or deny the existence of a defect.
摘要翻译：检查诸如半导体晶片的物体可以包括检查和参考图像之间的形状的比较。作为检查过程的一部分，可以基于这些像素与相邻像素的比较将相对值分配给每个图像内的像素。例如，像素可以通过每个图像中的相对亮度进行排序。或者，可以基于像素与其邻居之间的斜率来定义方向向量。可以使用各种比较度量来确定检查图像中的像素和参考图像中的对应像素的相对值之间的相关度。作为检查过程的一部分，相对值可以与常规技术相结合。可以使用使用常规技术来识别缺陷候选的光学检查工具进行检查，对包含缺陷候选的区域进行相对值分析以确认或拒绝存在缺陷。

6. 发明申请

US20080101686A1 Defect Detection Through Image Comparison Using Relative Measures 有权
标题翻译：通过图像比较使用相对措施进行缺陷检测
公开(公告)号：US20080101686A1
公开(公告)日：2008-05-01
申请号：US11958731
申请日：2007-12-18
申请人： Erez Sali , Oren Cohen
发明人： Erez Sali , Oren Cohen
IPC分类号： G06K9/03
CPC分类号： G01N21/95607 , G06T7/001 , G06T2207/30148
摘要： Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by relative brightness in each image. Alternatively, directional vectors may be defined based on slopes between pixels and their neighbors. Various comparison metrics may be utilized to determine the degree of correlation between the relative values for pixels in the inspection image and corresponding pixels in the reference image. Relative values may be combined with conventional techniques as part of an inspection process. The inspection may be performed using an optical inspection tool that uses conventional techniques to identify defect candidates, with relative value analysis performed on areas containing defect candidates to confirm or deny the existence of a defect.
摘要翻译：检查诸如半导体晶片的物体可以包括检查和参考图像之间的形状的比较。作为检查过程的一部分，可以基于这些像素与相邻像素的比较将相对值分配给每个图像内的像素。例如，像素可以通过每个图像中的相对亮度进行排序。或者，可以基于像素与其邻居之间的斜率来定义方向向量。可以使用各种比较度量来确定检查图像中的像素和参考图像中的相应像素的相对值之间的相关度。作为检查过程的一部分，相对值可以与常规技术相结合。可以使用使用常规技术来识别缺陷候选的光学检查工具进行检查，对包含缺陷候选的区域进行相对值分析以确认或拒绝存在缺陷。

7. 发明申请

US20130326169A1 Method and Storage Device for Detection of Streaming Data Based on Logged Read/Write Transactions 审中-公开
标题翻译：基于记录读/写事务检测流数据的方法和存储设备
公开(公告)号：US20130326169A1
公开(公告)日：2013-12-05
申请号：US13764287
申请日：2013-02-11
申请人： Amir Shaharabany , Eyal Sobol , Omer Gilad , Oren Cohen , Alon Marcu , Tal Heller
发明人： Amir Shaharabany , Eyal Sobol , Omer Gilad , Oren Cohen , Alon Marcu , Tal Heller
IPC分类号： G06F12/02 , G06F12/06
CPC分类号： G06F12/0253 , G06F3/0608 , G06F3/0655 , G06F3/0679 , G06F3/0688 , G06F12/0646
摘要： A method and storage device for detection of streaming data based on logged read/write transactions are provided. In one embodiment, a storage device classifies data as belonging to one of at least three classes based on a set of characteristics and then applies operational parameters to the data depending on the class of the data. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.
摘要翻译：提供了一种用于基于记录的读/写事务来检测流数据的方法和存储装置。在一个实施例中，存储设备基于一组特性将数据分类为属于至少三个类别中的一个，然后根据数据的类别将操作参数应用于数据。其他实施例是可能的，并且每个实施例可以单独使用或组合使用。

8. 发明授权

US07830928B2 Quasi-phase matching and quantum control of high harmonic generation in waveguides using counterpropagating beams 有权
标题翻译：使用反向传播光束的波导中的高次谐波生成的准相位匹配和量子控制
公开(公告)号：US07830928B2
公开(公告)日：2010-11-09
申请号：US11888916
申请日：2007-08-02
申请人： Xiaoshi Zhang , Amy L. Lytle , Oren Cohen , Henry C. Kapteyn , Margaret M. Murnane
发明人： Xiaoshi Zhang , Amy L. Lytle , Oren Cohen , Henry C. Kapteyn , Margaret M. Murnane
IPC分类号： H01S3/10
CPC分类号： H01S4/00 , H05G2/003 , H05G2/008
摘要： All-optical quasi-phase matching (QPM) uses a train of counterpropagating pulses to enhance high-order harmonic generation (HHG) in a hollow waveguide. A pump pulse enters one end of the waveguide, and causes HHG in the waveguide. The counterpropagation pulses enter the other end of the waveguide and interact with the pump pulses to cause QPM within the waveguide, enhancing the HHG.
摘要翻译：全光准相位匹配（QPM）使用一系列反向传播脉冲来增强中空波导中的高次谐波产生（HHG）。泵浦脉冲进入波导的一端，并在波导中引起HHG。反向传播脉冲进入波导的另一端并与泵浦脉冲相互作用以引起波导内的QPM，从而增强了HHG。

9. 发明授权

US10837221B2 Thermally-efficient slidable fenestration assembly 有权
公开(公告)号：US10837221B2
公开(公告)日：2020-11-17
申请号：US16632333
申请日：2018-07-18
申请人： Shmulik Cohen , Oren Cohen
发明人： Shmulik Cohen , Oren Cohen
IPC分类号： E06B3/46 , E06B3/263
CPC分类号： E06B3/469 , E06B3/26301 , E06B3/26303 , E06B3/26347 , E06B3/4609 , E06B2003/2633 , E06B2003/26327 , E06B2003/26381 , E06B2003/26383 , E06B2003/26385
摘要： Exemplary implementations of a thermally-efficient slidable fenestration assembly are glass window systems or glass door systems having one or more sliding glass panels. The fenestration assemblies are adapted to be mounted in an architectural structure such as a building or house. Accessory channels in the fenestration framework may be provided to facilitate nail-fin, retro-fit or screen adaptors as means to attach the assembly to the surrounding architecture. Stiles, tracks and rails of the assembly are specifically configured to reduce heat transfer across the fenestration assembly, while simultaneously maintaining the structural integrity and durability of the overall assembly. Certain stile, track and rail components may comprise materials of relatively low conductivities. Preferred stile configurations include interlock elements arranged to reduce the assembly's vulnerability to tampering from a position outside of the fenestration.

10. 发明申请

US20200236406A1 NETWORKING FOR DISTRIBUTED MICROSERVICES COMMUNICATION FOR REAL-TIME MULTI-VIEW COMPUTER VISION STREAMING APPLICATIONS 审中-公开
公开(公告)号：US20200236406A1
公开(公告)日：2020-07-23
申请号：US16789875
申请日：2020-02-13
申请人： Waldo Bastian , Alex Kalnizky , Oren Cohen , Jay Daka , Ben Rotman , Karen Abramyanc
发明人： Waldo Bastian , Alex Kalnizky , Oren Cohen , Jay Daka , Ben Rotman , Karen Abramyanc
IPC分类号： H04N21/218 , H04N21/2187 , H04N19/176 , H04N19/597
摘要： Methods, apparatus, systems and software for distributed microservices communication for real-time multi-view computer vision streaming applications. In one aspect, a method for producing immersive sports video content is provided. A plurality of video feeds from a plurality of physical cameras (PCams) installed in a stadium or venue are received at a data center, where the PCams have respective viewpoints directed toward at least one of a field or court in the stadium or venue and one or more players participating in a sport being played in the stadium or venue. The plurality of video feeds are processed in parallel at the data center using a plurality of distributed stateful and stateless processing services to generate a three-dimensional point cloud comprising a volumetric model including a plurality of voxels and process the plurality of voxels from each of a plurality of viewpoints associated with respective virtual cameras (VCams) to output video streams in real-time.

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